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Journal Articles

Geometric, electronic and transport properties of bulged graphene: A theoretical study

Faling Ling, Rui Liao, Chao Yuan, Xiaowen Shi, Li Li, Xianju Zhou, Xiao Tang, Chuan Jing, Yongjie Wang, Sha Jiang
Journal: The Journal of Chemical Physics
J. Chem. Phys. 158, 084702 (2023)
https://doi.org/10.1063/5.0134654
Published: February 2023
View article titled, Geometric, electronic and transport properties of bulged graphene: A theoretical study
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Journal Articles

Applicability of coherent x-ray diffractive imaging to ferroelectric, ferromagnetic, and phase change materials

Xiaowen Shi, Jian Shi, Edwin Fohtung
Journal: Journal of Applied Physics
J. Appl. Phys. 131, 040901 (2022)
https://doi.org/10.1063/5.0072399
Published: January 2022
View article titled, Applicability of coherent x-ray diffractive imaging to ferroelectric, ferromagnetic, and phase change materials
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Journal Articles

Barrier-dependent electronic transport properties in two-dimensional MnBi2Te4-based van der Waals magnetic tunnel junctions

Zhi Yan, Xin Jia, Xiaowen Shi, Xinlong Dong, Xiaohong Xu
Journal: Applied Physics Letters
Appl. Phys. Lett. 118, 223503 (2021)
https://doi.org/10.1063/5.0052720
Published: June 2021
View article titled, Barrier-dependent electronic transport properties in two-dimensional MnBi<sub>2</sub>Te<sub>4</sub>-based van der Waals magnetic tunnel junctions
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Includes: Supplementary data
Journal Articles

X-ray ptychography on low-dimensional hard-condensed matter materials

Xiaowen Shi, Nicolas Burdet, Bo Chen, Gang Xiong, Robert Streubel, Ross Harder, Ian K. Robinson
Journal: Applied Physics Reviews
Appl. Phys. Rev. 6, 011306 (2019)
https://doi.org/10.1063/1.5045131
Published: March 2019
View article titled, X-ray ptychography on low-dimensional hard-condensed matter materials
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Journal Articles

Multi-scale imaging at the diamond beamline I13

Christoph Rau, Malte Storm, Shashidhara Marathe, Andrew J. Bodey, Silvia Cipiccia, Darren Batey, Xiaowen Shi, Marie-Christine Zdora, Irene Zanette
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2054, 030012 (2019)
https://doi.org/10.1063/1.5084575
Published: January 2019
View article titled, Multi-scale imaging at the diamond beamline I13
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Journal Articles

Near-edge X-ray refraction fine structure microscopy

Maryam Farmand, Richard Celestre, Peter Denes, A. L. David Kilcoyne, Stefano Marchesini, Howard Padmore, Tolek Tyliszczak, Tony Warwick, Xiaowen Shi, James Lee, Young-Sang Yu, Jordi Cabana, John Joseph, Harinarayan Krishnan, Talita Perciano, Filipe R. N. C. Maia, David A. Shapiro
Journal: Applied Physics Letters
Appl. Phys. Lett. 110, 063101 (2017)
https://doi.org/10.1063/1.4975377
Published: February 2017
View article titled, Near-edge X-ray refraction fine structure microscopy
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Includes: Supplementary data
Journal Articles

Elastic relaxation in an ultrathin strained silicon-on-insulator structure

Gang Xiong, Oussama Moutanabbir, Xiaojing Huang, Seyed A. Paknejad, Xiaowen Shi, Ross Harder, Manfred Reiche, Ian K. Robinson
Journal: Applied Physics Letters
Appl. Phys. Lett. 99, 114103 (2011)
https://doi.org/10.1063/1.3637634
Published: September 2011
View article titled, Elastic relaxation in an ultrathin strained silicon-on-insulator structure
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