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1-20 of 27
T. Ogino
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Journal Articles
Ultrahigh vacuum scanning electron microscope system combined with wide-movable scanning tunneling microscope
Available to Purchase
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 76, 083709 (2005)
Published: August 2005
Journal Articles
Extremely small diffusion constant of Cs in multiwalled carbon nanotubes
Available to PurchaseS. Suzuki, Y. Watanabe, T. Ogino, S. Heun, L. Gregoratti, A. Barinov, B. Kaulich, M. Kiskinova, W. Zhu, C. Bower, O. Zhou
Journal:
Journal of Applied Physics
J. Appl. Phys. 92, 7527–7531 (2002)
Published: December 2002
Journal Articles
Optical properties of self-assembled Ge wires grown on Si(113)
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 81, 2448–2450 (2002)
Published: September 2002
Journal Articles
Strain distribution control on the silicon wafer scale for advanced nanostructure fabrication
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 80, 1073–1075 (2002)
Published: February 2002
Journal Articles
Electronic structure of multi-walled carbon nanotubes studied by photoemission spectroscopy
Available to Purchase
Journal:
AIP Conference Proceedings
AIP Conf. Proc. 590, 193–196 (2001)
Published: October 2001
Journal Articles
Distinctly different thermal decomposition pathways of ultrathin oxide layer on Ge and Si surfaces
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 76, 2244–2246 (2000)
Published: April 2000
Journal Articles
High temperature reaction of nitric oxide with Si surfaces: Formation of Si nanopillars through nitride masking and oxygen etching
Available to Purchase
J. Vac. Sci. Technol. B 17, 1346–1349 (1999)
Published: July 1999
Journal Articles
Control of atomic step arrangements on a patterned Si(111) substrate by using molecular beam epitaxy
Available to Purchase
J. Vac. Sci. Technol. A 17, 1610–1614 (1999)
Published: July 1999
Journal Articles
Fabrication of multiperiod Si/SiO 2 / Ge layered structure through chemical bond manipulation
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 72, 3169–3171 (1998)
Published: June 1998
Journal Articles
Twinned epitaxial layers formed on Si(111)√ 3 ×√ 3 -B
Available to Purchase
J. Vac. Sci. Technol. A 16, 1934–1937 (1998)
Published: May 1998
Journal Articles
Shift of surface Fermi level position toward the conduction band minimum by crystal defects near GaAs(001) surface
Available to Purchase
Journal:
Journal of Applied Physics
J. Appl. Phys. 82, 1661–1666 (1997)
Published: August 1997
Journal Articles
In-rich 4×2 reconstruction in novel planar growth of InAs on GaAs(001)
Available to Purchase
J. Vac. Sci. Technol. B 15, 1270–1273 (1997)
Published: July 1997
Journal Articles
Fabrication of buried epitaxial CoSi 2 layer through selective diffusion
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 70, 607–609 (1997)
Published: February 1997
Journal Articles
Fabrication of nanostructures on silicon surfaces on wafer scale by controlling self‐organization processes
Available to Purchase
J. Vac. Sci. Technol. B 14, 4134–4139 (1996)
Published: November 1996
Journal Articles
Diffusion mediated chemical reaction in Co/Ge/Si(100) forming Ge/CoSi2/Si(100)
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 68, 1241–1243 (1996)
Published: February 1996
Journal Articles
In situ observation of silicon hydrides on Si(100) surfaces during synchrotron‐radiation‐stimulated Si2H6 gas source molecular beam epitaxy
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 67, 2364–2366 (1995)
Published: October 1995
Journal Articles
Reducing domain boundaries of surface reconstruction during molecular beam epitaxy on Si(111)
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 67, 915–917 (1995)
Published: August 1995
Journal Articles
Thermal effects on GaAs(001) surface prepared by deoxygenated and de‐ionized water treatment
Available to Purchase
J. Vac. Sci. Technol. A 13, 1676–1680 (1995)
Published: May 1995
Journal Articles
Ge island formation on Si(111) in solid phase epitaxy studied by medium‐energy ion scattering
Available to Purchase
J. Vac. Sci. Technol. B 13, 387–389 (1995)
Published: March 1995
Journal Articles
Interface structure of Ge/Si(111) during solid‐phase epitaxy studied by medium‐energy ion scattering
Available to Purchase
J. Vac. Sci. Technol. A 13, 289–294 (1995)
Published: March 1995
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