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Journal Articles

Description and operation characteristics of SPECS EnviroESCA

Paul M. Dietrich, Don R. Baer, Francesca Mirabella, Andreas Thissen

Surf. Sci. Spectra 32, 013001 (2025)

https://doi.org/10.1116/6.0003878

Published: February 2025

View articletitled, Description and operation characteristics of SPECS EnviroESCA

Journal Articles

2M NaCl by XPS using monochromatic Al K_α x rays

Khadisha M. Zahra, Liam A. J. Soomary, Jonathan D. P. Counsell

Surf. Sci. Spectra 31, 024007 (2024)

https://doi.org/10.1116/6.0003826

Published: October 2024

View articletitled, 2M NaCl by XPS using monochromatic Al Kα x rays

Journal Articles

Bismuth, by high-sensitivity low energy ion scattering

Elena Vaníčková, Stanislav Průša, Tomáš Šikola

Surf. Sci. Spectra 30, 024201 (2023)

https://doi.org/10.1116/6.0002669

Published: August 2023

View articletitled, Bismuth, by high-sensitivity low energy ion scattering

Includes: Supplementary data

Journal Articles

Ionic liquid [PMIM]⁺[NTf₂]⁻ (Solarpur®) characterized by XPS

Benjamen P. Reed, Jörg Radnik, Alexander G. Shard

Surf. Sci. Spectra 29, 014001 (2022)

https://doi.org/10.1116/6.0001518

Published: January 2022

View articletitled, Ionic liquid [PMIM]+[NTf2]− (Solarpur®) characterized by XPS

Includes: Supplementary data

Journal Articles

MoS₂ by XPS using monochromatic Ag L_α x rays

Jonathan D. P. Counsell, Sarah J. Coultas, Nikki Gerrard

Surf. Sci. Spectra 28, 024007 (2021)

https://doi.org/10.1116/6.0001447

Published: December 2021

View articletitled, MoS2 by XPS using monochromatic Ag Lα x rays

Includes: Supplementary data

Journal Articles

Ru(0001) and SiO₂/Ru(0001): XPS study

Asim Khaniya, Sameer Ezzat, Quintin Cumston, Kevin R. Coffey, William E. Kaden

Surf. Sci. Spectra 27, 024009 (2020)

https://doi.org/10.1116/6.0000172

Published: October 2020

View articletitled, Ru(0001) and SiO2/Ru(0001): XPS study

Includes: Supplementary data

Journal Articles

Coca-Cola, by near-ambient pressure XPS

Dhruv Shah, Cody V. Cushman, Stephan Bahr, Paul Dietrich, Michael Meyer, Andreas Thißen, Matthew R. Linford

Surf. Sci. Spectra 26, 024005 (2019)

https://doi.org/10.1116/1.5111037

Published: August 2019

View articletitled, Coca-Cola, by near-ambient pressure XPS

Includes: Supplementary data

Journal Articles

Nitrogen gas (N₂), by near-ambient pressure XPS

Dhruv Shah, Stephan Bahr, Paul Dietrich, Michael Meyer, Andreas Thißen, Matthew R. Linford

Surf. Sci. Spectra 26, 014023 (2019)

https://doi.org/10.1116/1.5110301

Published: July 2019

View articletitled, Nitrogen gas (N2), by near-ambient pressure XPS

Includes: Supplementary data

Journal Articles

Surface characterization of clean SrTiO₃(100) substrates by x-ray photoelectron spectroscopy

Arnaud P. Nono Tchiomo, Ganga Babu-Geetha, Emanuela Carleschi, Prosper Ngabonziza, Bryan P. Doyle

Surf. Sci. Spectra 25, 024001 (2018)

https://doi.org/10.1116/1.5041734

Published: October 2018

View articletitled, Surface characterization of clean SrTiO3(100) substrates by x-ray photoelectron spectroscopy

Includes: Supplementary data

Journal Articles

Dicarboxylic acids analyzed by time-of-flight secondary ion mass spectrometry. Part 0: Ethanedioic acid

Gustavo F. Trindade, Jose M. Ferreira, Jr., Marie-Laure Abel, Mark A. Baker, John F. Watts

Surf. Sci. Spectra 24, 021401 (2017)

https://doi.org/10.1116/1.5004981

Published: October 2017

View articletitled, Dicarboxylic acids analyzed by time-of-flight secondary ion mass spectrometry. Part 0: Ethanedioic acid

Includes: Supplementary data

Journal Articles

Comparative Spectra Illustrating Degradation of CaC₂O₄⋅H₂O During XPS Analysis

Anna Maria Salvi, Fausto Langerame, Anna Elisabetta Pace, Maria Elvira Egidia Carbone, Rosanna Ciriello

Surf. Sci. Spectra 22, 21–31 (2015)

https://doi.org/10.1116/11.20141101

Published: March 2015

View articletitled, Comparative Spectra Illustrating Degradation of CaC2O4⋅H2O During XPS Analysis

Includes: Supplementary data

Journal Articles

2-D Material Molybdenum Disulfide Analyzed by XPS

D. Ganta, S. Sinha, Richard T. Haasch

Surf. Sci. Spectra 21, 19–27 (2014)

https://doi.org/10.1116/11.20140401

Published: July 2014

View articletitled, 2-D Material Molybdenum Disulfide Analyzed by XPS

Includes: Supplementary data

Journal Articles

The Si₃N₄/TiN Interface: An Introduction to a Series of Ultrathin Films Grown and Analyzed In situ using X-ray Photoelectron Spectroscopy

