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G. Bonilla
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Journal Articles

Microstructure, impurity and metal cap effects on Cu electromigration

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C.-K. Hu, L. G. Gignac, J. Ohm, C. M. Breslin, E. Huang, G. Bonilla, E. Liniger, R. Rosenberg, S. Choi, A. H. Simon
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1601, 67–78 (2014)
https://doi.org/10.1063/1.4881341
Published: June 2014
View articletitled, Microstructure, impurity and metal cap effects on Cu electromigration
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Journal Articles

Electromigration in Cu(Al) and Cu(Mn) damascene lines

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C.-K. Hu, J. Ohm, L. M. Gignac, C. M. Breslin, S. Mittal, G. Bonilla, D. Edelstein, R. Rosenberg, S. Choi, J. J. An, A. H. Simon, M. S. Angyal, L. Clevenger, J. Maniscalco, T. Nogami, C. Penny, B. Y. Kim
Journal: Journal of Applied Physics
J. Appl. Phys. 111, 093722 (2012)
https://doi.org/10.1063/1.4711070
Published: May 2012
View articletitled, Electromigration in Cu(Al) and Cu(Mn) damascene lines
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Journal Articles

Effect Of Impurity On Cu Electromigration

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C.‐K. Hu, M. Angyal, B. C. Baker, G. Bonilla, C. Cabral, D. F. Canaperi, S. Choi, L. Clevenger, D. Edelstein, L. Gignac, E. Huang, J. Kelly, B. Y. Kim, V. Kyei‐Fordjour, S. L. Manikonda, J. Maniscalco, S. Mittal, T. Nogami, C. Parks, R. Rosenberg, A. Simon, Y. Xu, T. A. Vo, C. Witt
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1300, 57–67 (2010)
https://doi.org/10.1063/1.3527138
Published: November 2010
View articletitled, Effect Of Impurity On Cu Electromigration
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Journal Articles

Stress Relaxation in Cu Thin Films

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C. Witt, R. Rosenberg, G. Bonilla, T. Shaw
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1143, 156–165 (2009)
https://doi.org/10.1063/1.3169255
Published: June 2009
View articletitled, Stress Relaxation in Cu Thin Films
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Journal Articles

Super-energy tensor for space–times with vanishing scalar curvature

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Miguel Á. G. Bonilla, Carlos F. Sopuerta
Journal: Journal of Mathematical Physics
J. Math. Phys. 40, 3053–3062 (1999)
https://doi.org/10.1063/1.532743
Published: June 1999
View articletitled, Super-energy tensor for space–times with vanishing scalar curvature
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Journal Articles

Ellipsomicroscopy for surface imaging: A novel tool to investigate surface dynamics

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G. Haas, T. D. Pletcher, G. Bonilla, T. A. Jachimowski, H. H. Rotermund, J. Lauterbach
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 16, 1117–1121 (1998)
https://doi.org/10.1116/1.581243
Published: May 1998
View articletitled, Ellipsomicroscopy for surface imaging: A novel tool to investigate surface dynamics
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