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Journal Articles

In-house synthesized poly(ether ether ketone) ionenes. II. ToF-SIMS spectra in the negative ion mode

Lyndi Strange, Sudhir Ravula, Zihua Zhu, Jason E. Bara, Ping Chen, David J. Heldebrant, Jennifer Yao

Surf. Sci. Spectra 31, 015002 (2024)

https://doi.org/10.1116/6.0003133

Published: February 2024

View article titled, In-house synthesized poly(ether ether ketone) ionenes. II. ToF-SIMS spectra in the negative ion mode

Includes: Supplementary data

Journal Articles

Aluminum hydroxide, bayerite, boehmite, and gibbsite ToF-SIMS spectra in the positive ion mode. II

Lyndi Strange, Yuchen Zhang, Jiyoung Son, Jun Gao, Vineet Joshi, Xiao-Ying Yu

Surf. Sci. Spectra 29, 025002 (2022)

https://doi.org/10.1116/6.0001936

Published: September 2022

View article titled, Aluminum hydroxide, bayerite, boehmite, and gibbsite ToF-SIMS spectra in the positive ion mode. II

Includes: Supplementary data

Journal Articles

Aluminum hydroxide, bayerite, boehmite, and gibbsite ToF-SIMS spectra in the negative ion mode. I

Lyndi Strange, Yuchen Zhang, Jiyoung Son, Jun Gao, Vineet Joshi, Xiao-Ying Yu

Surf. Sci. Spectra 29, 025001 (2022)

https://doi.org/10.1116/6.0001935

Published: September 2022

View article titled, Aluminum hydroxide, bayerite, boehmite, and gibbsite ToF-SIMS spectra in the negative ion mode. I

Includes: Supplementary data

Journal Articles

g-C₃N₄-based materials functionalized with Au, Ag, and Au-Ag: An XPS study

Mattia Benedet, Alberto Gasparotto, Gian Andrea Rizzi, Davide Barreca, Chiara Maccato

Surf. Sci. Spectra 29, 024001 (2022)

https://doi.org/10.1116/6.0002028

Published: September 2022

View article titled, g-C3N4-based materials functionalized with Au, Ag, and Au-Ag: An XPS study

Includes: Supplementary data

Journal Articles

Non-monochromatic He I and He II UPS spectra of polycrystalline silver

Muhammad G. Salim, Joseph Casamento

Surf. Sci. Spectra 29, 014011 (2022)

https://doi.org/10.1116/6.0001569

Published: April 2022

View article titled, Non-monochromatic He I and He II UPS spectra of polycrystalline silver

Includes: Supplementary data

Journal Articles

NAP-XPS spectra of the bacterial cell-envelope of Pseudomonas fluorescens bacteria

Marit Kjærvik, Karin Schwibbert, Paul M. Dietrich, Wolfgang E. S. Unger

Surf. Sci. Spectra 29, 014008 (2022)

https://doi.org/10.1116/6.0001543

Published: February 2022

View article titled, NAP-XPS spectra of the bacterial cell-envelope of Pseudomonas fluorescens bacteria

Includes: Supplementary data

Journal Articles

Analysis of Co₃O₄-SnO₂ and Co₃O₄-Fe₂O₃ nanosystems by x-ray photoelectron spectroscopy

Chiara Maccato, Lorenzo Bigiani, Max Klotzsche, Davide Barreca, Alberto Gasparotto

Surf. Sci. Spectra 28, 024002 (2021)

https://doi.org/10.1116/6.0001146

Published: September 2021

View article titled, Analysis of Co3O4-SnO2 and Co3O4-Fe2O3 nanosystems by x-ray photoelectron spectroscopy

Includes: Supplementary data

Journal Articles

MnO₂ nanomaterials functionalized with Ag and SnO₂: An XPS study

Lorenzo Bigiani, Chiara Maccato, Davide Barreca, Alberto Gasparotto

Surf. Sci. Spectra 27, 024005 (2020)

https://doi.org/10.1116/6.0000332

Published: August 2020

View article titled, MnO2 nanomaterials functionalized with Ag and SnO2: An XPS study

