Skip Nav Destination
Update search
Filter
All
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
All
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
All
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
All
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
All
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
All
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
NARROW
Format
Topics
Journal
Article Type
Issue Section
Date
Availability
1-4 of 4
Martina Baeumler
Close
Journal Articles
Balasubramanian Sundarapandian, Ali Yassine, Lutz Kirste, Martina Baeumler, Patrik Straňák, Evelin Fisslthaler, Mario Prescher, Mohamed Yassine, Akash Nair, Mohit Raghuwanshi, Oliver Ambacher
Journal:
Journal of Applied Physics
J. Appl. Phys. 134, 185107 (2023)
Published: November 2023
Journal Articles
Martina Baeumler, Yuan Lu, Nicolas Kurz, Lutz Kirste, Mario Prescher, Tim Christoph, Joachim Wagner, Agnė Žukauskaitė, Oliver Ambacher
Journal:
Journal of Applied Physics
J. Appl. Phys. 126, 045715 (2019)
Published: July 2019
Journal Articles
Characterization of Al2O3/GaAs interfaces and thin films prepared by atomic layer deposition
Available to PurchaseRam Ekwal Sah, Christoph Tegenkamp, Martina Baeumler, Frank Bernhardt, Rachid Driad, Michael Mikulla, Oliver Ambacher
J. Vac. Sci. Technol. B 31, 04D111 (2013)
Published: July 2013
Journal Articles
Martin Hempel, Jens W. Tomm, Martina Baeumler, Helmer Konstanzer, Jayanta Mukherjee, Thomas Elsaesser
Journal:
AIP Advances
AIP Advances 1, 042148 (2011)
Published: November 2011