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L. L. Tongson
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Journal Articles

Alternate method of measuring ion‐beam‐irradiated areas

A. S. Bhalla, L. L. Tongson
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 21, 1039–1040 (1982)
https://doi.org/10.1116/1.571860
Published: November 1982
View article titled, Alternate method of measuring ion‐beam‐irradiated areas
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Journal Articles

Enhanced interdiffusion of Cu into rf‐sputtered chromium oxide films

S. V. Krishnaswamy, L. L. Tongson, N. Said, R. Messier
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 18, 401–404 (1981)
https://doi.org/10.1116/1.570796
Published: March 1981
View article titled, Enhanced interdiffusion of Cu into rf‐sputtered chromium oxide films
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Journal Articles

Characterization of commercial black chrome coatings

D. M. Fell, L. L. Tongson, S. V. Krishnaswamy, R. Messier, I. S. T. Tsong
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 17, 358–361 (1980)
https://doi.org/10.1116/1.570387
Published: January 1980
View article titled, Characterization of commercial black chrome coatings
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Journal Articles

Soft x‐ray emission and Auger electron spectroscopic study of FeS, Fe0.9S, Fe0.875S, and Fe0.5S

L. A. Marusak, L. L. Tongson
Journal: Journal of Applied Physics
J. Appl. Phys. 50, 4350–4355 (1979)
https://doi.org/10.1063/1.326420
Published: June 1979
View article titled, Soft x‐ray emission and Auger electron spectroscopic study of FeS, Fe<sub>0.9</sub>S, Fe<sub>0.875</sub>S, and Fe<sub>0.5</sub>S
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Journal Articles

Comparative study of chemical and polarization characteristics of Pd/Si and Pd/SiOx/Si Schottky‐barrier‐type devices

L. L. Tongson, B. E. Knox, T. E. Sullivan, S. J. Fonash
Journal: Journal of Applied Physics
J. Appl. Phys. 50, 1535–1537 (1979)
https://doi.org/10.1063/1.326106
Published: March 1979
View article titled, Comparative study of chemical and polarization characteristics of Pd/Si and Pd/SiO<sub><em>x</em></sub>/Si Schottky‐barrier‐type devices
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Journal Articles

Surface analysis of WC–Co composite materials (2) Quantitative Auger electron spectrometry

L. L. Tongson, J. V. Biggers, G. O. Dayton, J. M. Bind, B. E. Knox
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 15, 1133–1138 (1978)
https://doi.org/10.1116/1.569524
Published: May 1978
View article titled, Surface analysis of WC–Co composite materials (2) Quantitative Auger electron spectrometry
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Journal Articles

Chemical characterization of WC–Co composite materials by AES and ISS (1) Processing

L. L. Tongson, J. V. Biggers, J. M. Bind, G. O. Dayton, B. E. Knox
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 15, 1129–1132 (1978)
https://doi.org/10.1116/1.569523
Published: May 1978
View article titled, Chemical characterization of WC–Co composite materials by AES and ISS (1) Processing
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Journal Articles

Abstract: Ion scattering and Auger electron spectrometry of WC–Co composite materials

B. E. Knox, L. L. Tongson, J. V. Biggers
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 14, 530 (1977)
https://doi.org/10.1116/1.569297
Published: January 1977
View article titled, Abstract: Ion scattering and Auger electron spectrometry of WC–Co composite materials
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