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W. J. Palenstijn

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Journal Articles

3D imaging of semiconductor components by discrete laminography

K. J. Batenburg, W. J. Palenstijn, J. Sijbers

Journal: AIP Conference Proceedings

AIP Conf. Proc. 1601, 168–179 (2014)

https://doi.org/10.1063/1.4881350

Published: June 2014

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