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Pascal Mercère
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Journal Articles

Characterization of a back-illuminated CMOS camera for soft x-ray coherent scattering

Kewin Desjardins, Horia Popescu, Pascal Mercère, Claude Menneglier, Roland Gaudemer, Karina Thånell, Nicolas Jaouen
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2054, 060066 (2019)
https://doi.org/10.1063/1.5084697
Published: January 2019
View article titled, Characterization of a back-illuminated CMOS camera for soft x-ray coherent scattering
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Journal Articles

Multi-lateral shearing interferometry: Principle and application to X-ray phase imaging

Jérôme Primot, Julien Rizzi, Pascal Mercère, Mourad Idir, Pierre Bon, Benoit Wattellier, Guillaume Druart, Grégory Vincent, Riad Haïdar, Timm Weitkamp, Nicolas Guérineau, Serge Monneret
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1466, 35–40 (2012)
https://doi.org/10.1063/1.4742266
Published: July 2012
View article titled, Multi-lateral shearing interferometry: Principle and application to X-ray phase imaging
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Journal Articles

Metrology and Tests beamline at SOLEIL Design and first results

Mourad Idir, Pascal Mercere, Thierry Moreno, Aurélien Delmotte, Paulo Dasilva, Mohammed H. Modi
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1234, 485–488 (2010)
https://doi.org/10.1063/1.3463247
Published: June 2010
View article titled, Metrology and Tests beamline at SOLEIL Design and first results
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Journal Articles

Wavefront Closed‐Loop Correction for X‐Ray Microfocusing Active Optics

Pascal Mercère, Mourad Idir, Thierry Moreno, Gilles Cauchon, Guillaume Dovillaire, Xavier Levecq, Samuel Bucourt
Journal: AIP Conference Proceedings
AIP Conf. Proc. 879, 722–725 (2007)
https://doi.org/10.1063/1.2436164
Published: January 2007
View article titled, Wavefront Closed‐Loop Correction for X‐Ray Microfocusing Active Optics
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Journal Articles

Metrology and Tests Beamline at SOLEIL

Mourad Idir, Pascal Mercere, Thierry Moreno, Aurélien Delmotte
Journal: AIP Conference Proceedings
AIP Conf. Proc. 879, 619–622 (2007)
https://doi.org/10.1063/1.2436137
Published: January 2007
View article titled, Metrology and Tests Beamline at SOLEIL
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Journal Articles

New Optical Setup for the Generation of Variable Spot Size on Third Generation Synchrotron Beam lines

Thierry Moreno, Rachid Belkhou, Gilles Cauchon, Mourad Idir, Pascal Mercère
Journal: AIP Conference Proceedings
AIP Conf. Proc. 879, 455–458 (2007)
https://doi.org/10.1063/1.2436097
Published: January 2007
View article titled, New Optical Setup for the Generation of Variable Spot Size on Third Generation Synchrotron Beam lines
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Journal Articles

X ray Wavefront Hartmann Sensor

Pascal Mercère, Mourad Idir, Philippe Zeitoun, Xavier Levecq, Guillaume Dovillaire, Samuel Bucourt, Denis Douillet, Kenneth A. Goldberg, Patrick P. Naulleau, Senajith Rekawa
Journal: AIP Conference Proceedings
AIP Conf. Proc. 705, 819–822 (2004)
https://doi.org/10.1063/1.1757921
Published: May 2004
View article titled, X ray Wavefront Hartmann Sensor
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