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Journal Articles

Pulse widths dependence of programming and erasing behaviors for diamond like carbon based resistive switching memories

Jianlong Xu, Dan Xie, Chenhui Zhang, Xiaowen Zhang, Pinggang Peng, Di Fu, He Qian, Tian-ling Ren, Litian Liu
Journal: Applied Physics Letters
Appl. Phys. Lett. 105, 172101 (2014)
https://doi.org/10.1063/1.4898345
Published: October 2014
View article titled, Pulse widths dependence of programming and erasing behaviors for diamond like carbon based resistive switching memories
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Journal Articles

Graphene based Schottky junction solar cells on patterned silicon-pillar-array substrate

Tingting Feng, Dan Xie, Yuxuan Lin, Yongyuan Zang, Tianling Ren, Rui Song, Haiming Zhao, He Tian, Xiao Li, Hongwei Zhu, Litian Liu
Journal: Applied Physics Letters
Appl. Phys. Lett. 99, 233505 (2011)
https://doi.org/10.1063/1.3665404
Published: December 2011
View article titled, Graphene based Schottky junction solar cells on patterned silicon-pillar-array substrate
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Journal Articles

Thick benzocyclobutene etching using high density SF 6 / O 2 plasmas

Qianwen Chen, Dingyou Zhang, Zhimin Tan, Zheyao Wang, Litian Liu, Jian-Qiang Lu
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 29, 011019 (2011)
https://doi.org/10.1116/1.3532828
Published: January 2011
View article titled, Thick benzocyclobutene etching using high density SF 6 / O 2 plasmas
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Journal Articles

Characteristics of Pt / BiFeO 3 / TiO 2 / Si capacitors with TiO 2 layer formed by liquid-delivery metal organic chemical vapor deposition

Dan Xie, Xueguang Han, Rui Li, Tianling Ren, Litian Liu, Yonggang Zhao
Journal: Applied Physics Letters
Appl. Phys. Lett. 97, 172901 (2010)
https://doi.org/10.1063/1.3490712
Published: October 2010
View article titled, Characteristics of Pt / BiFeO 3 / TiO 2 / Si capacitors with TiO 2 layer formed by liquid-delivery metal organic chemical vapor deposition
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Journal Articles

Characterization of Pt / Bi 3.15 Nd 0.85 Ti 3 O 12 / HfO 2 / Si structure using a hafnium oxide as buffer layer for ferroelectric-gate field effect transistors

Dan Xie, Yafeng Luo, Xueguang Han, Tianling Ren, Litian Liu
Journal: Journal of Applied Physics
J. Appl. Phys. 106, 114117 (2009)
https://doi.org/10.1063/1.3267153
Published: December 2009
View article titled, Characterization of Pt / Bi 3.15 Nd 0.85 Ti 3 O 12 / HfO 2 / Si structure using a hafnium oxide as buffer layer for ferroelectric-gate field effect transistors
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Journal Articles

Structural, ferroelectric, dielectric, and magnetic properties of BiFeO 3 / Bi 3.15 Nd 0.85 Ti 3 O 12 multilayer films derived by chemical solution deposition

Dan Xie, Yongyuan Zang, Yafeng Luo, Xueguang Han, Tianling Ren, Litian Liu
Journal: Journal of Applied Physics
J. Appl. Phys. 105, 084109 (2009)
https://doi.org/10.1063/1.3110074
Published: April 2009
View article titled, Structural, ferroelectric, dielectric, and magnetic properties of BiFeO 3 / Bi 3.15 Nd 0.85 Ti 3 O 12 multilayer films derived by chemical solution deposition
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Journal Articles

Comparison of PbZr 1 − x Ti x O 3 thin films deposited on different substrates by liquid delivery metal organic chemical vapor deposition

Dan Xie, Yong Ruan, Rui Li, Mingming Zhang, Tianling Ren, Litian Liu
Journal: Journal of Applied Physics
J. Appl. Phys. 105, 061611 (2009)
https://doi.org/10.1063/1.3056163
Published: March 2009
View article titled, Comparison of PbZr 1 − x Ti x O 3 thin films deposited on different substrates by liquid delivery metal organic chemical vapor deposition
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Journal Articles

Spatially resolved thickness analysis of microscale structures using micro-Raman spectroscopy

Xiaoming Wu, Tianling Ren, Litian Liu, Jianyuan Yu
Journal: Applied Physics Letters
Appl. Phys. Lett. 89, 211903 (2006)
https://doi.org/10.1063/1.2396908
Published: November 2006
View article titled, Spatially resolved thickness analysis of microscale structures using micro-Raman spectroscopy
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Journal Articles

Measurement of thermal conductivity of buried oxides of silicon-on-insulator wafers fabricated by separation by implantation of oxygen technology

Ping He, Litian Liu, Lilin Tian, Zhijian Li
Journal: Applied Physics Letters
Appl. Phys. Lett. 81, 1896–1898 (2002)
https://doi.org/10.1063/1.1506784
Published: September 2002
View article titled, Measurement of thermal conductivity of buried oxides of silicon-on-insulator wafers fabricated by separation by implantation of oxygen technology
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