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J. Szlachetko
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Journal Articles

Erratum: “Nonlinear XUV-optical transient grating spectroscopy at the Si L2,3-edge” [Appl. Phys. Lett. 114 , 181101 (2019)]

R. Bohinc, G. Pamfilidis, J. Rehault, P. Radi, C. Milne, J. Szlachetko, F. Bencivenga, F. Capotondi, R. Cucini, L. Foglia, C. Masciovecchio, R. Mincigrucci, E. Pedersoli, A. Simoncig, N. Mahne, A. Cannizzo, H. M. Frey, Z. Ollmann, T. Feurer, A. A. Maznev, K. Nelson, G. Knopp
Journal: Applied Physics Letters
Appl. Phys. Lett. 119, 029901 (2021)
https://doi.org/10.1063/5.0061513
Published: July 2021
View article titled, Erratum: “Nonlinear XUV-optical transient grating spectroscopy at the Si L<sub>2,3</sub>-edge” [Appl. Phys. Lett. 114 , 181101 (2019)]
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Journal Articles

A DuMond-type crystal spectrometer for synchrotron-based X-ray emission studies in the energy range of 15–26 keV

P. Jagodziński, J. Szlachetko, J.-Cl. Dousse, J. Hoszowska, M. Szlachetko, U. Vogelsang, D. Banaś, T. Pakendorf, A. Meents, J. A. van Bokhoven, A. Kubala-Kukuś, M. Pajek, M. Nachtegaal
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 90, 063106 (2019)
https://doi.org/10.1063/1.5087948
Published: June 2019
View article titled, A DuMond-type crystal spectrometer for synchrotron-based X-ray emission studies in the energy range of 15–26 keV
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Journal Articles

Nonlinear XUV-optical transient grating spectroscopy at the Si L2,3–edge

Editor’s Pick
R. Bohinc, G. Pamfilidis, J. Rehault, P. Radi, C. Milne, J. Szlachetko, F. Bencivenga, F. Capotondi, R. Cucini, L. Foglia, C. Masciovecchio, R. Mincigrucci, E. Pedersoli, A. Simoncig, N. Mahne, A. Cannizzo, H. M. Frey, Z. Ollmann, T. Feurer, A. A. Maznev, K. Nelson, G. Knopp
Journal: Applied Physics Letters
Appl. Phys. Lett. 114, 181101 (2019)
https://doi.org/10.1063/1.5085413
Published: May 2019
View article titled, Nonlinear XUV-optical transient grating spectroscopy at the Si L<sub>2,3</sub>–edge
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Includes: Supplementary data
Journal Articles

Inception of electronic damage of matter by photon-driven post-ionization mechanisms

W. Błachucki, Y. Kayser, J. Czapla-Masztafiak, M. Guo, P. Juranić, M. Kavčič, E. Källman, G. Knopp, M. Lundberg, C. Milne, J. Rehanek, J. Sá, J. Szlachetko
Journal: Structural Dynamics
Struct. Dyn. 6, 024901 (2019)
https://doi.org/10.1063/1.5090332
Published: April 2019
View article titled, Inception of electronic damage of matter by photon-driven post-ionization mechanisms
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Includes: Supplementary data
Journal Articles

Optical design of the ARAMIS-beamlines at SwissFEL

R. Follath, U. Flechsig, C. Milne, J. Szlachetko, G. Ingold, B. Patterson, L. Patthey, R. Abela
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1741, 020009 (2016)
https://doi.org/10.1063/1.4952788
Published: July 2016
View article titled, Optical design of the ARAMIS-beamlines at SwissFEL
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Journal Articles

Communication: The electronic structure of matter probed with a single femtosecond hard x-ray pulse

J. Szlachetko, C. J. Milne, J. Hoszowska, J.-Cl. Dousse, W. Błachucki, J. Sà, Y. Kayser, M. Messerschmidt, R. Abela, S. Boutet, C. David, G. Williams, M. Pajek, B. D. Patterson, G. Smolentsev, J. A. van Bokhoven, M. Nachtegaal
Journal: Structural Dynamics
Struct. Dyn. 1, 021101 (2014)
https://doi.org/10.1063/1.4868260
Published: March 2014
View article titled, Communication: The electronic structure of matter probed with a single femtosecond hard x-ray pulse
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Journal Articles

Scanning-free grazing emission x-ray fluorescence by means of an angular dispersive arrangement with a two-dimensional position-sensitive area detector

Y. Kayser, J. Szlachetko, J. Sà
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 84, 123102 (2013)
https://doi.org/10.1063/1.4838575
Published: December 2013
View article titled, Scanning-free grazing emission x-ray fluorescence by means of an angular dispersive arrangement with a two-dimensional position-sensitive area detector
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Journal Articles

High-resolution Laue-type DuMond curved crystal spectrometer

M. Szlachetko, M. Berset, J.-Cl. Dousse, J. Hoszowska, J. Szlachetko
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 84, 093104 (2013)
https://doi.org/10.1063/1.4821621
Published: September 2013
View article titled, High-resolution Laue-type DuMond curved crystal spectrometer
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Journal Articles

A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

J. Szlachetko, M. Nachtegaal, E. de Boni, M. Willimann, O. Safonova, J. Sa, G. Smolentsev, M. Szlachetko, J. A. van Bokhoven, J.-Cl. Dousse, J. Hoszowska, Y. Kayser, P. Jagodzinski, A. Bergamaschi, B. Schmitt, C. David, A. Lücke
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 83, 103105 (2012)
https://doi.org/10.1063/1.4756691
Published: October 2012
View article titled, A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies
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Journal Articles

Application of the high-resolution grazing-emission x-ray fluorescence method for impurities control in semiconductor nanotechnology

J. Szlachetko, D. Banaś, A. Kubala-Kukuś, M. Pajek, W. Cao, J.-Cl. Dousse, J. Hoszowska, Y. Kayser, M. Szlachetko, M. Kavčič, M. Salome, J. Susini
Journal: Journal of Applied Physics
J. Appl. Phys. 105, 086101 (2009)
https://doi.org/10.1063/1.3086658
Published: April 2009
View article titled, Application of the high-resolution grazing-emission x-ray fluorescence method for impurities control in semiconductor nanotechnology
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Journal Articles

Relative detection efficiency of back- and front-illuminated charge-coupled device cameras for x-rays between 1 keV and 18 keV

J. Szlachetko, J.-Cl. Dousse, J. Hoszowska, M. Berset, W. Cao, M. Szlachetko, M. Kavčič
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 78, 093102 (2007)
https://doi.org/10.1063/1.2779214
Published: September 2007
View article titled, Relative detection efficiency of back- and front-illuminated charge-coupled device cameras for x-rays between 1 keV and 18 keV
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