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J. C. G. de Sande
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Journal Articles

Simple undergraduate experiment for synthesizing and analyzing non-uniformly polarized beams by means of a Fresnel biprism

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Gemma Piquero, Ismael Marcos-Muñoz, J. C. G. de Sande
Journal: American Journal of Physics
Am. J. Phys. 87, 208–213 (2019)
https://doi.org/10.1119/1.5089423
Published: March 2019
View article titled, Simple undergraduate experiment for synthesizing and analyzing non-uniformly polarized beams by means of a Fresnel biprism
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Journal Articles

Amorphization dynamics of Ge 2 Sb 2 Te 5 films upon nano- and femtosecond laser pulse irradiation

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J. Siegel, W. Gawelda, D. Puerto, C. Dorronsoro, J. Solis, C. N. Afonso, J. C. G. de Sande, R. Bez, A. Pirovano, C. Wiemer
Journal: Journal of Applied Physics
J. Appl. Phys. 103, 023516 (2008)
https://doi.org/10.1063/1.2836788
Published: January 2008
View article titled, Amorphization dynamics of Ge 2 Sb 2 Te 5 films upon nano- and femtosecond laser pulse irradiation
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Journal Articles

Refractive index of Ag nanocrystals composite films in the neighborhood of the surface plasmon resonance

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J. C. G. de Sande, R. Serna, J. Gonzalo, C. N. Afonso, D. E. Hole, A. Naudon
Journal: Journal of Applied Physics
J. Appl. Phys. 91, 1536–1541 (2002)
https://doi.org/10.1063/1.1427404
Published: February 2002
View article titled, Refractive index of Ag nanocrystals composite films in the neighborhood of the surface plasmon resonance
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Journal Articles

Spectroscopic ellipsometry of composite thin films with embedded Bi nanocrystals

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R. Serna, J. C. G. de Sande, J. M. Ballesteros, C. N. Afonso
Journal: Journal of Applied Physics
J. Appl. Phys. 84, 4509–4516 (1998)
https://doi.org/10.1063/1.368676
Published: October 1998
View article titled, Spectroscopic ellipsometry of composite thin films with embedded Bi nanocrystals
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Journal Articles

Optical properties of pulsed laser deposited bismuth films

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J. C. G. de Sande, T. Missana, C. N. Afonso
Journal: Journal of Applied Physics
J. Appl. Phys. 80, 7023–7027 (1996)
https://doi.org/10.1063/1.363775
Published: December 1996
View article titled, Optical properties of pulsed laser deposited bismuth films
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Journal Articles

Spectroscopic ellipsometry determination of the refractive index of strained Si1−xGex layers in the near‐infrared wavelength range (0.9–1.7 μm)

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J. C. G. de Sande, A. Rodríguez, T. Rodríguez
Journal: Applied Physics Letters
Appl. Phys. Lett. 67, 3402–3404 (1995)
https://doi.org/10.1063/1.114907
Published: December 1995
View article titled, Spectroscopic ellipsometry determination of the refractive index of strained Si1−xGex layers in the near‐infrared wavelength range (0.9–1.7 μm)
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Journal Articles

The diffusion process of metastable carriers in bismuth

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J. C. G. de Sande, M. Sánchez Balmaseda, J. M. Guerra Pérez
Journal: Journal of Applied Physics
J. Appl. Phys. 77, 6358–6360 (1995)
https://doi.org/10.1063/1.359107
Published: June 1995
View article titled, The diffusion process of metastable carriers in bismuth
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Journal Articles

Anomalous photoresponse of thick bismuth films to pulsed laser excitation

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J. C. G. de Sande, M. Sánchez Balmaseda, J. M. Guerra Pérez
Journal: Applied Physics Letters
Appl. Phys. Lett. 64, 3658–3660 (1994)
https://doi.org/10.1063/1.111172
Published: June 1994
View article titled, Anomalous photoresponse of thick bismuth films to pulsed laser excitation
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Journal Articles

A method to measure weak short‐lived photoconductivity induced by laser excitation in low‐resistance samples

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J. C. G. de Sande, M. Sánchez Balmaseda, J. M. Guerra Pérez
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 65, 2062–2064 (1994)
https://doi.org/10.1063/1.1144813
Published: June 1994
View article titled, A method to measure weak short‐lived photoconductivity induced by laser excitation in low‐resistance samples
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