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1-20 of 43
S. K. Banerjee
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Journal Articles
Top-gated chemical vapor deposited MoS2 field-effect transistors on Si3N4 substrates
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 106, 062101 (2015)
Published: February 2015
Journal Articles
Lg = 100 nm In0.7Ga0.3As quantum well metal-oxide semiconductor field-effect transistors with atomic layer deposited beryllium oxide as interfacial layer
Available to PurchaseD. Koh, H. M. Kwon, T.-W. Kim, D.-H. Kim, Todd W. Hudnall, Christopher W. Bielawski, W. Maszara, D. Veksler, D. Gilmer, P. D. Kirsch, S. K. Banerjee
Journal:
Applied Physics Letters
Appl. Phys. Lett. 104, 163502 (2014)
Published: April 2014
Journal Articles
Poly(methyl methacrylate) as a self-assembled gate dielectric for graphene field-effect transistors
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 104, 083106 (2014)
Published: February 2014
Journal Articles
Low interface defect density of atomic layer deposition BeO with self-cleaning reaction for InGaAs metal oxide semiconductor field effect transistors
Available to PurchaseH. S. Shin, J. H. Yum, D. W. Johnson, H. R. Harris, Todd. W. Hudnall, J. Oh, P. Kirsch, W.-E. Wang, C. W. Bielawski, S. K. Banerjee, J. C. Lee, H. D. Lee
Journal:
Applied Physics Letters
Appl. Phys. Lett. 103, 223504 (2013)
Published: November 2013
Journal Articles
Evidence for hydrogen two-level systems in atomic layer deposition oxides
Available to PurchaseM. S. Khalil, M. J. A. Stoutimore, S. Gladchenko, A. M. Holder, C. B. Musgrave, A. C. Kozen, G. Rubloff, Y. Q. Liu, R. G. Gordon, J. H. Yum, S. K. Banerjee, C. J. Lobb, K. D. Osborn
Journal:
Applied Physics Letters
Appl. Phys. Lett. 103, 162601 (2013)
Published: October 2013
Journal Articles
Ultra-smooth epitaxial Ge grown on Si(001) utilizing a thin C-doped Ge buffer layer
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 102, 192111 (2013)
Published: May 2013
Journal Articles
A study of capping layers for sulfur monolayer doping on III-V junctions
Available to PurchaseJ. H. Yum, H. S. Shin, R. Hill, J. Oh, H. D. Lee, Ryan M. Mushinski, Todd W. Hudnall, C. W. Bielawski, S. K. Banerjee, W. Y. Loh, Wei-E Wang, Paul Kirsch
Journal:
Applied Physics Letters
Appl. Phys. Lett. 101, 253514 (2012)
Published: December 2012
Journal Articles
Spectroscopic evaluation of band alignment of atomic layer deposited BeO on Si(100)
Available to PurchaseMing Lei, J. H. Yum, J. Price, Todd W. Hudnall, C. W. Bielawski, S. K. Banerjee, P. S. Lysaght, G. Bersuker, M. C. Downer
Journal:
Applied Physics Letters
Appl. Phys. Lett. 100, 122906 (2012)
Published: March 2012
Journal Articles
Spin-transfer-torque switching in spin valve structures with perpendicular, canted, and in-plane magnetic anisotropies
Available to Purchase
Journal:
Journal of Applied Physics
Series: Magnetism and Magnetic Materials
J. Appl. Phys. 111, 07C913 (2012)
Published: March 2012
Journal Articles
Theoretical approach to evaluating beryllium oxide as a gate dielectric considering electromagnetics and thermal stability
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 100, 053501 (2012)
Published: January 2012
Journal Articles
Comparison of the self-cleaning effects and electrical characteristics of BeO and Al2O3 deposited as an interface passivation layer on GaAs MOS devices
Available to PurchaseJ. H. Yum, T. Akyol, D. A. Ferrer, J. C. Lee, S. K. Banerjee, M. Lei, M. Downer, Todd. W. Hudnall, C. W. Bielawski, G. Bersuker
J. Vac. Sci. Technol. A 29, 061501 (2011)
Published: September 2011
Journal Articles
Inversion type InP metal oxide semiconductor field effect transistor using novel atomic layer deposited BeO gate dielectric
Available to PurchaseJ. H. Yum, T. Akyol, M. Lei, D. A. Ferrer, Todd. W. Hudnall, M. Downer, C. W. Bielawski, G. Bersuker, J. C. Lee, S. K. Banerjee
Journal:
Applied Physics Letters
Appl. Phys. Lett. 99, 033502 (2011)
Published: July 2011
Journal Articles
Origin of shape anisotropy effects in solution-phase synthesized FePt nanomagnets
Available to PurchaseD. A. Ferrer, S. Guchhait, H. Liu, F. Ferdousi, C. Corbet, H. Xu, M. Doczy, G. Bourianoff, L. Mathew, R. Rao, S. Saha, M. Ramon, S. Ganguly, J. T. Markert, S. K. Banerjee
Journal:
Journal of Applied Physics
J. Appl. Phys. 110, 014316 (2011)
Published: July 2011
Journal Articles
Atomic layer deposited beryllium oxide: Effective passivation layer for III-V metal/oxide/semiconductor devices
Available to PurchaseJ. H. Yum, T. Akyol, M. Lei, T. Hudnall, G. Bersuker, M. Downer, C. W. Bielawski, J. C. Lee, S. K. Banerjee
Journal:
Journal of Applied Physics
J. Appl. Phys. 109, 064101 (2011)
Published: March 2011
Journal Articles
Hall mobility measurements in enhancement-mode GaAs field-effect transistors with Al 2 O 3 gate dielectric
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 97, 213506 (2010)
Published: November 2010
Journal Articles
Band engineered epitaxial Ge – Si x Ge 1 − x core-shell nanowire heterostructures
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Journal:
Applied Physics Letters
Appl. Phys. Lett. 95, 033101 (2009)
Published: July 2009
Journal Articles
Realization of dual-gated Ge – Si x Ge 1 − x core-shell nanowire field effect transistors with highly doped source and drain
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 94, 063117 (2009)
Published: February 2009
Journal Articles
Doping of Ge – Si x Ge 1 − x core-shell nanowires using low energy ion implantation
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 93, 203108 (2008)
Published: November 2008
Journal Articles
Chemical and physical interface studies of the atomic-layer-deposited Al 2 O 3 on GaAs substrates
Available to Purchase
Journal:
Applied Physics Letters
Appl. Phys. Lett. 92, 223501 (2008)
Published: June 2008
Journal Articles
Fabrication and characterization of metal-oxide-semiconductor GaAs capacitors on Ge ∕ Si 1 − x Ge x ∕ Si substrates with Al 2 O 3 gate dielectric
Available to PurchaseD. Shahrjerdi, N. Nuntawong, G. Balakrishnan, D. I. Garcia-Gutierrez, A. Khoshakhlagh, E. Tutuc, D. Huffaker, J. C. Lee, S. K. Banerjee
J. Vac. Sci. Technol. B 26, 1182–1186 (2008)
Published: May 2008
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