Richard T. Haasch, Jörg Patscheider, Niklas Hellgren, Ivan Petrov, J. E. Greene

Surf. Sci. Spectra 19, 30–32 (2012)

https://doi.org/10.1116/11.20121108

Published: December 2012

View articletitled, The Si3N4/TiN Interface: An Introduction to a Series of Ultrathin Films Grown and Analyzed In situ using X-ray Photoelectron Spectroscopy

Journal Articles

Beam damage of HS(CH₂)₁₅ COOH Terminated Self Assembled Monolayer (SAM) as Observed by X-ray Photoelectron Spectroscopy

Mark Engelhard, Barb Tarasevich, Don Baer

Surf. Sci. Spectra 18, 68–81 (2011)

https://doi.org/10.1116/11.20080601

Published: July 2012

View articletitled, Beam damage of HS(CH2)15 COOH Terminated Self Assembled Monolayer (SAM) as Observed by X-ray Photoelectron Spectroscopy

Includes: Supplementary data

Journal Articles

LiYF₄ and LiYF₄:Eu Studied by XPS

Paweł Maślankiewicz, Jacek Szade

Surf. Sci. Spectra 18, 9–18 (2011)

https://doi.org/10.1116/11.20050701

Published: February 2012

View articletitled, LiYF4 and LiYF4:Eu Studied by XPS

Includes: Supplementary data

Journal Articles

Diblock and Triblock Fluorinated Copolymers: An ARXPS Study

Antonella Glisenti, Marta Maria Natile, Alessandro Galenda, Elisa Martinelli, Giancarlo Galli

Surf. Sci. Spectra 17, 102–114 (2010)

https://doi.org/10.1116/11.20070701

Published: February 2012

View articletitled, Diblock and Triblock Fluorinated Copolymers: An ARXPS Study

Includes: Supplementary data

Journal Articles

A Study of Solid CO 2 / NH 3 and NH 3 / H 2 O by XPS

T. R. Dillingham, D. M. Cornelison

Surf. Sci. Spectra 9, 12–20 (2002)

https://doi.org/10.1116/11.20021001

Published: May 2003

View articletitled, A Study of Solid CO 2 / NH 3 and NH 3 / H 2 O by XPS

Includes: Supplementary data

Journal Articles

Epitaxial CrN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar⁺ Sputter Etching

N. Finnegan, T.-Y. Lee, R. T. Haasch, J. E. Greene, I. Petrov

Surf. Sci. Spectra 7, 271–278 (2000)

https://doi.org/10.1116/1.1367637

Published: July 2000

View articletitled, Epitaxial CrN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar+ Sputter Etching

Includes: Supplementary data

Journal Articles

Epitaxial ScN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar⁺ Sputter Etching

N. Finnegan, T.-Y. Lee, R. T. Haasch, J. E. Greene, I. Petrov

Surf. Sci. Spectra 7, 185–192 (2000)

https://doi.org/10.1116/1.1365616

Published: July 2000

View articletitled, Epitaxial ScN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar+ Sputter Etching

Includes: Supplementary data

Journal Articles

Epitaxial VN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar⁺ Sputter Etching

N. Finnegan, T.-Y. Lee, R. T. Haasch, J. E. Greene, I. Petrov

Surf. Sci. Spectra 7, 242–249 (2000)

https://doi.org/10.1116/1.1367616

Published: July 2000

View articletitled, Epitaxial VN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar+ Sputter Etching

Includes: Supplementary data

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Description and operation characteristics of SPECS EnviroESCA

2M NaCl by XPS using monochromatic Al K_α x rays

Bismuth, by high-sensitivity low energy ion scattering

Ionic liquid [PMIM]⁺[NTf₂]⁻ (Solarpur®) characterized by XPS

MoS₂ by XPS using monochromatic Ag L_α x rays

Ru(0001) and SiO₂/Ru(0001): XPS study

Coca-Cola, by near-ambient pressure XPS

Nitrogen gas (N₂), by near-ambient pressure XPS

Surface characterization of clean SrTiO₃(100) substrates by x-ray photoelectron spectroscopy

Dicarboxylic acids analyzed by time-of-flight secondary ion mass spectrometry. Part 0: Ethanedioic acid

Comparative Spectra Illustrating Degradation of CaC₂O₄⋅H₂O During XPS Analysis

2-D Material Molybdenum Disulfide Analyzed by XPS

The Si₃N₄/TiN Interface: An Introduction to a Series of Ultrathin Films Grown and Analyzed In situ using X-ray Photoelectron Spectroscopy

Beam damage of HS(CH₂)₁₅ COOH Terminated Self Assembled Monolayer (SAM) as Observed by X-ray Photoelectron Spectroscopy

LiYF₄ and LiYF₄:Eu Studied by XPS

Diblock and Triblock Fluorinated Copolymers: An ARXPS Study

A Study of Solid CO 2 / NH 3 and NH 3 / H 2 O by XPS

Epitaxial CrN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar⁺ Sputter Etching

Epitaxial ScN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar⁺ Sputter Etching

Epitaxial VN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar⁺ Sputter Etching

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