Includes: Supplementary data

Journal Articles

XPS of the surface chemical environment of CsMAFAPbBrI trication-mixed halide perovskite film

Jhonatan Rodriguez-Pereira, Juan Tirado, Andrés F. Gualdrón-Reyes, Franklin Jaramillo, Rogelio Ospina

Surf. Sci. Spectra 27, 024003 (2020)

https://doi.org/10.1116/6.0000275

Published: August 2020

View article titled, XPS of the surface chemical environment of CsMAFAPbBrI trication-mixed halide perovskite film

Includes: Supplementary data

Journal Articles

In situ exfoliated 2D molybdenum disulfide analyzed by XPS

Xinglu Wang, Christopher R. Cormier, Ava Khosravi, Christopher M. Smyth, Jeffrey R. Shallenberger, Rafik Addou, Robert M. Wallace

Surf. Sci. Spectra 27, 014019 (2020)

https://doi.org/10.1116/6.0000153

Published: May 2020

View article titled, In situ exfoliated 2D molybdenum disulfide analyzed by XPS

Includes: Supplementary data

Journal Articles

2D topological insulator bismuth selenide analyzed by in situ XPS

Xinglu Wang, Christopher M. Smyth, Ava Khosravi, Christopher R. Cormier, Jeffrey R. Shallenberger, Rafik Addou, Robert M. Wallace

Surf. Sci. Spectra 26, 024014 (2019)

https://doi.org/10.1116/1.5130891

Published: January 2020

View article titled, 2D topological insulator bismuth selenide analyzed by in situ XPS

Includes: Supplementary data

Journal Articles

Samarium thin films molecular plated from N,N-dimethylformamide characterized by XPS

Kristian G. Myhre, Jordan C. Delashmitt, Nathan J. Sims, Shelley M. Van Cleve, Rose A. Boll

Surf. Sci. Spectra 25, 024003 (2018)

https://doi.org/10.1116/1.5052011

Published: December 2018

View article titled, Samarium thin films molecular plated from N,N-dimethylformamide characterized by XPS

Includes: Supplementary data

Journal Articles

Core-level spectra of powdered tungsten disulfide, WS₂

David J. Morgan

Surf. Sci. Spectra 25, 014002 (2018)

https://doi.org/10.1116/1.5030093

Published: July 2018

View article titled, Core-level spectra of powdered tungsten disulfide, WS2

Includes: Supplementary data

Journal Articles

XPS analysis of Fe₂O₃-TiO₂-Au nanocomposites prepared by a plasma-assisted route

Michael E. A. Warwick, Giorgio Carraro, Elisa Toniato, Alberto Gasparotto, Chiara Maccato, Davide Barreca

Surf. Sci. Spectra 23, 61–69 (2016)

https://doi.org/10.1116/1.4954387

Published: July 2016

View article titled, XPS analysis of Fe2O3-TiO2-Au nanocomposites prepared by a plasma-assisted route

Includes: Supplementary data

Journal Articles

Gold/silver core-shell 20 nm nanoparticles extracted from citrate solution examined by XPS

Mark H. Engelhard, Jordan N. Smith, Donald R. Baer

Surf. Sci. Spectra 23, 29–39 (2016)

https://doi.org/10.1116/1.4953792

Published: June 2016

View article titled, Gold/silver core-shell 20 nm nanoparticles extracted from citrate solution examined by XPS

Includes: Supplementary data

Journal Articles

XPS Examination of the Oxide Layer Formed on Kovar Following Pre-Oxidation

Christopher F. Mallinson, Sabrina Tardio, Paul M. Yates, Martyn T. Staff, John A. Fernie, John F. Watts

Surf. Sci. Spectra 22, 58–70 (2015)

https://doi.org/10.1116/11.20150301

Published: June 2015

View article titled, XPS Examination of the Oxide Layer Formed on Kovar Following Pre-Oxidation

Includes: Supplementary data

Journal Articles

An Introduction to Single Crystal Perovskites and Single Crystal Rare-Earth Scandate Perovskites Analyzed Using X-ray Photoelectron Spectroscopy

