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Journal Articles

Dielectrophoresis study of temporal change in internal conductivity of single CHO cells after electroporation by pulsed electric fields

E. Salimi, K. Braasch, M. Butler, D. J. Thomson, G. E. Bridges

Biomicrofluidics 11, 014111 (2017)

https://doi.org/10.1063/1.4975978

Published: February 2017

View articletitled, Dielectrophoresis study of temporal change in internal conductivity of single CHO cells after electroporation by pulsed electric fields

Journal Articles

Dielectric model for Chinese hamster ovary cells obtained by dielectrophoresis cytometry

E. Salimi, K. Braasch, M. Butler, D. J. Thomson, G. E. Bridges

Biomicrofluidics 10, 014111 (2016)

https://doi.org/10.1063/1.4940432

Published: January 2016

View articletitled, Dielectric model for Chinese hamster ovary cells obtained by dielectrophoresis cytometry

Journal Articles

Monitoring the dielectric response of single cells following mitochondrial adenosine triphosphate synthase inhibition by oligomycin using a dielectrophoretic cytometer

B. Saboktakin Rizi, K. Braasch, E. Salimi, M. Butler, G. E. Bridges, D. J. Thomson

Biomicrofluidics 8, 064114 (2014)

https://doi.org/10.1063/1.4903221

Published: December 2014

View articletitled, Monitoring the dielectric response of single cells following mitochondrial adenosine triphosphate synthase inhibition by oligomycin using a dielectrophoretic cytometer

Includes: Supplementary data

Journal Articles

Nondestructive two-dimensional phase imaging of embedded defects via on-chip spintronic sensor

Z. X. Cao, M. Harder, L. Fu, B. Zhang, W. Lu, G. E. Bridges, Y. S. Gui, C.-M. Hu

Appl. Phys. Lett. 100, 252406 (2012)

https://doi.org/10.1063/1.4729785

Published: June 2012

View articletitled, Nondestructive two-dimensional phase imaging of embedded defects via on-chip spintronic sensor

Journal Articles

Microwave frequency sensor for detection of biological cells in microfluidic channels

M. Nikolic-Jaric, S. F. Romanuik, G. A. Ferrier, G. E. Bridges, M. Butler, K. Sunley, D. J. Thomson, M. R. Freeman

Biomicrofluidics 3, 034103 (2009)

https://doi.org/10.1063/1.3187149

Published: August 2009

View articletitled, Microwave frequency sensor for detection of biological cells in microfluidic channels

Journal Articles

Microfluidic electromanipulation with capacitive detection for the mechanical analysis of cells

G. A. Ferrier, A. N. Hladio, D. J. Thomson, G. E. Bridges, M. Hedayatipoor, S. Olson, M. R. Freeman

Biomicrofluidics 2, 044102 (2008)

https://doi.org/10.1063/1.2992127

Published: November 2008

View articletitled, Microfluidic electromanipulation with capacitive detection for the mechanical analysis of cells

Journal Articles

Direct evidence of “spring softening” nonlinearity in micromachined mechanical resonator using optical beam deflection technique

J. H. Zhao, G. E. Bridges, D. J. Thomson

J. Vac. Sci. Technol. A 24, 732–736 (2006)

https://doi.org/10.1116/1.2194934

Published: May 2006

View articletitled, Direct evidence of “spring softening” nonlinearity in micromachined mechanical resonator using optical beam deflection technique

Journal Articles

Dynamic electrostatic force-gradient microscopy employing mechanoelectric cross modulation

Z. Weng, T. Kaminski, G. E. Bridges, D. J. Thomson

J. Vac. Sci. Technol. A 24, 673–677 (2006)

https://doi.org/10.1116/1.2180268

Published: May 2006

View articletitled, Dynamic electrostatic force-gradient microscopy employing mechanoelectric cross modulation

Journal Articles

Embeddable wireless strain sensor based on resonant rf cavities

J. Chuang, D. J. Thomson, G. E. Bridges

Rev. Sci. Instrum. 76, 094703 (2005)

https://doi.org/10.1063/1.2051808

Published: September 2005

View articletitled, Embeddable wireless strain sensor based on resonant rf cavities

Journal Articles

Resolution enhancement in probing of high-speed integrated circuits using dynamic electrostatic force-gradient microscopy

Z. Weng, T. Kaminski, G. E. Bridges, D. J. Thomson

J. Vac. Sci. Technol. A 22, 948–953 (2004)

https://doi.org/10.1116/1.1691080

Published: May 2004

View articletitled, Resolution enhancement in probing of high-speed integrated circuits using dynamic electrostatic force-gradient microscopy

Journal Articles

Quantitative voltage measurement of high-frequency internal integrated circuit signals by scanning probe microscopy

Z. Weng, C. J. Falkingham, G. E. Bridges, D. J. Thomson

J. Vac. Sci. Technol. A 20, 999–1003 (2002)

https://doi.org/10.1116/1.1460901

Published: May 2002

View articletitled, Quantitative voltage measurement of high-frequency internal integrated circuit signals by scanning probe microscopy

Journal Articles

Capacitance sensor with sub-zeptofarad (<10 −21 F) sensitivity for scanning capacitance microscopy

T. Tran, D. R. Oliver, D. J. Thomson, G. E. Bridges

J. Vac. Sci. Technol. B 20, 479–482 (2002)

https://doi.org/10.1116/1.1424278

Published: January 2002

View articletitled, Capacitance sensor with sub-zeptofarad (<10 −21 F) sensitivity for scanning capacitance microscopy

