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Mourad Idir
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Journal Articles

Effect of electronic transitions on near edge optical properties of off-stoichiometric boron carbide thin films

Mohammed H. Modi, Rajkumar Gupta, Praveen K. Yadav, Shruti Gupta, C. Mukherjee, Mourad Idir
Journal: Journal of Applied Physics
J. Appl. Phys. 133, 165302 (2023)
https://doi.org/10.1063/5.0145828
Published: April 2023
View article titled, Effect of electronic transitions on near edge optical properties of off-stoichiometric boron carbide thin films
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Journal Articles

In-situ metrology for adaptive x-ray optics with an array of interferometric absolute distance measuring sensors

Vivek G. Badami, Ernesto Abruña, Lei Huang, Mourad Idir
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2054, 060027 (2019)
https://doi.org/10.1063/1.5084658
Published: January 2019
View article titled, In-situ metrology for adaptive x-ray optics with an array of interferometric absolute distance measuring sensors
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Journal Articles

Initial performances of first undulator-based hard x-ray beamlines of NSLS-II compared to simulations

Oleg Chubar, Yong S. Chu, Xiaojing Huang, Sebastian Kalbfleisch, Hanfei Yan, Timur Shaftan, Guimei Wang, Yong Q. Cai, Alexey Suvorov, Andrei Fluerasu, Lutz Wiegart, Yu-chen Karen Chen-Wiegart, Juergen Thieme, Garth Williams, Mourad Idir, Toshiya Tanabe, Paul Zschack, Qun Shen
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1741, 040002 (2016)
https://doi.org/10.1063/1.4952874
Published: July 2016
View article titled, Initial performances of first undulator-based hard x-ray beamlines of NSLS-II compared to simulations
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Journal Articles

NSLS-II biomedical beamlines for micro-crystallography, FMX, and for highly automated crystallography, AMX: New opportunities for advanced data collection

Martin R. Fuchs, Dileep K. Bhogadi, Jean Jakoncic, Stuart Myers, Robert M. Sweet, Lonny E. Berman, John Skinner, Mourad Idir, Oleg Chubar, Sean McSweeney, Dieter K. Schneider
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1741, 030006 (2016)
https://doi.org/10.1063/1.4952829
Published: July 2016
View article titled, NSLS-II biomedical beamlines for micro-crystallography, FMX, and for highly automated crystallography, AMX: New opportunities for advanced data collection
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Journal Articles

A one-dimensional ion beam figuring system for x-ray mirror fabrication

Mourad Idir, Lei Huang, Nathalie Bouet, Konstantine Kaznatcheev, Matthew Vescovi, Ken Lauer, Ray Conley, Kent Rennie, Jim Kahn, Richard Nethery, Lin Zhou
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 86, 105120 (2015)
https://doi.org/10.1063/1.4934806
Published: October 2015
View article titled, A one-dimensional ion beam figuring system for x-ray mirror fabrication
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Journal Articles

Comparison of Mo/Si and NbC/Si lamellar multilayer gratings near Si absorption edge

Ankita Niranjan, Mohammed H. Modi, Amol Singh, Mourad Idir, G. S. Lodha
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1591, 687–689 (2014)
https://doi.org/10.1063/1.4872720
Published: April 2014
View article titled, Comparison of Mo/Si and NbC/Si lamellar multilayer gratings near Si absorption edge
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Journal Articles

Multi-lateral shearing interferometry: Principle and application to X-ray phase imaging

Jérôme Primot, Julien Rizzi, Pascal Mercère, Mourad Idir, Pierre Bon, Benoit Wattellier, Guillaume Druart, Grégory Vincent, Riad Haïdar, Timm Weitkamp, Nicolas Guérineau, Serge Monneret
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1466, 35–40 (2012)
https://doi.org/10.1063/1.4742266
Published: July 2012
View article titled, Multi-lateral shearing interferometry: Principle and application to X-ray phase imaging
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Journal Articles

Study of Micro Roughness Parameters and Growth Characteristics of NbC/Si Multilayer using Layer by Layer Power Spectral Density Analysis

Mohammed H. Modi, G. S. Lodha, M. Thomasset, Mourad Idir
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1349, 715–716 (2011)
https://doi.org/10.1063/1.3606058
Published: July 2011
View article titled, Study of Micro Roughness Parameters and Growth Characteristics of NbC/Si Multilayer using Layer by Layer Power Spectral Density Analysis
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Journal Articles

X-ray detectors based on GaN Schottky diodes

Jean-Yves Duboz, Eric Frayssinet, Sébastien Chenot, Jean-Luc Reverchon, Mourad Idir
Journal: Applied Physics Letters
Appl. Phys. Lett. 97, 163504 (2010)
https://doi.org/10.1063/1.3500838
Published: October 2010
View article titled, X-ray detectors based on GaN Schottky diodes
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Journal Articles