Richard T. Haasch, Eric Breckenfeld, Lane W. Martin

Surf. Sci. Spectra 21, 84–86 (2014)

https://doi.org/10.1116/11.20141202

Published: December 2014

View article titled, An Introduction to Single Crystal Perovskites and Single Crystal Rare-Earth Scandate Perovskites Analyzed Using X-ray Photoelectron Spectroscopy

Journal Articles

2-D Material Molybdenum Disulfide Analyzed by XPS

D. Ganta, S. Sinha, Richard T. Haasch

Surf. Sci. Spectra 21, 19–27 (2014)

https://doi.org/10.1116/11.20140401

Published: July 2014

View article titled, 2-D Material Molybdenum Disulfide Analyzed by XPS

Includes: Supplementary data

Journal Articles

The Si₃N₄/TiN Interface: 3. Si₃N₄/TiN(001) Grown with a −150 V Substrate Bias and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy

Richard T. Haasch, Jörg Patscheider, Niklas Hellgren, Ivan Petrov, J. E. Greene

Surf. Sci. Spectra 19, 52–61 (2012)

https://doi.org/10.1116/11.20121003

Published: December 2012

View article titled, The Si3N4/TiN Interface: 3. Si3N4/TiN(001) Grown with a −150 V Substrate Bias and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy

Includes: Supplementary data

Journal Articles

The Si₃N₄/TiN Interface: 2. Si₃N₄/TiN(001) Grown with a −7 V Substrate Bias and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy

Richard T. Haasch, Jörg Patscheider, Niklas Hellgren, Ivan Petrov, J. E. Greene

Surf. Sci. Spectra 19, 42–51 (2012)

https://doi.org/10.1116/11.20121002

Published: December 2012

View article titled, The Si3N4/TiN Interface: 2. Si3N4/TiN(001) Grown with a −7 V Substrate Bias and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy

Includes: Supplementary data

NARROW

Topics

In-house synthesized poly(ether ether ketone) ionenes. II. ToF-SIMS spectra in the negative ion mode

Aluminum hydroxide, bayerite, boehmite, and gibbsite ToF-SIMS spectra in the positive ion mode. II

Aluminum hydroxide, bayerite, boehmite, and gibbsite ToF-SIMS spectra in the negative ion mode. I

g-C₃N₄-based materials functionalized with Au, Ag, and Au-Ag: An XPS study

Non-monochromatic He I and He II UPS spectra of polycrystalline silver

NAP-XPS spectra of the bacterial cell-envelope of Pseudomonas fluorescens bacteria

Analysis of Co₃O₄-SnO₂ and Co₃O₄-Fe₂O₃ nanosystems by x-ray photoelectron spectroscopy

MnO₂ nanomaterials functionalized with Ag and SnO₂: An XPS study

XPS of the surface chemical environment of CsMAFAPbBrI trication-mixed halide perovskite film

In situ exfoliated 2D molybdenum disulfide analyzed by XPS

2D topological insulator bismuth selenide analyzed by in situ XPS

Samarium thin films molecular plated from N,N-dimethylformamide characterized by XPS

Core-level spectra of powdered tungsten disulfide, WS₂

XPS analysis of Fe₂O₃-TiO₂-Au nanocomposites prepared by a plasma-assisted route

Gold/silver core-shell 20 nm nanoparticles extracted from citrate solution examined by XPS

XPS Examination of the Oxide Layer Formed on Kovar Following Pre-Oxidation

An Introduction to Single Crystal Perovskites and Single Crystal Rare-Earth Scandate Perovskites Analyzed Using X-ray Photoelectron Spectroscopy

2-D Material Molybdenum Disulfide Analyzed by XPS

The Si₃N₄/TiN Interface: 3. Si₃N₄/TiN(001) Grown with a −150 V Substrate Bias and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy

The Si₃N₄/TiN Interface: 2. Si₃N₄/TiN(001) Grown with a −7 V Substrate Bias and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy

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