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Peter R. Tremaine
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Journal Articles

Revised Parameters for the IAPWS Formulation for the Ionization Constant of Water Over a Wide Range of Temperatures and Densities, Including Near-Critical Conditions

Open Access
Hugues Arcis, Martin Bachet, Shirley Dickinson, Iain Duncanson, Richard W. Eaker, Jennifer Jarvis, Ken Johnson, Christopher A. Lee, Fred Lord, Chuck Marks, Peter R. Tremaine
Journal: Journal of Physical and Chemical Reference Data
J. Phys. Chem. Ref. Data 53, 023103 (2024)
https://doi.org/10.1063/5.0198792
Published: May 2024
View articletitled, Revised Parameters for the IAPWS Formulation for the Ionization Constant of Water Over a Wide Range of Temperatures and Densities, Including Near-Critical Conditions
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Journal Articles

Critical Review of Transport Properties of HCl, KOH, and NaOH in High Temperature Water and Correlations for Transport Properties of H3O+ and OH−

Editor’s PickAvailable to Purchase
Hugues Arcis, Christopher A. Lee, Gregory H. Zimmerman, Peter R. Tremaine
Journal: Journal of Physical and Chemical Reference Data
J. Phys. Chem. Ref. Data 52, 023103 (2023)
https://doi.org/10.1063/5.0138262
Published: May 2023
View articletitled, Critical Review of Transport Properties of HCl, KOH, and NaOH in High Temperature Water and Correlations for Transport Properties of H3O+ and OH−
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Journal Articles

The Ionization Constant of Water at Elevated Temperatures and Pressures: New Data from Direct Conductivity Measurements and Revised Formulations from T = 273 K to 674 K and p = 0.1 MPa to 31 MPa

Editor’s PickScilightAvailable to Purchase
Hugues Arcis, Jane P. Ferguson, Jenny S. Cox, Peter R. Tremaine
Journal: Journal of Physical and Chemical Reference Data
J. Phys. Chem. Ref. Data 49, 033103 (2020)
https://doi.org/10.1063/1.5127662
Published: July 2020
View articletitled, The Ionization Constant of Water at Elevated Temperatures and Pressures: New Data from Direct Conductivity Measurements and Revised Formulations from T = 273 K to 674 K and p = 0.1 MPa to 31 MPa
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Journal Articles

Polymorphism in phenol under pressure: The x‐ray powder diffraction patterns of phenol I and II at −190 °C, and the volume compressibilities of phenol I and II at 10 °C

Available to Purchase
John E. Bertie, Peter R. Tremaine
Journal: The Journal of Chemical Physics
J. Chem. Phys. 63, 3334–3336 (1975)
https://doi.org/10.1063/1.431823
Published: October 1975
View articletitled, Polymorphism in phenol under pressure: The x‐ray powder diffraction patterns of phenol I and II at −190 °C, and the volume compressibilities of phenol I and II at 10 °C
Open the PDF for Polymorphism in phenol under pressure: The x‐ray powder diffraction patterns of phenol I and II at −190 °C, and the volume compressibilities of phenol I and II at 10 °C in another window