Metrology and Tests beamline at SOLEIL Design and first results

Mourad Idir, Pascal Mercere, Thierry Moreno, Aurélien Delmotte, Paulo Dasilva, Mohammed H. Modi
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1234, 485–488 (2010)
https://doi.org/10.1063/1.3463247
Published: June 2010
View article titled, Metrology and Tests beamline at SOLEIL Design and first results
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Journal Articles

Shape error analysis for reflective nano focusing optics

Mohammed H. Modi, Mourad Idir
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1234, 681–684 (2010)
https://doi.org/10.1063/1.3463299
Published: June 2010
View article titled, Shape error analysis for reflective nano focusing optics
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Journal Articles

X‐ray Phase Contrast analysis—Digital wavefront development

Mourad Idir, Jonathan Potier, Sébastien Fricker, Anatoly Snigirev, Irina Snigireva, M. H. Modi
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1234, 677–680 (2010)
https://doi.org/10.1063/1.3463298
Published: June 2010
View article titled, X‐ray Phase Contrast analysis—Digital wavefront development
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Journal Articles

A High Resolution Soft X‐ray Monochromator Focused by the Holographic Effect of a VLS grating

Françis Polack, Bruno Lagarde, Mourad Idir
Journal: AIP Conference Proceedings
AIP Conf. Proc. 879, 655–658 (2007)
https://doi.org/10.1063/1.2436146
Published: January 2007
View article titled, A High Resolution Soft X‐ray Monochromator Focused by the Holographic Effect of a VLS grating
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Journal Articles

Alternate Multilayer Gratings with Enhanced Diffraction Efficiency in the 500–5000 eV Energy Domain

François Polack, Bruno Lagarde, Mourad Idir, Audrey Liard Cloup, Erick Jourdain, Marc Roulliay, Franck Delmotte, Julien Gautier, Marie‐Françoise Ravet‐Krill
Journal: AIP Conference Proceedings
AIP Conf. Proc. 879, 489–492 (2007)
https://doi.org/10.1063/1.2436105
Published: January 2007
View article titled, Alternate Multilayer Gratings with Enhanced Diffraction Efficiency in the 500–5000 eV Energy Domain
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Journal Articles

New Optical Setup for the Generation of Variable Spot Size on Third Generation Synchrotron Beam lines

Thierry Moreno, Rachid Belkhou, Gilles Cauchon, Mourad Idir, Pascal Mercère
Journal: AIP Conference Proceedings
AIP Conf. Proc. 879, 455–458 (2007)
https://doi.org/10.1063/1.2436097
Published: January 2007
View article titled, New Optical Setup for the Generation of Variable Spot Size on Third Generation Synchrotron Beam lines
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Journal Articles

Wavefront Closed‐Loop Correction for X‐Ray Microfocusing Active Optics

Pascal Mercère, Mourad Idir, Thierry Moreno, Gilles Cauchon, Guillaume Dovillaire, Xavier Levecq, Samuel Bucourt
Journal: AIP Conference Proceedings
AIP Conf. Proc. 879, 722–725 (2007)
https://doi.org/10.1063/1.2436164
Published: January 2007
View article titled, Wavefront Closed‐Loop Correction for X‐Ray Microfocusing Active Optics
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Journal Articles

Variable Groove Depth Gratings and their Applications in Soft X‐ray Monochromators

François Polack, Bruno Lagarde, Mourad Idir, Audrey Liard Cloup, Erick Jourdain
Journal: AIP Conference Proceedings
AIP Conf. Proc. 879, 639–642 (2007)
https://doi.org/10.1063/1.2436142
Published: January 2007
View article titled, Variable Groove Depth Gratings and their Applications in Soft X‐ray Monochromators
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Journal Articles

Metrology and Tests Beamline at SOLEIL

Mourad Idir, Pascal Mercere, Thierry Moreno, Aurélien Delmotte
Journal: AIP Conference Proceedings
AIP Conf. Proc. 879, 619–622 (2007)
https://doi.org/10.1063/1.2436137
Published: January 2007
View article titled, Metrology and Tests Beamline at SOLEIL
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Journal Articles

X ray Wavefront Hartmann Sensor

Pascal Mercère, Mourad Idir, Philippe Zeitoun, Xavier Levecq, Guillaume Dovillaire, Samuel Bucourt, Denis Douillet, Kenneth A. Goldberg, Patrick P. Naulleau, Senajith Rekawa
Journal: AIP Conference Proceedings
AIP Conf. Proc. 705, 819–822 (2004)
https://doi.org/10.1063/1.1757921
Published: May 2004
View article titled, X ray Wavefront Hartmann Sensor
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Journal Articles

At-wavelength detection of extreme ultraviolet lithography mask blank defects

Seongtae Jeong, Mourad Idir, Yun Lin, Lewis Johnson, Seno Rekawa, Michael Jones, Paul Denham, Phil Batson, Rick Levesque, Patrick Kearney, Pei-Yang Yan, Eric Gullikson, James H. Underwood, Jeffrey Bokor
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 16, 3430–3434 (1998)
https://doi.org/10.1116/1.590473
Published: November 1998
View article titled, At-wavelength detection of extreme ultraviolet lithography mask blank defects
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