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Journal Articles

Zinc selenide analyzed by XPS

Editor’s Pick
Jeffrey R. Shallenberger, Niklas Hellgren
Journal: Surface Science Spectra
Surf. Sci. Spectra 27, 014020 (2020)
https://doi.org/10.1116/6.0000165
Published: June 2020
View article titled, Zinc selenide analyzed by XPS
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Includes: Supplementary data
Journal Articles

Cluster cleaned HOPG by XPS

David J. Morgan
Journal: Surface Science Spectra
Surf. Sci. Spectra 24, 024003 (2017)
https://doi.org/10.1116/1.4993771
Published: October 2017
View article titled, Cluster cleaned HOPG by XPS
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Includes: Supplementary data
Journal Articles

LiNi0.8Co0.2O2-based high power lithium-ion battery positive electrodes analyzed by x-ray photoelectron spectroscopy: 1. Fresh electrode

Richard T. Haasch, Daniel A. Abraham
Journal: Surface Science Spectra
Surf. Sci. Spectra 23, 118–128 (2016)
https://doi.org/10.1116/1.4972837
Published: January 2017
View article titled, LiNi<sub>0.8</sub>Co<sub>0.2</sub>O<sub>2</sub>-based high power lithium-ion battery positive electrodes analyzed by x-ray photoelectron spectroscopy: 1. Fresh electrode
Open the PDF for LiNi<sub>0.8</sub>Co<sub>0.2</sub>O<sub>2</sub>-based high power lithium-ion battery positive electrodes analyzed by x-ray photoelectron spectroscopy: 1. Fresh electrode in another window
Includes: Supplementary data
Journal Articles

The Si3N4/TiN Interface: 4. Si3N4/TiN(001) Grown with a −250 V Substrate Bias and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy

Richard T. Haasch, Jörg Patscheider, Niklas Hellgren, Ivan Petrov, J. E. Greene
Journal: Surface Science Spectra
Surf. Sci. Spectra 19, 62–71 (2012)
https://doi.org/10.1116/11.20121004
Published: December 2012
View article titled, The Si<sub>3</sub>N<sub>4</sub>/TiN Interface: 4. Si<sub>3</sub>N<sub>4</sub>/TiN(001) Grown with a −250 V Substrate Bias and Analyzed <em>In situ</em> using Angle-resolved X-ray Photoelectron Spectroscopy
Open the PDF for The Si<sub>3</sub>N<sub>4</sub>/TiN Interface: 4. Si<sub>3</sub>N<sub>4</sub>/TiN(001) Grown with a −250 V Substrate Bias and Analyzed <em>In situ</em> using Angle-resolved X-ray Photoelectron Spectroscopy in another window
Includes: Supplementary data
Journal Articles

Analysis of Coal by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Lei Pei, Guilin Jiang, Larry L. Baxter, Matthew R. Linford
Journal: Surface Science Spectra
Surf. Sci. Spectra 17, 1–67 (2010)
https://doi.org/10.1116/11.20080402
Published: November 2011
View article titled, Analysis of Coal by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
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Includes: Supplementary data
Journal Articles

Characterization of Cr(III) Compounds of O, OH, F and Cl by XPS

Thomas Gross, Dieter Treu, Ercan Ünveren, Erhard Kemnitz, Wolfgang E. S. Unger
Journal: Surface Science Spectra
Surf. Sci. Spectra 15, 77–123 (2008)
https://doi.org/10.1116/11.20080801
Published: March 2011
View article titled, Characterization of Cr(III) Compounds of O, OH, F and Cl by XPS
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Journal Articles

Epitaxially Grown Fe3O4 Thin Films: An XPS Study

J. F. Anderson, Markus Kuhn, Ulrike Diebold
Journal: Surface Science Spectra
Surf. Sci. Spectra 4, 266–272 (1996)
https://doi.org/10.1116/1.1247796
Published: July 1996
View article titled, Epitaxially Grown Fe<sub>3</sub>O<sub>4</sub> Thin Films: An XPS Study
Open the PDF for Epitaxially Grown Fe<sub>3</sub>O<sub>4</sub> Thin Films: An XPS Study in another window
Includes: Supplementary data