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Mark W. Rutland
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Journal Articles

Insight into the assembly of lipid-hyaluronan complexes in osteoarthritic conditions

Kangdi Sun, Tooba Shoaib, Mark W. Rutland, Joesph Beller, Changwoo Do, Rosa M. Espinosa-Marzal
Journal: Biointerphases
Biointerphases 18, 021005 (2023)
https://doi.org/10.1116/6.0002502
Published: April 2023
View article titled, Insight into the assembly of lipid-hyaluronan complexes in osteoarthritic conditions
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Includes: Supplementary data
Journal Articles

Electro-responsivity of ionic liquid boundary layers in a polar solvent revealed by neutron reflectance

Editor’s Pick
Georgia A. Pilkington, Kathryn Harris, Erik Bergendal, Akepati Bhaskar Reddy, Gunnar K. Palsson, Alexei Vorobiev, Oleg. N. Antzutkin, Sergei Glavatskih, Mark W. Rutland
Journal: The Journal of Chemical Physics
J. Chem. Phys. 148, 193806 (2018)
https://doi.org/10.1063/1.5001551
Published: January 2018
View article titled, Electro-responsivity of ionic liquid boundary layers in a polar solvent revealed by neutron reflectance
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Includes: Supplementary data
Journal Articles

Comparison of different methods to calibrate torsional spring constant and photodetector for atomic force microscopy friction measurements in air and liquid

Torbjörn Pettersson, Niklas Nordgren, Mark W. Rutland, Adam Feiler
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 78, 093702 (2007)
https://doi.org/10.1063/1.2779215
Published: September 2007
View article titled, Comparison of different methods to calibrate torsional spring constant and photodetector for atomic force microscopy friction measurements in air and liquid
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Includes: Supplementary data
Journal Articles

Thermal calibration of photodiode sensitivity for atomic force microscopy

Phil Attard, Torbjörn Pettersson, Mark W. Rutland
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 77, 116110 (2006)
https://doi.org/10.1063/1.2387891
Published: November 2006
View article titled, Thermal calibration of photodiode sensitivity for atomic force microscopy
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Journal Articles

Erratum: “A novel technique for the in situ calibration and measurement of friction with the atomic force microscope” [Rev. Sci. Instrum. 76 , 083710 (2005)]

Johanna Stiernstedt, Mark W. Rutland, Phil Attard
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 77, 019901 (2006)
https://doi.org/10.1063/1.2162429
Published: January 2006
View article titled, Erratum: “A novel technique for the <em>in situ</em> calibration and measurement of friction with the atomic force microscope” [Rev. Sci. Instrum. 76 , 083710 (2005)]
Open the PDF for Erratum: “A novel technique for the <em>in situ</em> calibration and measurement of friction with the atomic force microscope” [Rev. Sci. Instrum. 76 , 083710 (2005)] in another window
Journal Articles

A novel technique for the in situ calibration and measurement of friction with the atomic force microscope

Johanna Stiernstedt, Mark W. Rutland, Phil Attard
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 76, 083710 (2005)
https://doi.org/10.1063/1.2006407
Published: August 2005
View article titled, A novel technique for the <em>in situ</em> calibration and measurement of friction with the atomic force microscope
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Journal Articles

Dynamic surface force measurement. I. van der Waals collisions

Phil Attard, Jamie C. Schulz, Mark W. Rutland
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 69, 3852–3866 (1998)
https://doi.org/10.1063/1.1149190
Published: November 1998
View article titled, Dynamic surface force measurement. I. van der Waals collisions
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