1-20 of 61
Hirofumi Yamada
Close
Save search
Follow your search
Access your saved searches in your account
Close Modal
Sort by
Journal Articles

Charge injection barrier at the pentacene thin film and electrode interface characterized by time-resolved electrostatic force microscopy

Available to Purchase
Tomoharu Kimura, Kei Kobayashi, Yuji Yamagishi, Hirofumi Yamada
Journal: Applied Physics Letters
Appl. Phys. Lett. 125, 263301 (2024)
https://doi.org/10.1063/5.0241802
Published: December 2024
View articletitled, Charge injection barrier at the pentacene thin film and electrode interface characterized by time-resolved electrostatic force microscopy
Open the PDF for Charge injection barrier at the pentacene thin film and electrode interface characterized by time-resolved electrostatic force microscopy in another window
Journal Articles

Nanoscale visualization of fast carrier dynamics in organic thin-film transistors by time-resolved electrostatic force microscopy

Open Access
Yuji Yamagishi, Kei Kobayashi, Tomoharu Kimura, Kei Noda, Hirofumi Yamada
Journal: Journal of Applied Physics
J. Appl. Phys. 135, 125501 (2024)
https://doi.org/10.1063/5.0186369
Published: March 2024
View articletitled, Nanoscale visualization of fast carrier dynamics in organic thin-film transistors by time-resolved electrostatic force microscopy
Open the PDF for Nanoscale visualization of fast carrier dynamics in organic thin-film transistors by time-resolved electrostatic force microscopy in another window
Journal Articles

Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage sweeps

Available to Purchase
Yuji Yamagishi, Kei Kobayashi, Kei Noda, Hirofumi Yamada
Journal: Applied Physics Letters
Appl. Phys. Lett. 108, 093302 (2016)
https://doi.org/10.1063/1.4943140
Published: March 2016
View articletitled, Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage sweeps
Open the PDF for Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage sweeps in another window
Includes: Supplementary data
Journal Articles

Local impedance measurement of an electrode/single-pentacene-grain interface by frequency-modulation scanning impedance microscopy

Available to Purchase
Tomoharu Kimura, Kei Kobayashi, Hirofumi Yamada
Journal: Journal of Applied Physics
J. Appl. Phys. 118, 055501 (2015)
https://doi.org/10.1063/1.4927921
Published: August 2015
View articletitled, Local impedance measurement of an electrode/single-pentacene-grain interface by frequency-modulation scanning impedance microscopy
Open the PDF for Local impedance measurement of an electrode/single-pentacene-grain interface by frequency-modulation scanning impedance microscopy in another window
Includes: Supplementary data
Journal Articles

Accurate formula for dissipative interaction in frequency modulation atomic force microscopy

Available to Purchase
Kazuhiro Suzuki, Kei Kobayashi, Aleksander Labuda, Kazumi Matsushige, Hirofumi Yamada
Journal: Applied Physics Letters
Appl. Phys. Lett. 105, 233105 (2014)
https://doi.org/10.1063/1.4903484
Published: December 2014
View articletitled, Accurate formula for dissipative interaction in frequency modulation atomic force microscopy
Open the PDF for Accurate formula for dissipative interaction in frequency modulation atomic force microscopy in another window
Includes: Supplementary data
Journal Articles

Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media

Available to Purchase
Ken-ichi Umeda, Kei Kobayashi, Noriaki Oyabu, Yoshiki Hirata, Kazumi Matsushige, Hirofumi Yamada
Journal: Journal of Applied Physics
J. Appl. Phys. 116, 134307 (2014)
https://doi.org/10.1063/1.4896881
Published: October 2014
View articletitled, Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media
Open the PDF for Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media in another window
Journal Articles

