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Journal Articles

Simulation of quantum cascade lasers

Z.-M. Simon Li, Ying-Ying Li, Guo-Ping Ru
Journal: Journal of Applied Physics
J. Appl. Phys. 110, 093109 (2011)
https://doi.org/10.1063/1.3660207
Published: November 2011
View article titled, Simulation of quantum cascade lasers
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Journal Articles

Cu adhesion on tantalum and ruthenium surface: Density functional theory study

Shao-Feng Ding (丁少锋), Shao-Ren Deng (邓少任), Hai-Sheng Lu (鲁海生), Yu-Long Jiang (蒋玉龙), Guo-Ping Ru (茹国平), David Wei Zhang (张卫), Xin-Ping Qu (屈新萍)
Journal: Journal of Applied Physics
J. Appl. Phys. 107, 103534 (2010)
https://doi.org/10.1063/1.3369443
Published: May 2010
View article titled, Cu adhesion on tantalum and ruthenium surface: Density functional theory study
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Journal Articles

The effect of postannealing on the electrical properties of well-aligned n -ZnO nanorods/ p -Si heterojunction

Shu-Yi Liu, Tao Chen, Yu-Long Jiang, Guo-Ping Ru, Xin-Ping Qu
Journal: Journal of Applied Physics
J. Appl. Phys. 105, 114504 (2009)
https://doi.org/10.1063/1.3137204
Published: June 2009
View article titled, The effect of postannealing on the electrical properties of well-aligned n -ZnO nanorods/ p -Si heterojunction
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Journal Articles

Atomic layer deposition of Ti O 2 from tetrakis-dimethyl-amido titanium or Ti isopropoxide precursors and H 2 O

Qi Xie, Yu-Long Jiang, Christophe Detavernier, Davy Deduytsche, Roland L. Van Meirhaeghe, Guo-Ping Ru, Bing-Zong Li, Xin-Ping Qu
Journal: Journal of Applied Physics
J. Appl. Phys. 102, 083521 (2007)
https://doi.org/10.1063/1.2798384
Published: October 2007
View article titled, Atomic layer deposition of Ti O 2 from tetrakis-dimethyl-amido titanium or Ti isopropoxide precursors and H 2 O
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Journal Articles

Growth of pinhole-free ytterbium silicide film by solid-state reaction on Si(001) with a thin amorphous Si interlayer

Yu-Long Jiang, Qi Xie, Christophe Detavernier, R. L. Van Meirhaeghe, Guo-Ping Ru, Xin-Ping Qu, Bing-Zong Li, Paul K. Chu
Journal: Journal of Applied Physics
J. Appl. Phys. 102, 033508 (2007)
https://doi.org/10.1063/1.2767375
Published: August 2007
View article titled, Growth of pinhole-free ytterbium silicide film by solid-state reaction on Si(001) with a thin amorphous Si interlayer
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Journal Articles

Schottky contact barrier height extraction by admittance measurement

Yu-Long Jiang, Jia Luo, Ye Yao, Fang Lu, Guo-Ping Ru, Xin-Ping Qu, Bing-Zong Li
Journal: Journal of Applied Physics
J. Appl. Phys. 101, 053705 (2007)
https://doi.org/10.1063/1.2472276
Published: March 2007
View article titled, Schottky contact barrier height extraction by admittance measurement
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Journal Articles

Oxidation suppression in ytterbium silicidation by Ti ∕ Ti N bicapping layer

Yu-Long Jiang, Qi Xie, Christophe Detavernier, R. L. Van Meirhaeghe, Guo-Ping Ru, Xin-Ping Qu, Bing-Zong Li, Anping Huang, Paul K. Chu
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 25, 285–289 (2007)
https://doi.org/10.1116/1.2464123
Published: February 2007
View article titled, Oxidation suppression in ytterbium silicidation by Ti ∕ Ti N bicapping layer
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Journal Articles

Improved barrier properties of ultrathin Ru film with TaN interlayer for copper metallization

Xin-Ping Qu, Jing-Jing Tan, Mi Zhou, Tao Chen, Qi Xie, Guo-Ping Ru, Bing-Zong Li
Journal: Applied Physics Letters
Appl. Phys. Lett. 88, 151912 (2006)
https://doi.org/10.1063/1.2195112
Published: April 2006
View article titled, Improved barrier properties of ultrathin Ru film with TaN interlayer for copper metallization
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Journal Articles

Investigation of Ni reaction with sputtered amorphous SiGe thin film on SiO 2 substrate

