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I. C. Noyan
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Journal Articles

Determination of shape anisotropy in embedded low contrast submonolayer quantum dot structures

S. Dhomkar, N. Vaxelaire, H. Ji, V. Shuvayev, M. C. Tamargo, I. L. Kuskovsky, I. C. Noyan
Journal: Applied Physics Letters
Appl. Phys. Lett. 107, 251905 (2015)
https://doi.org/10.1063/1.4938399
Published: December 2015
View articletitled, Determination of shape anisotropy in embedded low contrast submonolayer quantum dot structures
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Journal Articles

Vertical correlation and miniband formation in submonolayer Zn(Cd)Te/ZnCdSe type-II quantum dots for intermediate band solar cell application

S. Dhomkar, U. Manna, I. C. Noyan, M. C. Tamargo, I. L. Kuskovsky
Journal: Applied Physics Letters
Appl. Phys. Lett. 103, 181905 (2013)
https://doi.org/10.1063/1.4827636
Published: October 2013
View articletitled, Vertical correlation and miniband formation in submonolayer Zn(Cd)Te/ZnCdSe type-II quantum dots for intermediate band solar cell application
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Journal Articles

Characterization of room temperature recrystallization kinetics in electroplated copper thin films with concurrent x-ray diffraction and electrical resistivity measurements

Mikhail Treger, Christian Witt, Cyril Cabral, Conal Murray, Jean Jordan-Sweet, Robert Rosenberg, Eric Eisenbraun, I. C. Noyan
Journal: Journal of Applied Physics
J. Appl. Phys. 113, 214904 (2013)
https://doi.org/10.1063/1.4807899
Published: June 2013
View articletitled, Characterization of room temperature recrystallization kinetics in electroplated copper thin films with concurrent x-ray diffraction and electrical resistivity measurements
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Journal Articles

Evolution of strain energy during recrystallization of plated Cu films

Conal E. Murray, R. Rosenberg, C. Witt, M. Treger, I. C. Noyan
Journal: Journal of Applied Physics
J. Appl. Phys. 113, 203515 (2013)
https://doi.org/10.1063/1.4807409
Published: May 2013
View articletitled, Evolution of strain energy during recrystallization of plated Cu films
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Journal Articles

Optimization of growth conditions of type-II Zn(Cd)Te/ZnCdSe submonolayer quantum dot superlattices for intermediate band solar cells

Siddharth Dhomkar, Igor L. Kuskovsky, Uttam Manna, I. C. Noyan, Maria C. Tamargo
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 31, 03C119 (2013)
https://doi.org/10.1116/1.4797486
Published: March 2013
View articletitled, Optimization of growth conditions of type-II Zn(Cd)Te/ZnCdSe submonolayer quantum dot superlattices for intermediate band solar cells
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Journal Articles

Radiative transitions in stacked type-II ZnMgTe quantum dots embedded in ZnSe

U. Manna, Q. Zhang, S. Dhomkar, I. F. Salakhutdinov, M. C. Tamargo, I. C. Noyan, G. F. Neumark, I. L. Kuskovsky
Journal: Journal of Applied Physics
J. Appl. Phys. 112, 063521 (2012)
https://doi.org/10.1063/1.4754451
Published: September 2012
View articletitled, Radiative transitions in stacked type-II ZnMgTe quantum dots embedded in ZnSe
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Journal Articles

Structural properties and spatial ordering in multilayered ZnMgTe/ZnSe type-II quantum dot structures

U. Manna, I. C. Noyan, Q. Zhang, I. F. Salakhutdinov, K. A. Dunn, S. W. Novak, R. Moug, M. C. Tamargo, G. F. Neumark, I. L. Kuskovsky
Journal: Journal of Applied Physics
J. Appl. Phys. 111, 033516 (2012)
https://doi.org/10.1063/1.3681812
Published: February 2012
View articletitled, Structural properties and spatial ordering in multilayered ZnMgTe/ZnSe type-II quantum dot structures
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Journal Articles

Nanoscale silicon-on-insulator deformation induced by stressed liner structures

Conal E. Murray, A. Ying, S. M. Polvino, I. C. Noyan, M. Holt, J. Maser
Journal: Journal of Applied Physics
J. Appl. Phys. 109, 083543 (2011)
https://doi.org/10.1063/1.3579421
Published: April 2011
View articletitled, Nanoscale silicon-on-insulator deformation induced by stressed liner structures
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Journal Articles

A quantitative analysis of room temperature recrystallization kinetics in electroplated copper films using high resolution x-ray diffraction

Andrew Ying, Christian Witt, Jean Jordan-Sweet, Robert Rosenberg, I. C. Noyan
Journal: Journal of Applied Physics
J. Appl. Phys. 109, 014907 (2011)
https://doi.org/10.1063/1.3514096
Published: January 2011
View articletitled, A quantitative analysis of room temperature recrystallization kinetics in electroplated copper films using high resolution x-ray diffraction
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Journal Articles

Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions

Conal E. Murray, Z. Ren, A. Ying, S. M. Polvino, I. C. Noyan, Z. Cai
Journal: Applied Physics Letters
Appl. Phys. Lett. 94, 063502 (2009)
https://doi.org/10.1063/1.3079656
Published: February 2009
View articletitled, Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions
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Journal Articles

Local strain distributions in silicon-on-insulator/stressor-film composites

Özgür Kalenci, Conal E. Murray, I. C. Noyan
Journal: Journal of Applied Physics
J. Appl. Phys. 104, 063503 (2008)
https://doi.org/10.1063/1.2975992
Published: September 2008
View articletitled, Local strain distributions in silicon-on-insulator/stressor-film composites
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Journal Articles

Submicron mapping of silicon-on-insulator strain distributions induced by stressed liner structures

Conal E. Murray, K. L. Saenger, O. Kalenci, S. M. Polvino, I. C. Noyan, B. Lai, Z. Cai
Journal: Journal of Applied Physics
J. Appl. Phys. 104, 013530 (2008)
https://doi.org/10.1063/1.2952044
Published: July 2008
View articletitled, Submicron mapping of silicon-on-insulator strain distributions induced by stressed liner structures
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Journal Articles

Synchrotron microbeam x-ray radiation damage in semiconductor layers

Sean M. Polvino, Conal E. Murray, Özgür Kalenci, I. C. Noyan, Barry Lai, Zhoghou Cai
Journal: Applied Physics Letters
Appl. Phys. Lett. 92, 224105 (2008)
https://doi.org/10.1063/1.2942380
Published: June 2008
View articletitled, Synchrotron microbeam x-ray radiation damage in semiconductor layers
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Journal Articles

Submicron mapping of strained silicon-on-insulator features induced

Conal E. Murray, M. Sankarapandian, S. M. Polvino, I. C. Noyan, B. Lai, Z. Cai
Journal: Applied Physics Letters
Appl. Phys. Lett. 90, 171919 (2007)
https://doi.org/10.1063/1.2732180
Published: April 2007
View articletitled, Submicron mapping of strained silicon-on-insulator features induced
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Journal Articles

Mapping local strain in thin film/substrate systems using x-ray microdiffraction topography

Hanfei Yan, Conal E. Murray, I. C. Noyan
Journal: Applied Physics Letters
Appl. Phys. Lett. 90, 091918 (2007)
https://doi.org/10.1063/1.2711189
Published: March 2007
View articletitled, Mapping local strain in thin film/substrate systems using x-ray microdiffraction topography
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Journal Articles

Dynamical diffraction peak splitting in time-of-flight neutron diffraction

E. Üstündag, R. A. Karnesky, M. R. Daymond, I. C. Noyan
Journal: Applied Physics Letters
Appl. Phys. Lett. 89, 233515 (2006)
https://doi.org/10.1063/1.2402220
Published: December 2006
View articletitled, Dynamical diffraction peak splitting in time-of-flight neutron diffraction
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Journal Articles

Thermal stress evolution in embedded Cu/low- k dielectric composite features

Conal E. Murray, Charles C. Goldsmith, Thomas M. Shaw, James P. Doyle, I. C. Noyan
Journal: Applied Physics Letters
Appl. Phys. Lett. 89, 011913 (2006)
https://doi.org/10.1063/1.2219727
Published: July 2006
View articletitled, Thermal stress evolution in embedded Cu/low- k dielectric composite features
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Journal Articles

Structure of Zn–Se–Te system with submonolayer insertion of ZnTe grown by migration enhanced epitaxy

Y. Gong, Hanfei F. Yan, I. L. Kuskovsky, Y. Gu, I. C. Noyan, G. F. Neumark, M. C. Tamargo
Journal: Journal of Applied Physics
J. Appl. Phys. 99, 064913 (2006)
https://doi.org/10.1063/1.2184434
Published: March 2006
View articletitled, Structure of Zn–Se–Te system with submonolayer insertion of ZnTe grown by migration enhanced epitaxy
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Journal Articles

Dynamical diffraction artifacts in Laue microdiffraction images

Hanfei Yan, I. C. Noyan
Journal: Journal of Applied Physics
J. Appl. Phys. 98, 073527 (2005)
https://doi.org/10.1063/1.2071454
Published: October 2005
View articletitled, Dynamical diffraction artifacts in Laue microdiffraction images
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Journal Articles

High-resolution strain mapping in heteroepitaxial thin-film features

C. E. Murray, H.-F. Yan, I. C. Noyan, Z. Cai, B. Lai
Journal: Journal of Applied Physics
J. Appl. Phys. 98, 013504 (2005)
https://doi.org/10.1063/1.1938277
Published: July 2005
View articletitled, High-resolution strain mapping in heteroepitaxial thin-film features
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