Photothermal excitation setup for a modified commercial atomic force microscope

Available to Purchase
Holger Adam, Sebastian Rode, Martin Schreiber, Kei Kobayashi, Hirofumi Yamada, Angelika Kühnle
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 85, 023703 (2014)
https://doi.org/10.1063/1.4864084
Published: February 2014
View articletitled, Photothermal excitation setup for a modified commercial atomic force microscope
Open the PDF for Photothermal excitation setup for a modified commercial atomic force microscope in another window
Journal Articles

Molecular-scale investigations of structures and surface charge distribution of surfactant aggregates by three-dimensional force mapping

Available to Purchase
Kazuhiro Suzuki, Kei Kobayashi, Noriaki Oyabu, Kazumi Matsushige, Hirofumi Yamada
Journal: The Journal of Chemical Physics
J. Chem. Phys. 140, 054704 (2014)
https://doi.org/10.1063/1.4863346
Published: February 2014
View articletitled, Molecular-scale investigations of structures and surface charge distribution of surfactant aggregates by three-dimensional force mapping
Open the PDF for Molecular-scale investigations of structures and surface charge distribution of surfactant aggregates by three-dimensional force mapping in another window
Includes: Supplementary data
Journal Articles

Influence of grain boundary on electrical properties of organic crystalline grains investigated by dual-probe atomic force microscopy

Available to Purchase
Masaharu Hirose, Eika Tsunemi, Kei Kobayashi, Hirofumi Yamada
Journal: Applied Physics Letters
Appl. Phys. Lett. 103, 173109 (2013)
https://doi.org/10.1063/1.4826582
Published: October 2013
View articletitled, Influence of grain boundary on electrical properties of organic crystalline grains investigated by dual-probe atomic force microscopy
Open the PDF for Influence of grain boundary on electrical properties of organic crystalline grains investigated by dual-probe atomic force microscopy in another window
Journal Articles

Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams

Available to Purchase
Eika Tsunemi, Kei Kobayashi, Noriaki Oyabu, Masaharu Hirose, Yoshiko Takenaka, Kazumi Matsushige, Hirofumi Yamada
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 84, 083701 (2013)
https://doi.org/10.1063/1.4816535
Published: August 2013
View articletitled, Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams
Open the PDF for Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams in another window
Journal Articles

Erratum: “Investigation of electrical transport in anodized single TiO2 nanotubes” [Appl. Phys. Lett. 102 , 043105 (2013)]

Free
Masashi Hattori, Kei Noda, Tatsuya Nishi, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige
Journal: Applied Physics Letters
Appl. Phys. Lett. 103, 039901 (2013)
https://doi.org/10.1063/1.4815940
Published: July 2013
View articletitled, Erratum: “Investigation of electrical transport in anodized single TiO2 nanotubes” [Appl. Phys. Lett. 102 , 043105 (2013)]
Open the PDF for Erratum: “Investigation of electrical transport in anodized single TiO2 nanotubes” [Appl. Phys. Lett. 102 , 043105 (2013)] in another window
Journal Articles

Visualization of hydration layers on muscovite mica in aqueous solution by frequency-modulation atomic force microscopy

Available to Purchase
Kei Kobayashi, Noriaki Oyabu, Kenjiro Kimura, Shinichiro Ido, Kazuhiro Suzuki, Takashi Imai, Katsunori Tagami, Masaru Tsukada, Hirofumi Yamada
Journal: The Journal of Chemical Physics
J. Chem. Phys. 138, 184704 (2013)
https://doi.org/10.1063/1.4803742
Published: May 2013
View articletitled, Visualization of hydration layers on muscovite mica in aqueous solution by frequency-modulation atomic force microscopy
Open the PDF for Visualization of hydration layers on muscovite mica in aqueous solution by frequency-modulation atomic force microscopy in another window
Includes: Supplementary data
Journal Articles

Analysis of capacitive force acting on a cantilever tip at solid/liquid interfaces