Xin-Ping Qu, Peng Duan, Yan-Qing Wu, Tao Chen, Guang-Wei Wang, Guo-Ping Ru, Bing-Zong Li
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 24, 20–24 (2006)
https://doi.org/10.1116/1.2126679
Published: December 2005
View article titled, Investigation of Ni reaction with sputtered amorphous SiGe thin film on SiO 2 substrate
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Journal Articles

Nickel silicidation on n and p -type junctions at 300 ° C

Yu-Long Jiang, Aditya Agarwal, Guo-Ping Ru, Xin-Ping Qu, John Poate, Bing-Zong Li, Wayne Holland
Journal: Applied Physics Letters
Appl. Phys. Lett. 85, 410–412 (2004)
https://doi.org/10.1063/1.1775292
Published: July 2004
View article titled, Nickel silicidation on n and p -type junctions at 300 ° C
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Journal Articles

Solid-phase reaction and Schottky contact properties of Co/ n- poly-Si 0.84 Ge 0.16 / n- Si (100)

Guang-Wei Wang, Guo-Ping Ru, Xin-Ping Qu, Bing-Zong Li
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 22, 1705–1710 (2004)
https://doi.org/10.1116/1.1763895
Published: June 2004
View article titled, Solid-phase reaction and Schottky contact properties of Co/ n- poly-Si 0.84 Ge 0.16 / n- Si (100)
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Journal Articles

Rectifying characteristics of sputter-deposited SiGe diodes

Guo-Ping Ru, Guang-Wei Wang, Yu-Long Jiang, Wei Huang, Xin-Ping Qu, Shi-Yang Zhu, Bing-Zong Li
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 21, 1301–1305 (2003)
https://doi.org/10.1116/1.1580842
Published: June 2003
View article titled, Rectifying characteristics of sputter-deposited SiGe diodes
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Journal Articles

Comment on “Schottky barrier rectifier with high current density using vanadium as barrier metal” [Appl. Phys. Lett., 79 , 860 (2001)]

Yu-Long Jiang, Guo-Ping Ru, Xin-Ping Qu, Bing-Zong Li
Journal: Applied Physics Letters
Appl. Phys. Lett. 82, 1311–1312 (2003)
https://doi.org/10.1063/1.1555268
Published: February 2003
View article titled, Comment on “Schottky barrier rectifier with high current density using vanadium as barrier metal” [Appl. Phys. Lett., 79 , 860 (2001)]
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Journal Articles

Ni/Si solid phase reaction studied by temperature-dependent current-voltage technique

Yu-Long Jiang, Guo-Ping Ru, Fang Lu, Xin-Ping Qu, Bing-Zong Li, Simon Yang
Journal: Journal of Applied Physics
J. Appl. Phys. 93, 866–870 (2003)
https://doi.org/10.1063/1.1527714
Published: January 2003
View article titled, Ni/Si solid phase reaction studied by temperature-dependent current-voltage technique
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Journal Articles

Epitaxial growth of CoSi 2 film by Co /a- Si / Ti / Si (100) multilayer solid state reaction

Xin-Ping Qu, Guo-Ping Ru, Yong-Zhao Han, Bei-Lei Xu, Bing-Zong Li, Ning Wang, Paul K. Chu
Journal: Journal of Applied Physics
J. Appl. Phys. 89, 2641–2648 (2001)
https://doi.org/10.1063/1.1341213
Published: March 2001
View article titled, Epitaxial growth of CoSi 2 film by Co /a- Si / Ti / Si (100) multilayer solid state reaction
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Journal Articles

Ion-bombardment effects on PtSi /n -Si Schottky contacts studied by ballistic electron emission microscopy

Guo-Ping Ru, Xin-Ping Qu, Shi-Yang Zhu, Bing-Zong Li, C. Detavernier, R. L. Van Meirhaeghe, F. Cardon, R. A. Donaton, K. Maex
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 18, 1942–1948 (2000)
https://doi.org/10.1116/1.1305269
Published: July 2000
View article titled, Ion-bombardment effects on PtSi /n -Si Schottky contacts studied by ballistic electron emission microscopy
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Journal Articles

Nondestructive characterization of thin silicides using x-ray reflectivity

C. Detavernier, R. De Gryse, R. L. Van Meirhaeghe, F. Cardon, Guo-Ping Ru, Xin-Ping Qu, Bing-Zong Li, R. A. Donaton, K. Maex
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 18, 470–476 (2000)
https://doi.org/10.1116/1.582211
Published: March 2000
View article titled, Nondestructive characterization of thin silicides using x-ray reflectivity
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