Page 1 | Search Results | AIP Publishing

1-20 of 34

Sort by

Sort Order Select

Journal Articles

Simultaneous sum-frequency and vibro-acoustography imaging for nondestructive evaluation and testing applications

F. G. Mitri, G. T. Silva, J. F. Greenleaf, M. Fatemi

J. Appl. Phys. 102, 114911 (2007)

https://doi.org/10.1063/1.2821174

Published: December 2007

View article titled, Simultaneous sum-frequency and vibro-acoustography imaging for nondestructive evaluation and testing applications

Journal Articles

Inverse estimation of viscoelastic material properties for solids immersed in fluids using vibroacoustic techniques

J. C. Brigham, W. Aquino, F. G. Mitri, J. F. Greenleaf, M. Fatemi

J. Appl. Phys. 101, 023509 (2007)

https://doi.org/10.1063/1.2423227

Published: January 2007

View article titled, Inverse estimation of viscoelastic material properties for solids immersed in fluids using vibroacoustic techniques

Journal Articles

X-ray diffraction study of crystal plane distortion in silicon carbide substrates

M. A. Mastro, M. Fatemi, D. K. Gaskill, K.-K. Lew, B. L. Van Mil, C. R. Eddy, Jr., C. E. C. Wood

J. Appl. Phys. 100, 093510 (2006)

https://doi.org/10.1063/1.2362918

Published: November 2006

View article titled, X-ray diffraction study of crystal plane distortion in silicon carbide substrates

Journal Articles

Metal-organic chemical-vapor deposition of high-reflectance III-nitride distributed Bragg reflectors on Si substrates

M. A. Mastro, R. T. Holm, N. D. Bassim, D. K. Gaskill, J. C. Culbertson, M. Fatemi, C. R. Eddy, Jr., R. L. Henry, M. E. Twigg

J. Vac. Sci. Technol. A 24, 1631–1634 (2006)

https://doi.org/10.1116/1.2172937

Published: June 2006

View article titled, Metal-organic chemical-vapor deposition of high-reflectance III-nitride distributed Bragg reflectors on Si substrates

Journal Articles

Surface roughness imaging using the acoustic emission induced by the dynamic radiation force of ultrasound

F. G. Mitri, U. Eberlein, M. Fatemi

Appl. Phys. Lett. 88, 234105 (2006)

https://doi.org/10.1063/1.2211187

Published: June 2006

View article titled, Surface roughness imaging using the acoustic emission induced by the dynamic radiation force of ultrasound

Journal Articles

Improved vibroacoustography imaging for nondestructive inspection of materials

F. G. Mitri, M. Fatemi

J. Appl. Phys. 98, 114901 (2005)

https://doi.org/10.1063/1.2130515

Published: December 2005

View article titled, Improved vibroacoustography imaging for nondestructive inspection of materials

Journal Articles

Erratum: “Structure of stacking faults formed during the forward bias of 4H- SiC p-i-n diodes” [Appl. Phys. Lett. 82 , 2410 (2003)]

M. E. Twigg, R. E. Stahlbush, M. Fatemi, S. D. Arthur, J. B. Fedison, J. E. Tucker, S. Wang

Appl. Phys. Lett. 84, 4816 (2004)

https://doi.org/10.1063/1.1763232

Published: June 2004

View article titled, Erratum: “Structure of stacking faults formed during the forward bias of 4H- SiC p-i-n diodes” [Appl. Phys. Lett. 82 , 2410 (2003)]

Journal Articles

Properties of Bulk AlN grown by thermodecomposition of AlCl 3 ⋅ NH 3

J. A. Freitas, Jr., G. C. B. Braga, E. Silveira, J. G. Tischler, M. Fatemi

Appl. Phys. Lett. 83, 2584–2586 (2003)

https://doi.org/10.1063/1.1614418

Published: September 2003

View article titled, Properties of Bulk AlN grown by thermodecomposition of AlCl 3 ⋅ NH 3

Journal Articles

Structure of stacking faults formed during the forward bias of 4H- SiC p-i-n diodes

M. E. Twigg, R. E. Stahlbush, M. Fatemi, S. D. Arthur, J. B. Fedison, J. B. Tucker, S. Wang

Appl. Phys. Lett. 82, 2410–2412 (2003)

https://doi.org/10.1063/1.1566794

Published: April 2003

View article titled, Structure of stacking faults formed during the forward bias of 4H- SiC p-i-n diodes

Journal Articles

Noncontact ultrasound stimulated optical vibrometry study of coupled vibration of arterial tubes in fluids

X. M. Zhang, M. Fatemi, R. R. Kinnick, J. F. Greenleaf

J. Acoust. Soc. Am. 113, 1249–1257 (2003)

https://doi.org/10.1121/1.1548154

Published: February 2003

View article titled, Noncontact ultrasound stimulated optical vibrometry study of coupled vibration of arterial tubes in fluids

Journal Articles

Influence of AlN nucleation layer temperature on GaN electronic properties grown on SiC

D. D. Koleske, R. L. Henry, M. E. Twigg, J. C. Culbertson, S. C. Binari, A. E. Wickenden, M. Fatemi

Appl. Phys. Lett. 80, 4372–4374 (2002)

https://doi.org/10.1063/1.1484553

Published: June 2002

View article titled, Influence of AlN nucleation layer temperature on GaN electronic properties grown on SiC

Journal Articles

An x-ray rocking curve technique for the absolute characterization of epitaxial layers and single-crystal solids

M. Fatemi

Appl. Phys. Lett. 80, 935–937 (2002)

https://doi.org/10.1063/1.1447012

Published: February 2002

View article titled, An x-ray rocking curve technique for the absolute characterization of epitaxial layers and single-crystal solids

