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Kazumi Matsushige
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Journal Articles

Accurate formula for dissipative interaction in frequency modulation atomic force microscopy

Kazuhiro Suzuki, Kei Kobayashi, Aleksander Labuda, Kazumi Matsushige, Hirofumi Yamada
Journal: Applied Physics Letters
Appl. Phys. Lett. 105, 233105 (2014)
https://doi.org/10.1063/1.4903484
Published: December 2014
View articletitled, Accurate formula for dissipative interaction in frequency modulation atomic force microscopy
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Includes: Supplementary data
Journal Articles

Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media

Ken-ichi Umeda, Kei Kobayashi, Noriaki Oyabu, Yoshiki Hirata, Kazumi Matsushige, Hirofumi Yamada
Journal: Journal of Applied Physics
J. Appl. Phys. 116, 134307 (2014)
https://doi.org/10.1063/1.4896881
Published: October 2014
View articletitled, Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media
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Journal Articles

Molecular-scale investigations of structures and surface charge distribution of surfactant aggregates by three-dimensional force mapping

Kazuhiro Suzuki, Kei Kobayashi, Noriaki Oyabu, Kazumi Matsushige, Hirofumi Yamada
Journal: The Journal of Chemical Physics
J. Chem. Phys. 140, 054704 (2014)
https://doi.org/10.1063/1.4863346
Published: February 2014
View articletitled, Molecular-scale investigations of structures and surface charge distribution of surfactant aggregates by three-dimensional force mapping
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Includes: Supplementary data
Journal Articles

Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams

Eika Tsunemi, Kei Kobayashi, Noriaki Oyabu, Masaharu Hirose, Yoshiko Takenaka, Kazumi Matsushige, Hirofumi Yamada
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 84, 083701 (2013)
https://doi.org/10.1063/1.4816535
Published: August 2013
View articletitled, Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams
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Journal Articles

Erratum: “Investigation of electrical transport in anodized single TiO2 nanotubes” [Appl. Phys. Lett. 102 , 043105 (2013)]

Masashi Hattori, Kei Noda, Tatsuya Nishi, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige
Journal: Applied Physics Letters
Appl. Phys. Lett. 103, 039901 (2013)
https://doi.org/10.1063/1.4815940
Published: July 2013
View articletitled, Erratum: “Investigation of electrical transport in anodized single TiO2 nanotubes” [Appl. Phys. Lett. 102 , 043105 (2013)]
Open the PDF for Erratum: “Investigation of electrical transport in anodized single TiO2 nanotubes” [Appl. Phys. Lett. 102 , 043105 (2013)] in another window
Journal Articles

Analysis of capacitive force acting on a cantilever tip at solid/liquid interfaces

Ken-ichi Umeda, Kei Kobayashi, Noriaki Oyabu, Yoshiki Hirata, Kazumi Matsushige, Hirofumi Yamada
Journal: Journal of Applied Physics
J. Appl. Phys. 113, 154311 (2013)
https://doi.org/10.1063/1.4801795
Published: April 2013
View articletitled, Analysis of capacitive force acting on a cantilever tip at solid/liquid interfaces
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Journal Articles

Investigation of electrical transport in anodized single TiO2 nanotubes

Masashi Hattori, Kei Noda, Tatsuya Nishi, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige
Journal: Applied Physics Letters
Appl. Phys. Lett. 102, 043105 (2013)
https://doi.org/10.1063/1.4789763
Published: January 2013
View articletitled, Investigation of electrical transport in anodized single TiO2 nanotubes
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Journal Articles

Local potential profiling of operating carbon nanotube transistor using frequency-modulation high-frequency electrostatic force microscopy

Masanao Ito, Kei Kobayashi, Yuji Miyato, Kazumi Matsushige, Hirofumi Yamada
Journal: Applied Physics Letters
Appl. Phys. Lett. 102, 013115 (2013)
https://doi.org/10.1063/1.4774265
Published: January 2013
View articletitled, Local potential profiling of operating carbon nanotube transistor using frequency-modulation high-frequency electrostatic force microscopy
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Journal Articles

Direct actuation of cantilever in aqueous solutions by electrostatic force using high-frequency electric fields

Ken-ichi Umeda, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada
Journal: Applied Physics Letters
Appl. Phys. Lett. 101, 123112 (2012)
https://doi.org/10.1063/1.4754289
Published: September 2012
View articletitled, Direct actuation of cantilever in aqueous solutions by electrostatic force using high-frequency electric fields
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Journal Articles

