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J. Smoliner
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Journal Articles

Bias-tunable temperature coefficient of resistance in Ge transistors

Open Access
R. Behrle, J. Smoliner, L. Wind, D. Nazzari, A. Lugstein, W. M. Weber, M. Sistani
Journal: Applied Physics Letters
Appl. Phys. Lett. 124, 093510 (2024)
https://doi.org/10.1063/5.0191503
Published: February 2024
View articletitled, Bias-tunable temperature coefficient of resistance in Ge transistors
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Journal Articles

Effective reduction of trap density at the Y2O3/Ge interface by rigorous high-temperature oxygen annealing

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O. Bethge, C. Zimmermann, B. Lutzer, S. Simsek, J. Smoliner, M. Stöger-Pollach, C. Henkel, E. Bertagnolli
Journal: Journal of Applied Physics
J. Appl. Phys. 116, 214111 (2014)
https://doi.org/10.1063/1.4903533
Published: December 2014
View articletitled, Effective reduction of trap density at the Y2O3/Ge interface by rigorous high-temperature oxygen annealing
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Journal Articles

Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHz

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M. Kasper, G. Gramse, J. Hoffmann, C. Gaquiere, R. Feger, A. Stelzer, J. Smoliner, F. Kienberger
Journal: Journal of Applied Physics
J. Appl. Phys. 116, 184301 (2014)
https://doi.org/10.1063/1.4897922
Published: November 2014
View articletitled, Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHz
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Journal Articles

Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope

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A. Imtiaz, T. M. Wallis, S.-H. Lim, H. Tanbakuchi, H.-P. Huber, A. Hornung, P. Hinterdorfer, J. Smoliner, F. Kienberger, P. Kabos
Journal: Journal of Applied Physics
J. Appl. Phys. 111, 093727 (2012)
https://doi.org/10.1063/1.4716026
Published: May 2012
View articletitled, Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope
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Journal Articles

Phase and amplitude sensitive scanning microwave microscopy/spectroscopy on metal–oxide–semiconductor systems

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I. Humer, H. P. Huber, F. Kienberger, J. Danzberger, J. Smoliner
Journal: Journal of Applied Physics
J. Appl. Phys. 111, 074313 (2012)
https://doi.org/10.1063/1.3702580
Published: April 2012
View articletitled, Phase and amplitude sensitive scanning microwave microscopy/spectroscopy on metal–oxide–semiconductor systems
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Journal Articles

Tip geometry effects in dopant profiling by scanning microwave microscopy

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I. Humer, C. Eckhardt, H. P. Huber, F. Kienberger, J. Smoliner
Journal: Journal of Applied Physics
J. Appl. Phys. 111, 044314 (2012)
https://doi.org/10.1063/1.3686748
Published: February 2012
View articletitled, Tip geometry effects in dopant profiling by scanning microwave microscopy
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Journal Articles

Calibrated nanoscale dopant profiling using a scanning microwave microscope

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H. P. Huber, I. Humer, M. Hochleitner, M. Fenner, M. Moertelmaier, C. Rankl, A. Imtiaz, T. M. Wallis, H. Tanbakuchi, P. Hinterdorfer, P. Kabos, J. Smoliner, J. J. Kopanski, F. Kienberger
Journal: Journal of Applied Physics
J. Appl. Phys. 111, 014301 (2012)
https://doi.org/10.1063/1.3672445
Published: January 2012
View articletitled, Calibrated nanoscale dopant profiling using a scanning microwave microscope
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Journal Articles

Rashba Effect in Non‐Magnetic InGaAs/GaAsSb Resonant Tunneling Diodes Enhanced By Transverse Magnetic Field

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J. Silvano de Sousa, H. Detz, P. Klang, E. Gornik, G. Strasser, J. Smoliner
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1416, 42–45 (2011)
https://doi.org/10.1063/1.3671693
Published: December 2011
View articletitled, Rashba Effect in Non‐Magnetic InGaAs/GaAsSb Resonant Tunneling Diodes Enhanced By Transverse Magnetic Field
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Journal Articles

Mapping the Local Photoresponse of Epitaxial and Colloidal Quantum Dots by Photoconductive Atomic Force Microscopy

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M. Madl, W. Brezna, P. Klang, A. M. Andrews, G. Strasser, M. I. Bodnarchuk, M. V. Kovalenko, M. Yarema, W. Heiss, J. Smoliner
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1399, 1073–1074 (2011)
https://doi.org/10.1063/1.3666749
Published: December 2011
View articletitled, Mapping the Local Photoresponse of Epitaxial and Colloidal Quantum Dots by Photoconductive Atomic Force Microscopy
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Journal Articles

Quasistatic Dielectric Constants Of Colloidal Nanocrystals

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I. Humer, J. Smoliner, O. Bethge, C. Eckhardt, M. Bodnarchuk, M. Kovalenko, M. Yarema, W. Heiss
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1399, 1053–1054 (2011)
https://doi.org/10.1063/1.3666740
Published: December 2011
View articletitled, Quasistatic Dielectric Constants Of Colloidal Nanocrystals
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Journal Articles

Enhanced Rashba effect in transverse magnetic fields observed on InGaAs/GaAsSb resonant tunneling diodes at temperatures up to T = 180 K

