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Journal Articles

Probing the local emission of CaAlSiN3:Eu2 + via X-ray nanoprobe

Shu-Chi Huang, Yu-Hao Wu, Shih-Yu Fu, Chien-Yu Lee, Bo-Yi Chen, Gung-Chian Yin, Shyan-Lung Chung, Bi-Hsuan Lin, Mau-Tsu Tang
Journal: AIP Advances
AIP Advances 11, 055013 (2021)
https://doi.org/10.1063/5.0051034
Published: May 2021
View article titled, Probing the local emission of CaAlSiN<sub>3</sub>:Eu<sup>2 + </sup> via X-ray nanoprobe
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Journal Articles

Observation of anomalous emissions of nonpolar a-plane MgZnO and ZnO epi-films based on XEOL and time-resolved XEOL in hybrid bunch mode

Bi-Hsuan Lin, Yu-Hao Wu, Yung-Chi Wu, Wei-Rein Liu, Chien-Yu Lee, Bo-Yi Chen, Gung-Chian Yin, Wen-Feng Hsieh, Mau-Tsu Tang
Journal: AIP Advances
AIP Advances 10, 085106 (2020)
https://doi.org/10.1063/5.0015244
Published: August 2020
View article titled, Observation of anomalous emissions of nonpolar <em>a</em>-plane MgZnO and ZnO epi-films based on XEOL and time-resolved XEOL in hybrid bunch mode
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Journal Articles

Hard X-ray nanoprobe and time-resolved XEOL to observe increasing luminescence of ZnO and GaN epitaxial structures

Bi-Hsuan Lin, Yu-Hao Wu, Tai-Sing Wu, Yung-Chi Wu, Xiao-Yun Li, Wei-Rein Liu, Mau-Tsu Tang, Wen-Feng Hsieh
Journal: Applied Physics Letters
Appl. Phys. Lett. 115, 171903 (2019)
https://doi.org/10.1063/1.5123271
Published: October 2019
View article titled, Hard X-ray nanoprobe and time-resolved XEOL to observe increasing luminescence of ZnO and GaN epitaxial structures
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Journal Articles

Polarization-dependent XEOL: Comparison of peculiar near-band-edge emission of non-polar a-plane GaN and ZnO wafers

Bi-Hsuan Lin, Yung-Chi Wu, Jyh-Fu Lee, Mau-Tsu Tang, Wen-Feng Hsieh
Journal: Applied Physics Letters
Appl. Phys. Lett. 114, 091102 (2019)
https://doi.org/10.1063/1.5066588
Published: March 2019
View article titled, Polarization-dependent XEOL: Comparison of peculiar near-band-edge emission of non-polar <em>a</em>-plane GaN and ZnO wafers
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Journal Articles

Design and application of a mono-beam slit system at Taiwan photon source

Longlife Lee, Chien-Hung Chang, Liang-Jen Huang, Mau-Tsu Tang, Shih-Hung Chang
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2054, 060054 (2019)
https://doi.org/10.1063/1.5084685
Published: January 2019
View article titled, Design and application of a mono-beam slit system at Taiwan photon source
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Journal Articles

Probing the exciton-phonon coupling strengths of O-polar and Zn-polar ZnO wafer using hard X-ray excited optical luminescence

Bi-Hsuan Lin, Huang-Yeh Chen, Shao-Chin Tseng, Jian-Xing Wu, Bo-Yi Chen, Chien-Yu Lee, Gung-Chian Yin, Shih-Hung Chang, Mau-Tsu Tang, Wen-Feng Hsieh
Journal: Applied Physics Letters
Appl. Phys. Lett. 109, 192104 (2016)
https://doi.org/10.1063/1.4967743
Published: November 2016
View article titled, Probing the exciton-phonon coupling strengths of O-polar and Zn-polar ZnO wafer using hard X-ray excited optical luminescence
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Journal Articles

X-ray nanoprobe project at Taiwan Photon Source

Gung-Chian Yin, Shih-Hung Chang, Bo-Yi Chen, Huang-Yeh Chen, Bi-Hsuan Lin, Shao-Chin Tseng, Chien-Yu Lee, Jian-Xing Wu, Shao-Yun Wu, Mau-Tsu Tang
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1741, 030004 (2016)
https://doi.org/10.1063/1.4952827
Published: July 2016
View article titled, X-ray nanoprobe project at Taiwan Photon Source
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Journal Articles

Multimodal hard x-ray nanoprobe facility by nested Montel mirrors aimed for 40nm resolution at Taiwan Photon Source

Gung-Chian Yin, Shi-Hung Chang, Bo-Yi Chen, Huang-Yeh Chen, Bi-Hsuan Lin, Shao-Chin Tseng, Chian-Yao Lee, Shao-Yun Wu, Mau-Tsu Tang
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1696, 020026 (2016)
https://doi.org/10.1063/1.4937520
Published: January 2016
View article titled, Multimodal hard x-ray nanoprobe facility by nested Montel mirrors aimed for 40nm resolution at Taiwan Photon Source
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Journal Articles

Structural transformation and charge transfer induced ferroelectricity and magnetism in annealed YMnO3