Fabrication of glycerol liquid droplet array by nano-inkjet printing method

Kiyohiro Kaisei, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada
Journal: Journal of Applied Physics
J. Appl. Phys. 111, 074319 (2012)
https://doi.org/10.1063/1.3699388
Published: April 2012
View articletitled, Fabrication of glycerol liquid droplet array by nano-inkjet printing method
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Journal Articles

High-purity hydrogen generation by ultraviolet illumination with the membrane composed of titanium dioxide nanotube array and Pd layer

Masashi Hattori, Kei Noda, Kazumi Matsushige
Journal: Applied Physics Letters
Appl. Phys. Lett. 99, 123107 (2011)
https://doi.org/10.1063/1.3643052
Published: September 2011
View articletitled, High-purity hydrogen generation by ultraviolet illumination with the membrane composed of titanium dioxide nanotube array and Pd layer
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Journal Articles

Molecular doping effect in bottom-gate, bottom-contact pentacene thin-film transistors

Yusuke Wakatsuki, Kei Noda, Yasuo Wada, Toru Toyabe, Kazumi Matsushige
Journal: Journal of Applied Physics
J. Appl. Phys. 110, 054505 (2011)
https://doi.org/10.1063/1.3627240
Published: September 2011
View articletitled, Molecular doping effect in bottom-gate, bottom-contact pentacene thin-film transistors
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Journal Articles

Surface potential measurement of organic thin film on metal electrodes by dynamic force microscopy using a piezoelectric cantilever

Nobuo Satoh, Shigetaka Katori, Kei Kobayashi, Shunji Watanabe, Toru Fujii, Kazumi Matsushige, Hirofumi Yamada
Journal: Journal of Applied Physics
J. Appl. Phys. 109, 114306 (2011)
https://doi.org/10.1063/1.3585865
Published: June 2011
View articletitled, Surface potential measurement of organic thin film on metal electrodes by dynamic force microscopy using a piezoelectric cantilever
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Journal Articles

Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams

Eika Tsunemi, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 82, 033708 (2011)
https://doi.org/10.1063/1.3534830
Published: March 2011
View articletitled, Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams
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Journal Articles

Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy

Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 82, 033702 (2011)
https://doi.org/10.1063/1.3557416
Published: March 2011
View articletitled, Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy
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Journal Articles

Resistive switching effects in single metallic tunneling junction with nanometer-scale gap

Takahiro Mizukami, Yuji Miyato, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada
Journal: Applied Physics Letters
Appl. Phys. Lett. 98, 083120 (2011)
https://doi.org/10.1063/1.3559612
Published: February 2011
View articletitled, Resistive switching effects in single metallic tunneling junction with nanometer-scale gap
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Journal Articles

Erratum: “A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy” [Rev. Sci. Instrum. 81, 093701 (2010)]

Yoshihiro Hosokawa, Kei Kobayashi, Noriaki Oyabu, Kazumi Matsushige, Hirofumi Yamada
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 82, 019901 (2011)
https://doi.org/10.1063/1.3527911
Published: January 2011
View articletitled, Erratum: “A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy” [Rev. Sci. Instrum. 81, 093701 (2010)]
Open the PDF for Erratum: “A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy” [Rev. Sci. Instrum. 81, 093701 (2010)] in another window
Journal Articles

Erratum: “Frequency noise in frequency modulation atomic force microscopy” [Rev. Sci. Instrum. 80, 043708 (2009)]

Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 81, 129901 (2010)
https://doi.org/10.1063/1.3509402
Published: December 2010
View articletitled, Erratum: “Frequency noise in frequency modulation atomic force microscopy” [Rev. Sci. Instrum. 80, 043708 (2009)]
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Journal Articles

A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy

Yoshihiro Hosokawa, Kei Kobayashi, Noriaki Oyabu, Kazumi Matsushige, Hirofumi Yamada
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 81, 093701 (2010)
https://doi.org/10.1063/1.3477995
Published: September 2010
View articletitled, A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy
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Journal Articles

Near-field light detection by conservative and dissipative force modulation methods using a piezoelectric cantilever

Nobuo Satoh, Takeshi Fukuma, Kei Kobayashi, Shunji Watanabe, Toru Fujii, Kazumi Matsushige, Hirofumi Yamada
Journal: Applied Physics Letters
Appl. Phys. Lett. 96, 233104 (2010)
https://doi.org/10.1063/1.3449131
Published: June 2010
View articletitled, Near-field light detection by conservative and dissipative force modulation methods using a piezoelectric cantilever
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