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1-20 of 21
Milos Toth
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Journal Articles
Yongliang Chen, Angus Gale, Karin Yamamura, Jake Horder, Alexander Condos, Kenji Watanabe, Takashi Taniguchi, Milos Toth, Igor Aharonovich
Journal:
Applied Physics Letters
Appl. Phys. Lett. 123, 041902 (2023)
Published: July 2023
Journal Articles
Thinh N. Tran, Angus Gale, Benjamin Whitefield, Vladimir Dyakonov, Milos Toth, Igor Aharonovich, Mehran Kianinia
Journal:
Applied Physics Letters
Appl. Phys. Lett. 123, 031102 (2023)
Published: July 2023
Journal Articles
Quantum emitters in 2D materials: Emitter engineering, photophysics, and integration in photonic nanostructures
Journal:
Applied Physics Reviews
Appl. Phys. Rev. 9, 011306 (2022)
Published: January 2022
Journal Articles
Site control of quantum emitters in gallium nitride by polarity
Available to PurchaseMinh Anh Phan Nguyen, Jennifer Hite, Michael A. Mastro, Mehran Kianinia, Milos Toth, Igor Aharonovich
Journal:
Applied Physics Letters
Appl. Phys. Lett. 118, 021103 (2021)
Published: January 2021
Journal Articles
Electrical excitation and charge-state conversion of silicon vacancy color centers in single-crystal diamond membranes
Available to PurchaseKerem Bray, Dmitry Yu. Fedyanin, Igor A. Khramtsov, Maryna O. Bilokur, Blake Regan, Milos Toth, Igor Aharonovich
Journal:
Applied Physics Letters
Appl. Phys. Lett. 116, 101103 (2020)
Published: March 2020
Journal Articles
Suppression of spectral diffusion by anti-Stokes excitation of quantum emitters in hexagonal boron nitride
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Journal:
Applied Physics Letters
Appl. Phys. Lett. 115, 071102 (2019)
Published: August 2019
Journal Articles
Minh Nguyen, Tongtong Zhu, Mehran Kianinia, Fabien Massabuau, Igor Aharonovich, Milos Toth, Rachel Oliver, Carlo Bradac
Journal:
APL Materials
APL Mater. 7, 081106 (2019)
Published: August 2019
Journal Articles
Electron beam induced etching of carbon
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Journal:
Applied Physics Letters
Appl. Phys. Lett. 107, 041603 (2015)
Published: July 2015
Includes: Supplementary data
Journal Articles
Role of recombination pathway competition in spatially resolved cathodoluminescence spectroscopy
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Journal:
Applied Physics Letters
Appl. Phys. Lett. 105, 241112 (2014)
Published: December 2014
Includes: Supplementary data
Journal Articles
Localized chemical switching of the charge state of nitrogen-vacancy luminescence centers in diamond
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Journal:
Applied Physics Letters
Appl. Phys. Lett. 105, 063103 (2014)
Published: August 2014
Journal Articles
Effects of oxygen on electron beam induced deposition of SiO2 using physisorbed and chemisorbed tetraethoxysilane
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Journal:
Applied Physics Letters
Appl. Phys. Lett. 101, 211605 (2012)
Published: November 2012
Journal Articles
Kinetics of gas mediated electron beam induced etching
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Journal:
Applied Physics Letters
Appl. Phys. Lett. 99, 213103 (2011)
Published: November 2011
Journal Articles
Interfacial mixing and internal structure of Pt-containing nanocomposites grown by room temperature electron beam induced deposition
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Journal:
Journal of Applied Physics
J. Appl. Phys. 107, 103540 (2010)
Published: May 2010
Journal Articles
Contamination-free imaging by electron induced carbon volatilization in environmental scanning electron microscopy
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Journal:
Journal of Applied Physics
J. Appl. Phys. 106, 034306 (2009)
Published: August 2009
Journal Articles
Noise characteristics of the gas ionization cascade used in low vacuum scanning electron microscopy
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Journal:
Journal of Applied Physics
J. Appl. Phys. 106, 014904 (2009)
Published: July 2009
Journal Articles
Evolution of the nanostructure of deposits grown by electron beam induced deposition
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Journal:
Applied Physics Letters
Appl. Phys. Lett. 93, 023130 (2008)
Published: July 2008
Includes: Supplementary data
Journal Articles
Secondary electron imaging at gas pressures in excess of 1 kPa
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Journal:
Applied Physics Letters
Appl. Phys. Lett. 91, 053122 (2007)
Published: August 2007
Journal Articles
Electron flux controlled switching between electron beam induced etching and deposition
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Journal:
Journal of Applied Physics
J. Appl. Phys. 101, 054309 (2007)
Published: March 2007
Journal Articles
Imaging deep trap distributions by low vacuum scanning electron microscopy
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Journal:
Applied Physics Letters
Appl. Phys. Lett. 90, 072905 (2007)
Published: February 2007
Journal Articles
Secondary electron imaging of nonconductors with nanometer resolution
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Journal:
Applied Physics Letters
Appl. Phys. Lett. 88, 023105 (2006)
Published: January 2006
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