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L. G. Gignac
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Journal Articles
Microstructure, impurity and metal cap effects on Cu electromigration
Available to PurchaseC.-K. Hu, L. G. Gignac, J. Ohm, C. M. Breslin, E. Huang, G. Bonilla, E. Liniger, R. Rosenberg, S. Choi, A. H. Simon
Journal:
AIP Conference Proceedings
AIP Conf. Proc. 1601, 67–78 (2014)
Published: June 2014