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Fred A. Stevie
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Journal Articles

Analysis of furnace contamination on superconducting radio frequency niobium using secondary-ion mass spectrometry

Jonathan W. Angle, Eric M. Lechner, Charles E. Reece, Fred A. Stevie, Michael J. Kelley
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 034005 (2023)
https://doi.org/10.1116/6.0002624
Published: May 2023
View article titled, Analysis of furnace contamination on superconducting radio frequency niobium using secondary-ion mass spectrometry
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Includes: Supplementary data
Journal Articles

Improved quantitation of SIMS depth profile measurements of niobium via sample holder design improvements and characterization of grain orientation effects

Jonathan W. Angle, Eric M. Lechner, Ari D. Palczewski, Charles E. Reece, Fred A. Stevie, Michael J. Kelley
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 40, 024003 (2022)
https://doi.org/10.1116/6.0001741
Published: March 2022
View article titled, Improved quantitation of SIMS depth profile measurements of niobium via sample holder design improvements and characterization of grain orientation effects
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Journal Articles

Enhanced focused ion beam milling with use of nested raster patterns

Roberto Garcia, Lucille A. Giannuzzi, Fred A. Stevie, Phillip Strader
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 40, 014002 (2022)
https://doi.org/10.1116/6.0001411
Published: January 2022
View article titled, Enhanced focused ion beam milling with use of nested raster patterns
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Journal Articles

Advances in secondary ion mass spectrometry for N-doped niobium

Jonathan W. Angle, Ari D. Palczewski, Charles E. Reece, Fred A. Stevie, Michael J. Kelley
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 39, 024004 (2021)
https://doi.org/10.1116/6.0000848
Published: March 2021
View article titled, Advances in secondary ion mass spectrometry for N-doped niobium
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Journal Articles

Introduction to x-ray photoelectron spectroscopy

Fred A. Stevie, Carrie L. Donley
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 063204 (2020)
https://doi.org/10.1116/6.0000412
Published: September 2020
View article titled, Introduction to x-ray photoelectron spectroscopy
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Journal Articles

Sample handling, preparation and mounting for XPS and other surface analytical techniques

Fred A. Stevie, Roberto Garcia, Jeffrey Shallenberger, John G. Newman, Carrie L. Donley
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 063202 (2020)
https://doi.org/10.1116/6.0000421
Published: September 2020
View article titled, Sample handling, preparation and mounting for XPS and other surface analytical techniques
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Journal Articles

Electron backscatter diffraction of Nb3Sn coated niobium: Revealing structure as a function of depth

Jay Tuggle, Uttar Pudasaini, Jonathan Angle, Grigory Eremeev, Charlie E. Reece, Fred A. Stevie, Michael J. Kelley
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 37, 052901 (2019)
https://doi.org/10.1116/1.5096338
Published: August 2019
View article titled, Electron backscatter diffraction of Nb<sub>3</sub>Sn coated niobium: Revealing structure as a function of depth
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Journal Articles

Secondary ion mass spectrometry for superconducting radiofrequency cavity materials

Jay Tuggle, Uttar Pudasaini, Fred A. Stevie, Michael J. Kelley, Ari D. Palczewski, Charlie E. Reece
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 052907 (2018)
https://doi.org/10.1116/1.5041093
Published: September 2018
View article titled, Secondary ion mass spectrometry for superconducting radiofrequency cavity materials
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Journal Articles

Quantification of organic materials by ion implantation

Chuanzhen Zhou, Fred A. Stevie, Stephen C. Smith
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 03F115 (2018)
https://doi.org/10.1116/1.5011735
Published: February 2018
View article titled, Quantification of organic materials by ion implantation
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Journal Articles

ToF-SIMS analysis of ion implanted standard to quantify insecticide in mosquito netting with cesium and argon gas cluster sputtering beams

Chuanzhen Zhou, Fred A. Stevie, Stephen C. Smith, Derk Rading, Julia Zakel
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 03F111 (2018)
https://doi.org/10.1116/1.5011751
Published: February 2018
View article titled, ToF-SIMS analysis of ion implanted standard to quantify insecticide in mosquito netting with cesium and argon gas cluster sputtering beams
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Journal Articles

ToF-SIMS quantification of bromine based insecticide in mosquito netting

Chuanzhen Zhou, Fred A. Stevie, Stephen C. Smith
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 35, 031802 (2017)
https://doi.org/10.1116/1.4983098
Published: May 2017
View article titled, ToF-SIMS quantification of bromine based insecticide in mosquito netting
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Journal Articles

Method for quantification of insecticide in mosquito netting using ion implantation and ToF-SIMS analysis

Chuanzhen Zhou, Fred A. Stevie, Stephen C. Smith
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 34, 03H107 (2016)
https://doi.org/10.1116/1.4940394
Published: January 2016
View article titled, Method for quantification of insecticide in mosquito netting using ion implantation and ToF-SIMS analysis
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Journal Articles

SIMS measurement of hydrogen and deuterium detection limits in silicon: Comparison of different SIMS instrumentation

Fred A. Stevie, Chaunzhen Zhou, Marinus Hopstaken, Michael Saccomanno, Zhichun Zhang, Andrew Turansky
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 34, 03H103 (2016)
https://doi.org/10.1116/1.4940151
Published: January 2016
View article titled, SIMS measurement of hydrogen and deuterium detection limits in silicon: Comparison of different SIMS instrumentation
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Journal Articles

TOF SIMS analyses of stray Ga during FIB milling

Christopher Santeufemio, Brian P. Gorman, Chuanzhen Zhou, Lucille A. Giannuzzi, Fred A. Stevie
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 31, 06F108 (2013)
https://doi.org/10.1116/1.4825403
Published: October 2013
View article titled, TOF SIMS analyses of stray Ga during FIB milling
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Journal Articles

Tailoring of electron and hole energies in strained GaAsP/AlGaAs quantum wells using fluorine‐impurity‐induced layer disordering

Utpal Das, Steve Davis, Ramu V. Ramaswamy, Fred A. Stevie
Journal: Applied Physics Letters
Appl. Phys. Lett. 60, 210–212 (1992)
https://doi.org/10.1063/1.106966
Published: January 1992
View article titled, Tailoring of electron and hole energies in strained GaAsP/AlGaAs quantum wells using fluorine‐impurity‐induced layer disordering
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Journal Articles

Tailoring of electron and hole energies in strained GaAsP/AlGaAs quantum wells using fluorine impurity induced layer disordering

Utpal Das, Steven Davis, Jia‐T. Hsu, Ramu V. Ramaswamy, Fred A. Stevie
Journal: AIP Conference Proceedings
AIP Conf. Proc. 227, 195–198 (1991)
https://doi.org/10.1063/1.40652
Published: May 1991
View article titled, Tailoring of electron and hole energies in strained GaAsP/AlGaAs quantum wells using fluorine impurity induced layer disordering
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