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Kawal Sawhney
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Journal Articles

Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source

Thomas E. J. Moxham, David Laundy, Vishal Dhamgaye, Oliver J. L. Fox, Kawal Sawhney, Alexander M. Korsunsky
Journal: Applied Physics Letters
Appl. Phys. Lett. 118, 104104 (2021)
https://doi.org/10.1063/5.0041341
Published: March 2021
View article titled, Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source
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Includes: Supplementary data
Journal Articles

High-speed adaptive optics using bimorph deformable x-ray mirrors

Simon G. Alcock, Ioana-Theodora Nistea, Vivek G. Badami, Riccardo Signorato, Kawal Sawhney
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 90, 021712 (2019)
https://doi.org/10.1063/1.5060737
Published: February 2019
View article titled, High-speed adaptive optics using bimorph deformable x-ray mirrors
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Includes: Supplementary data
Journal Articles

Compensation of x-ray mirror distortion by cooling temperature control

Matthew Hand, Hongchang Wang, Maria Harkiolaki, Federica Venturini, Rosa Arrigo, Pilar Ferrer-Escorihuela, Simon Alcock, Ioana Nistea, Andy Marshall, Stewart Scott, Liz Duke, Georg Held, Kawal Sawhney
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2054, 060044 (2019)
https://doi.org/10.1063/1.5084675
Published: January 2019
View article titled, Compensation of x-ray mirror distortion by cooling temperature control
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Journal Articles

Development of pseudo-perfect x-ray optics using refractive compensators

Kawal Sawhney, David Laundy, Tom Moxham, Oliver Fox, Vishal Dhamgaye
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2054, 060003 (2019)
https://doi.org/10.1063/1.5084634
Published: January 2019
View article titled, Development of pseudo-perfect x-ray optics using refractive compensators
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Journal Articles

Optical elements for dynamically broadening the focus of micro-focus optics at synchrotron x-ray sources

David Laundy, Kawal Sawhney, Vishal Dhamgaye, Graham Duller, Gwyndaf Evans, Jose Trincao, Anna Warren
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2054, 060006 (2019)
https://doi.org/10.1063/1.5084637
Published: January 2019
View article titled, Optical elements for dynamically broadening the focus of micro-focus optics at synchrotron x-ray sources
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Journal Articles

Single-shot X-ray dark-field imaging with omnidirectional sensitivity using random-pattern wavefront modulator

Tunhe Zhou, Hongchang Wang, Kawal Sawhney
Journal: Applied Physics Letters
Appl. Phys. Lett. 113, 091102 (2018)
https://doi.org/10.1063/1.5047400
Published: August 2018
View article titled, Single-shot X-ray dark-field imaging with omnidirectional sensitivity using random-pattern wavefront modulator
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Journal Articles

Compensation of X-ray mirror shape-errors using refractive optics

Kawal Sawhney, David Laundy, Vishal Dhamgaye, Ian Pape
Journal: Applied Physics Letters
Appl. Phys. Lett. 109, 051904 (2016)
https://doi.org/10.1063/1.4960593
Published: August 2016
View article titled, Compensation of X-ray mirror shape-errors using refractive optics
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Journal Articles

Energy dispersive detector for white beam synchrotron x-ray fluorescence imaging

Matthew D. Wilson, Thomas Connolley, Igor P. Dolbnya, Patrick S. Grant, Enzo Liotti, Andrew Lui, Andrew Malandain, Kawal Sawhney, Paul Seller, Matthew C. Veale
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1741, 050008 (2016)
https://doi.org/10.1063/1.4952928
Published: July 2016
View article titled, Energy dispersive detector for white beam synchrotron x-ray fluorescence imaging
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Journal Articles

Nano-metrology: The art of measuring X-ray mirrors with slope errors <100 nrad

Simon G. Alcock, Ioana Nistea, Kawal Sawhney
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 87, 051902 (2016)
https://doi.org/10.1063/1.4949272
Published: May 2016
View article titled, Nano-metrology: The art of measuring X-ray mirrors with slope errors &lt;100 nrad
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Journal Articles

Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy

Yogesh Kashyap, Hongchang Wang, Kawal Sawhney
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 87, 052001 (2016)
https://doi.org/10.1063/1.4949004
Published: May 2016
View article titled, Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy
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Journal Articles

Quantitative X-ray dark-field and phase tomography using single directional speckle scanning technique

Hongchang Wang, Yogesh Kashyap, Kawal Sawhney
Journal: Applied Physics Letters
Appl. Phys. Lett. 108, 124102 (2016)
https://doi.org/10.1063/1.4944462
Published: March 2016
View article titled, Quantitative X-ray dark-field and phase tomography using single directional speckle scanning technique
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Journal Articles

A novel instrument for generating angular increments of 1 nanoradian

Simon G. Alcock, Alex Bugnar, Ioana Nistea, Kawal Sawhney, Stewart Scott, Michael Hillman, Jamie Grindrod, Iain Johnson
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 86, 125108 (2015)
https://doi.org/10.1063/1.4937352
Published: December 2015
View article titled, A novel instrument for generating angular increments of 1 nanoradian
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Journal Articles

X-ray phase microscopy using the speckle tracking technique

Sebastien Berujon, Hongchang Wang, Ian Pape, Kawal Sawhney
Journal: Applied Physics Letters
Appl. Phys. Lett. 102, 154105 (2013)
https://doi.org/10.1063/1.4802729
Published: April 2013
View article titled, X-ray phase microscopy using the speckle tracking technique
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Journal Articles

Characterization of a one dimensional focusing compound refractive lens using the rotating shearing interferometer technique

Hongchang Wang, Sebastien Berujon, Kawal Sawhney
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1466, 223–228 (2012)
https://doi.org/10.1063/1.4742296
Published: July 2012
View article titled, Characterization of a one dimensional focusing compound refractive lens using the rotating shearing interferometer technique
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Journal Articles

Shearing interferometer spatial resolution for at-wavelength hard X-ray metrology

Sébastien Bérujon, Hongchang Wang, Eric Ziegler, Kawal Sawhney
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1466, 217–222 (2012)
https://doi.org/10.1063/1.4742295
Published: July 2012
View article titled, Shearing interferometer spatial resolution for at-wavelength hard X-ray metrology
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