Sheng-Hsu Liu, Jung-Chun-Andrew Huang, Xiaoding Qi, Wei-Jui Lin, Yu-Jhan Siao, Chun-Rong Lin, Jin-Ming Chen, Mau-Tsu Tang, Yu-Hua Lee, Jung-Chuan Lee
Journal: AIP Advances
AIP Advances 1, 032173 (2011)
https://doi.org/10.1063/1.3647519
Published: September 2011
View article titled, Structural transformation and charge transfer induced ferroelectricity and magnetism in annealed YMnO<sub>3</sub>
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Journal Articles

Measuring lattice parameter of iron silicides using x-ray Bragg-surface diffraction

Yi-Wei Tsai, Chia-Hong Chu, Mau-Tsu Tang, Yuriy. P. Stetsko, Lih-Jen Chou, Shih-Lin Chang
Journal: Journal of Applied Physics
J. Appl. Phys. 109, 013514 (2011)
https://doi.org/10.1063/1.3530586
Published: January 2011
View article titled, Measuring lattice parameter of iron silicides using x-ray Bragg-surface diffraction
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Journal Articles

Hard X‐ray Microscopy with sub 30 nm Spatial Resolution

Mau‐Tsu Tang, Yen‐Fang Song, Gung‐Chian Yin, Fu‐Rong Chen, Jian‐Hua Chen, Yi‐Ming Chen, Keng S. Liang, F. Duewer, Wenbing Yun
Journal: AIP Conference Proceedings
AIP Conf. Proc. 879, 1274–1277 (2007)
https://doi.org/10.1063/1.2436296
Published: January 2007
View article titled, Hard X‐ray Microscopy with sub 30 nm Spatial Resolution
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Journal Articles

X‐ray Tomography and Chemical Imaging within Butterfly Wing Scales

Jian‐Hua Chen, Yao‐Chang Lee, Mau‐Tsu Tang, Yen‐Fang Song
Journal: AIP Conference Proceedings
AIP Conf. Proc. 879, 1940–1943 (2007)
https://doi.org/10.1063/1.2436453
Published: January 2007
View article titled, X‐ray Tomography and Chemical Imaging within Butterfly Wing Scales
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Journal Articles

30 nm resolution x-ray imaging at 8 keV using third order diffraction of a zone plate lens objective in a transmission microscope

Gung-Chian Yin, Yen-Fang Song, Mau-Tsu Tang, Fu-Rong Chen, Keng S. Liang, Frederick W. Duewer, Michael Feser, Wenbing Yun, Han-Ping D. Shieh
Journal: Applied Physics Letters
Appl. Phys. Lett. 89, 221122 (2006)
https://doi.org/10.1063/1.2397483
Published: December 2006
View article titled, 30 nm resolution x-ray imaging at 8 keV using third order diffraction of a zone plate lens objective in a transmission microscope
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Journal Articles

Energy-tunable transmission x-ray microscope for differential contrast imaging with near 60 nm resolution tomography

Gung-Chian Yin, Mau-Tsu Tang, Yen-Fang Song, Fu-Rong Chen, Keng S. Liang, Frederick W. Duewer, Wenbing Yun, Chen-Hao Ko, Han-Ping D. Shieh
Journal: Applied Physics Letters
Appl. Phys. Lett. 88, 241115 (2006)
https://doi.org/10.1063/1.2211300
Published: June 2006
View article titled, Energy-tunable transmission x-ray microscope for differential contrast imaging with near 60 nm resolution tomography
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Journal Articles

Direct measurement of spatial distortions of charge density waves in K 0.3 Mo O 3

Chao-hung Du, Yen-Ru Lee, Chung-Yu Lo, Hsiu-Hau Lin, Shih-Lin Chang, Mau-Tsu Tang, Yuri P. Stetsko, Jey-Jau Lee
Journal: Applied Physics Letters
Appl. Phys. Lett. 88, 241916 (2006)
https://doi.org/10.1063/1.2213198
Published: June 2006
View article titled, Direct measurement of spatial distortions of charge density waves in K 0.3 Mo O 3
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Journal Articles

Kinetic smoothening: Growth thickness dependence of the interface width of the Si(001)/SiO2 interface

J. L. Dawson, K. Krisch, K. W. Evans‐Lutterodt, Mau‐Tsu Tang, L. Manchanda, M. L. Green, D. Brasen, G. S. Higashi, T. Boone
Journal: Journal of Applied Physics
J. Appl. Phys. 77, 4746–4749 (1995)
https://doi.org/10.1063/1.359410
Published: May 1995
View article titled, Kinetic smoothening: Growth thickness dependence of the interface width of the Si(001)/SiO<sub>2</sub> interface
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Journal Articles

Growth temperature dependence of the Si(001)/SiO2 interface width

Mau‐Tsu Tang, K. W. Evans‐Lutterodt, M. L. Green, D. Brasen, K. Krisch, L. Manchanda, G. S. Higashi, T. Boone
Journal: Applied Physics Letters
Appl. Phys. Lett. 64, 748–750 (1994)
https://doi.org/10.1063/1.111054
Published: February 1994
View article titled, Growth temperature dependence of the Si(001)/SiO<sub>2</sub> interface width
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Journal Articles

Roughness of the silicon (001)/SiO2 interface

Mau‐Tsu Tang, K. W. Evans‐Lutterodt, G. S. Higashi, T. Boone
Journal: Applied Physics Letters
Appl. Phys. Lett. 62, 3144–3146 (1993)
https://doi.org/10.1063/1.109109
Published: June 1993
View article titled, Roughness of the silicon (001)/SiO<sub>2</sub> interface
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