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J. Silvano de Sousa, H. Detz, P. Klang, E. Gornik, G. Strasser, J. Smoliner
Journal: Applied Physics Letters
Appl. Phys. Lett. 99, 152107 (2011)
https://doi.org/10.1063/1.3650715
Published: October 2011
View articletitled, Enhanced Rashba effect in transverse magnetic fields observed on InGaAs/GaAsSb resonant tunneling diodes at temperatures up to T = 180 K
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Journal Articles

Scanning microwave microscopy and scanning capacitance microscopy on colloidal nanocrystals

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I. Humer, O. Bethge, M. Bodnarchuk, M. Kovalenko, M. Yarema, W. Heiss, H. P. Huber, M. Hochleitner, P. Hinterdorfer, F. Kienberger, J. Smoliner
Journal: Journal of Applied Physics
J. Appl. Phys. 109, 064313 (2011)
https://doi.org/10.1063/1.3553867
Published: March 2011
View articletitled, Scanning microwave microscopy and scanning capacitance microscopy on colloidal nanocrystals
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Journal Articles

A quantitative analysis of photocurrent signals measured on GaAs using conductive atomic force microscopy

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C. Eckhardt, M. Madl, W. Brezna, J. Smoliner
Journal: Journal of Applied Physics
J. Appl. Phys. 109, 034308 (2011)
https://doi.org/10.1063/1.3525272
Published: February 2011
View articletitled, A quantitative analysis of photocurrent signals measured on GaAs using conductive atomic force microscopy
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Journal Articles

Atomic layer deposition temperature dependent minority carrier generation in ZrO 2 / GeO 2 / Ge capacitors

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O. Bethge, S. Abermann, C. Henkel, J. Smoliner, E. Bertagnolli, C. J. Straif, H. Hutter
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 29, 01A806 (2011)
https://doi.org/10.1116/1.3521472
Published: January 2011
View articletitled, Atomic layer deposition temperature dependent minority carrier generation in ZrO 2 / GeO 2 / Ge capacitors
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Journal Articles

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

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H. P. Huber, M. Moertelmaier, T. M. Wallis, C. J. Chiang, M. Hochleitner, A. Imtiaz, Y. J. Oh, K. Schilcher, M. Dieudonne, J. Smoliner, P. Hinterdorfer, S. J. Rosner, H. Tanbakuchi, P. Kabos, F. Kienberger
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 81, 113701 (2010)
https://doi.org/10.1063/1.3491926
Published: November 2010
View articletitled, Calibrated nanoscale capacitance measurements using a scanning microwave microscope
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Journal Articles

Nonparabolicity effects in InGaAs/GaAsSb double barrier resonant tunneling diodes

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J. Silvano de Sousa, H. Detz, P. Klang, M. Nobile, A. M. Andrews, W. Schrenk, E. Gornik, G. Strasser, J. Smoliner
Journal: Journal of Applied Physics
J. Appl. Phys. 108, 073707 (2010)
https://doi.org/10.1063/1.3487922
Published: October 2010
View articletitled, Nonparabolicity effects in InGaAs/GaAsSb double barrier resonant tunneling diodes
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Journal Articles

Scanning microwave microscopy/spectroscopy on metal-oxide-semiconductor systems

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J. Smoliner, H. P. Huber, M. Hochleitner, M. Moertelmaier, F. Kienberger
Journal: Journal of Applied Physics
J. Appl. Phys. 108, 064315 (2010)
https://doi.org/10.1063/1.3482065
Published: September 2010
View articletitled, Scanning microwave microscopy/spectroscopy on metal-oxide-semiconductor systems
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Journal Articles

Frequency dependent capacitance spectroscopy using conductive diamond tips on GaAs / Al 2 O 3 junctions

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C. Eckhardt, J. Silvano de Sousa, W. Brezna, O. Bethge, E. Bertagnolli, J. Smoliner
Journal: Journal of Applied Physics
J. Appl. Phys. 107, 064320 (2010)
https://doi.org/10.1063/1.3354030
Published: March 2010
View articletitled, Frequency dependent capacitance spectroscopy using conductive diamond tips on GaAs / Al 2 O 3 junctions
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Journal Articles

Process temperature dependent high frequency capacitance-voltage response of ZrO 2 / GeO 2 /germanium capacitors

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O. Bethge, S. Abermann, C. Henkel, C. J. Straif, H. Hutter, J. Smoliner, E. Bertagnolli
Journal: Applied Physics Letters
Appl. Phys. Lett. 96, 052902 (2010)
https://doi.org/10.1063/1.3295698
Published: February 2010
View articletitled, Process temperature dependent high frequency capacitance-voltage response of ZrO 2 / GeO 2 /germanium capacitors
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Journal Articles

Spectrally resolved confocal microscopy for laser mode imaging and beam characteristic investigations

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W. Brezna, J. Smoliner
Journal: Applied Physics Letters
Appl. Phys. Lett. 95, 201118 (2009)
https://doi.org/10.1063/1.3264969
Published: November 2009
View articletitled, Spectrally resolved confocal microscopy for laser mode imaging and beam characteristic investigations
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