Journal Articles

Comment on “Analysis of high-resolution x-ray diffraction in semiconductor strained layers” [J. Appl. Phys. 86 , 782 (1999)]

M. Fatemi

J. Appl. Phys. 87, 8212–8214 (2000)

https://doi.org/10.1063/1.373524

Published: June 2000

View article titled, Comment on “Analysis of high-resolution x-ray diffraction in semiconductor strained layers” [J. Appl. Phys. 86 , 782 (1999)]

Journal Articles

Photoluminescence of InAs 1−x Sb x / AlSb single quantum wells: Transition from type-II to type-I band alignment

M. J. Yang, B. R. Bennett, M. Fatemi, P. J. Lin-Chung, W. J. Moore, C. H. Yang

J. Appl. Phys. 87, 8192–8194 (2000)

https://doi.org/10.1063/1.373517

Published: June 2000

View article titled, Photoluminescence of InAs 1−x Sb x / AlSb single quantum wells: Transition from type-II to type-I band alignment

Journal Articles

Properties of Si-doped GaN films grown using multiple AlN interlayers

D. D. Koleske, M. E. Twigg, A. E. Wickenden, R. L. Henry, R. J. Gorman, J. A. Freitas, Jr., M. Fatemi

Appl. Phys. Lett. 75, 3141–3143 (1999)

https://doi.org/10.1063/1.125257

Published: November 1999

View article titled, Properties of Si-doped GaN films grown using multiple AlN interlayers

Journal Articles

Enhancement of electrical and structural properties of GaN layers grown on vicinal-cut, a-plane sapphire substrates

M. Fatemi, A. E. Wickenden, D. D. Koleske, M. E. Twigg, J. A. Freitas, Jr., R. L. Henry, R. J. Gorman

Appl. Phys. Lett. 73, 608–610 (1998)

https://doi.org/10.1063/1.121871

Published: August 1998

View article titled, Enhancement of electrical and structural properties of GaN layers grown on vicinal-cut, a-plane sapphire substrates

Journal Articles

Fabrication of GaAs and InAs wires in nanochannel glass

A. D. Berry, R. J. Tonucci, M. Fatemi

Appl. Phys. Lett. 69, 2846–2848 (1996)

https://doi.org/10.1063/1.117338

Published: November 1996

View article titled, Fabrication of GaAs and InAs wires in nanochannel glass

Journal Articles

B implants in Si_1−xGe_x/Si

Alok K. Berry, P. E. Thompson, Mulpuri V. Rao, M. Fatemi, H. B. Dietrich

Appl. Phys. Lett. 68, 391–393 (1996)

https://doi.org/10.1063/1.116695

Published: January 1996

View article titled, B implants in Si1−xGex/Si

Journal Articles

Thermal stress‐induced, high‐strain fragmentation of buried SiGe layers grown on Si

M. Fatemi, P. E. Thompson, M. E. Twigg

Appl. Phys. Lett. 67, 2678–2680 (1995)

https://doi.org/10.1063/1.114290

Published: October 1995

View article titled, Thermal stress‐induced, high‐strain fragmentation of buried SiGe layers grown on Si

Journal Articles

Detection of simultaneous lattice expansion and contraction in low‐energy, H‐implanted InP

M. Fatemi, B. Molnar, H. B. Dietrich, W. T. Anderson

Appl. Phys. Lett. 66, 825–826 (1995)

https://doi.org/10.1063/1.113434

Published: February 1995

View article titled, Detection of simultaneous lattice expansion and contraction in low‐energy, H‐implanted InP

NARROW

Topics

Simultaneous sum-frequency and vibro-acoustography imaging for nondestructive evaluation and testing applications

Inverse estimation of viscoelastic material properties for solids immersed in fluids using vibroacoustic techniques

X-ray diffraction study of crystal plane distortion in silicon carbide substrates

Metal-organic chemical-vapor deposition of high-reflectance III-nitride distributed Bragg reflectors on Si substrates

Surface roughness imaging using the acoustic emission induced by the dynamic radiation force of ultrasound

Improved vibroacoustography imaging for nondestructive inspection of materials

Erratum: “Structure of stacking faults formed during the forward bias of 4H- SiC p-i-n diodes” [Appl. Phys. Lett. 82 , 2410 (2003)]

Properties of Bulk AlN grown by thermodecomposition of AlCl 3 ⋅ NH 3

Structure of stacking faults formed during the forward bias of 4H- SiC p-i-n diodes

Noncontact ultrasound stimulated optical vibrometry study of coupled vibration of arterial tubes in fluids

Influence of AlN nucleation layer temperature on GaN electronic properties grown on SiC

An x-ray rocking curve technique for the absolute characterization of epitaxial layers and single-crystal solids

Comment on “Analysis of high-resolution x-ray diffraction in semiconductor strained layers” [J. Appl. Phys. 86 , 782 (1999)]

Photoluminescence of InAs 1−x Sb x / AlSb single quantum wells: Transition from type-II to type-I band alignment

Properties of Si-doped GaN films grown using multiple AlN interlayers

Enhancement of electrical and structural properties of GaN layers grown on vicinal-cut, a-plane sapphire substrates

Fabrication of GaAs and InAs wires in nanochannel glass

B implants in Si_1−xGe_x/Si

Thermal stress‐induced, high‐strain fragmentation of buried SiGe layers grown on Si

Detection of simultaneous lattice expansion and contraction in low‐energy, H‐implanted InP

Resources

Explore

pubs.aip.org

Connect with AIP Publishing

Resources

Explore

pubs.aip.org

Connect with AIP Publishing

This Feature Is Available To Subscribers Only