Journal Articles

Heterodyne electrostatic imaging of polarization due to a surface acoustic wave

D. R. Oliver, A. Pu, D. J. Thomson, G. E. Bridges

Appl. Phys. Lett. 79, 3729–3731 (2001)

https://doi.org/10.1063/1.1421225

Published: November 2001

View articletitled, Heterodyne electrostatic imaging of polarization due to a surface acoustic wave

Journal Articles

“Zeptofarad” (10 −21 F ) resolution capacitance sensor for scanning capacitance microscopy

T. Tran, D. R. Oliver, D. J. Thomson, G. E. Bridges

Rev. Sci. Instrum. 72, 2618–2623 (2001)

https://doi.org/10.1063/1.1369637

Published: June 2001

View articletitled, “Zeptofarad” (10 −21 F ) resolution capacitance sensor for scanning capacitance microscopy

Journal Articles

Quantitative two-dimensional carrier profiling of a 400 nm complementary metal–oxide–semiconductor device by Schottky scanning capacitance microscopy

T. Tran, J. N. Nxumalo, Y. Li, D. J. Thomson, G. E. Bridges, D. R. Oliver

J. Appl. Phys. 88, 6752–6757 (2000)

https://doi.org/10.1063/1.1322380

Published: December 2000

View articletitled, Quantitative two-dimensional carrier profiling of a 400 nm complementary metal–oxide–semiconductor device by Schottky scanning capacitance microscopy

Journal Articles

High resolution sampling electrostatic force microscopy using pulse width modulation technique

R. A. Said, S. P. Cheung, G. E. Bridges

J. Vac. Sci. Technol. B 18, 626–631 (2000)

https://doi.org/10.1116/1.591250

Published: March 2000

View articletitled, High resolution sampling electrostatic force microscopy using pulse width modulation technique

Journal Articles

Non-contact probing of high speed microelectronics using electrostatic force sampling

G. E. Bridges, D. Noruttun, R. A. Said, D. J. Thomson, T. Lam, R. Qi

J. Vac. Sci. Technol. A 16, 830–833 (1998)

https://doi.org/10.1116/1.581067

Published: March 1998

View articletitled, Non-contact probing of high speed microelectronics using electrostatic force sampling

Journal Articles

High‐frequency pattern extraction in digital integrated circuits using scanning electrostatic force microscopy

G. E. Bridges, R. A. Said, M. Mittal, D. J. Thomson

J. Vac. Sci. Technol. B 13, 1375–1379 (1995)

https://doi.org/10.1116/1.587856

Published: May 1995

View articletitled, High‐frequency pattern extraction in digital integrated circuits using scanning electrostatic force microscopy

Journal Articles

Sampled waveform measurement in integrated circuits using heterodyne electrostatic force microscopy

G. E. Bridges, R. A. Said, M. Mittal, D. J. Thomson

Rev. Sci. Instrum. 65, 3378–3381 (1994)

https://doi.org/10.1063/1.1144576

Published: November 1994

View articletitled, Sampled waveform measurement in integrated circuits using heterodyne electrostatic force microscopy

Journal Articles

High frequency potential probe using electrostatic force microscopy

R. A. Said, M. Mittal, G. E. Bridges, D. J. Thomson

J. Vac. Sci. Technol. A 12, 2591–2594 (1994)

https://doi.org/10.1116/1.579063

Published: July 1994

View articletitled, High frequency potential probe using electrostatic force microscopy

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Dielectrophoresis study of temporal change in internal conductivity of single CHO cells after electroporation by pulsed electric fields

Dielectric model for Chinese hamster ovary cells obtained by dielectrophoresis cytometry

Monitoring the dielectric response of single cells following mitochondrial adenosine triphosphate synthase inhibition by oligomycin using a dielectrophoretic cytometer

Nondestructive two-dimensional phase imaging of embedded defects via on-chip spintronic sensor

Microwave frequency sensor for detection of biological cells in microfluidic channels

Microfluidic electromanipulation with capacitive detection for the mechanical analysis of cells

Direct evidence of “spring softening” nonlinearity in micromachined mechanical resonator using optical beam deflection technique

Dynamic electrostatic force-gradient microscopy employing mechanoelectric cross modulation

Embeddable wireless strain sensor based on resonant rf cavities

Resolution enhancement in probing of high-speed integrated circuits using dynamic electrostatic force-gradient microscopy

Quantitative voltage measurement of high-frequency internal integrated circuit signals by scanning probe microscopy

Capacitance sensor with sub-zeptofarad (<10 −21 F) sensitivity for scanning capacitance microscopy

Heterodyne electrostatic imaging of polarization due to a surface acoustic wave

“Zeptofarad” (10 −21 F ) resolution capacitance sensor for scanning capacitance microscopy

Quantitative two-dimensional carrier profiling of a 400 nm complementary metal–oxide–semiconductor device by Schottky scanning capacitance microscopy

High resolution sampling electrostatic force microscopy using pulse width modulation technique

Non-contact probing of high speed microelectronics using electrostatic force sampling

High‐frequency pattern extraction in digital integrated circuits using scanning electrostatic force microscopy

Sampled waveform measurement in integrated circuits using heterodyne electrostatic force microscopy

High frequency potential probe using electrostatic force microscopy

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