FIG. 1.
(a)–(f) 2 × 2 μm2 AFM images of samples A–C grown on Ge and samples D–F grown on GaAs substrates, respectively.

(a)–(f) 2 × 2 μm2 AFM images of samples A–C grown on Ge and samples D–F grown on GaAs substrates, respectively.

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