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1-20 of 21
S. R. Manalis
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Journal Articles
Measuring Boltzmann’s constant with a low-cost atomic force microscope: An undergraduate experiment
Available to Purchase
Journal:
American Journal of Physics
Am. J. Phys. 74, 873–879 (2006)
Published: October 2006
Journal Articles
Scanning probe microscopy with inherent disturbance suppression
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 85, 3929–3931 (2004)
Published: October 2004
Journal Articles
Suspended microchannel resonators for biomolecular detection
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 83, 2698–2700 (2003)
Published: September 2003
Journal Articles
Microfabricated mechanical biosensor with inherently differential readout
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 83, 1659–1661 (2003)
Published: August 2003
Journal Articles
Robust microfabricated field-effect sensor for monitoring molecular adsorption in liquids
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 79, 3875–3877 (2001)
Published: December 2001
Journal Articles
Parallel atomic force microscopy with optical interferometric detection
Available to PurchaseT. Sulchek, R. J. Grow, G. G. Yaralioglu, S. C. Minne, C. F. Quate, S. R. Manalis, A. Kiraz, A. Aydine, A. Atalar
Journal:
Applied Physics Letters
Appl. Phys. Lett. 78, 1787–1789 (2001)
Published: March 2001
Journal Articles
Experimental and theoretical results of room-temperature single-electron transistor formed by the atomic force microscope nano-oxidation process
Available to PurchaseY. Gotoh, K. Matsumoto, T. Maeda, E. B. Cooper, S. R. Manalis, H. Fang, S. C. Minne, T. Hunt, H. Dai, J. Harris, C. F. Quate
J. Vac. Sci. Technol. A 18, 1321–1325 (2000)
Published: July 2000
Journal Articles
High-resolution micromachined interferometric accelerometer
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 76, 3316–3318 (2000)
Published: May 2000
Journal Articles
Microvolume field-effect p H sensor for the scanning probe microscope
Available to PurchaseS. R. Manalis, E. B. Cooper, P. F. Indermuhle, P. Kernen, P. Wagner, D. G. Hafeman, S. C. Minne, C. F. Quate
Journal:
Applied Physics Letters
Appl. Phys. Lett. 76, 1072–1074 (2000)
Published: February 2000
Journal Articles
Terabit-per-square-inch data storage with the atomic force microscope
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 75, 3566–3568 (1999)
Published: November 1999
Journal Articles
Near-field photolithography with a solid immersion lens
Available to PurchaseL. P. Ghislain, V. B. Elings, K. B. Crozier, S. R. Manalis, S. C. Minne, K. Wilder, G. S. Kino, C. F. Quate
Journal:
Applied Physics Letters
Appl. Phys. Lett. 74, 501–503 (1999)
Published: January 1999
Journal Articles
Centimeter scale atomic force microscope imaging and lithography
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 73, 1742–1744 (1998)
Published: September 1998
Journal Articles
Analysis and design of an interdigital cantilever as a displacement sensor
Available to Purchase
Journal:
Journal of Applied Physics
J. Appl. Phys. 83, 7405–7415 (1998)
Published: June 1998
Journal Articles
Automated parallel high-speed atomic force microscopy
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 72, 2340–2342 (1998)
Published: May 1998
Journal Articles
Two-dimensional micromechanical bimorph arrays for detection of thermal radiation
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 70, 3311–3313 (1997)
Published: June 1997
Journal Articles
Interdigital cantilevers for atomic force microscopy
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 69, 3944–3946 (1996)
Published: December 1996
Journal Articles
High‐speed atomic force microscopy using an integrated actuator and optical lever detection
Available to Purchase
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 67, 3294–3297 (1996)
Published: September 1996
Journal Articles
Independent parallel lithography using the atomic force microscope
Available to Purchase
J. Vac. Sci. Technol. B 14, 2456–2461 (1996)
Published: July 1996
Journal Articles
Contact imaging in the atomic force microscope using a higher order flexural mode combined with a new sensor
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 68, 1427–1429 (1996)
Published: March 1996
Journal Articles
Atomic force microscopy for high speed imaging using cantilevers with an integrated actuator and sensor
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 68, 871–873 (1996)
Published: February 1996
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