Available to Purchase
Ken-ichi Umeda, Kei Kobayashi, Noriaki Oyabu, Yoshiki Hirata, Kazumi Matsushige, Hirofumi Yamada
Journal: Journal of Applied Physics
J. Appl. Phys. 113, 154311 (2013)
https://doi.org/10.1063/1.4801795
Published: April 2013
View articletitled, Analysis of capacitive force acting on a cantilever tip at solid/liquid interfaces
Open the PDF for Analysis of capacitive force acting on a cantilever tip at solid/liquid interfaces in another window
Journal Articles

Investigation of electrical transport in anodized single TiO2 nanotubes

Available to Purchase
Masashi Hattori, Kei Noda, Tatsuya Nishi, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige
Journal: Applied Physics Letters
Appl. Phys. Lett. 102, 043105 (2013)
https://doi.org/10.1063/1.4789763
Published: January 2013
View articletitled, Investigation of electrical transport in anodized single TiO2 nanotubes
Open the PDF for Investigation of electrical transport in anodized single TiO2 nanotubes in another window
Journal Articles

Local potential profiling of operating carbon nanotube transistor using frequency-modulation high-frequency electrostatic force microscopy

Available to Purchase
Masanao Ito, Kei Kobayashi, Yuji Miyato, Kazumi Matsushige, Hirofumi Yamada
Journal: Applied Physics Letters
Appl. Phys. Lett. 102, 013115 (2013)
https://doi.org/10.1063/1.4774265
Published: January 2013
View articletitled, Local potential profiling of operating carbon nanotube transistor using frequency-modulation high-frequency electrostatic force microscopy
Open the PDF for Local potential profiling of operating carbon nanotube transistor using frequency-modulation high-frequency electrostatic force microscopy in another window
Journal Articles

Direct actuation of cantilever in aqueous solutions by electrostatic force using high-frequency electric fields

Available to Purchase
Ken-ichi Umeda, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada
Journal: Applied Physics Letters
Appl. Phys. Lett. 101, 123112 (2012)
https://doi.org/10.1063/1.4754289
Published: September 2012
View articletitled, Direct actuation of cantilever in aqueous solutions by electrostatic force using high-frequency electric fields
Open the PDF for Direct actuation of cantilever in aqueous solutions by electrostatic force using high-frequency electric fields in another window
Journal Articles

Fabrication of glycerol liquid droplet array by nano-inkjet printing method

Available to Purchase
Kiyohiro Kaisei, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada
Journal: Journal of Applied Physics
J. Appl. Phys. 111, 074319 (2012)
https://doi.org/10.1063/1.3699388
Published: April 2012
View articletitled, Fabrication of glycerol liquid droplet array by nano-inkjet printing method
Open the PDF for Fabrication of glycerol liquid droplet array by nano-inkjet printing method in another window
Journal Articles

Surface potential measurement of organic thin film on metal electrodes by dynamic force microscopy using a piezoelectric cantilever

Available to Purchase
Nobuo Satoh, Shigetaka Katori, Kei Kobayashi, Shunji Watanabe, Toru Fujii, Kazumi Matsushige, Hirofumi Yamada
Journal: Journal of Applied Physics
J. Appl. Phys. 109, 114306 (2011)
https://doi.org/10.1063/1.3585865
Published: June 2011
View articletitled, Surface potential measurement of organic thin film on metal electrodes by dynamic force microscopy using a piezoelectric cantilever
Open the PDF for Surface potential measurement of organic thin film on metal electrodes by dynamic force microscopy using a piezoelectric cantilever in another window
Journal Articles

Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams

Available to Purchase
Eika Tsunemi, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 82, 033708 (2011)
https://doi.org/10.1063/1.3534830
Published: March 2011
View articletitled, Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams
Open the PDF for Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams in another window
Journal Articles

Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy

Available to Purchase
Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 82, 033702 (2011)
https://doi.org/10.1063/1.3557416
Published: March 2011
View articletitled, Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy
Open the PDF for Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy in another window