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Journal Articles

Grating metrology for X-ray and V-UV synchrotron beamlines at SOLEIL

M. Thomasset, J. Dvorak, S. Brochet, D. Dennetiere, F. Polack
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 90, 021714 (2019)
https://doi.org/10.1063/1.5055284
Published: February 2019
View article titled, Grating metrology for X-ray and V-UV synchrotron beamlines at SOLEIL
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Journal Articles

Computation of intensity and polarization state of diffracted fields from reflective gratings in conical geometry

A. Akarid, F. Polack
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 90, 021709 (2019)
https://doi.org/10.1063/1.5057742
Published: February 2019
View article titled, Computation of intensity and polarization state of diffracted fields from reflective gratings in conical geometry
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Journal Articles

Surface shape determination with a stitching Michelson interferometer and accuracy evaluation

F. Polack, M. Thomasset, S. Brochet, D. Dennetiere
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 90, 021708 (2019)
https://doi.org/10.1063/1.5061930
Published: February 2019
View article titled, Surface shape determination with a stitching Michelson interferometer and accuracy evaluation
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Journal Articles

Towards a free electron laser using laser plasma acceleration on COXINEL

M. E. Couprie, T. André, F. Blache, F. Bouvet, F. Briquez, D. Dennetière, Y. Dietrich, C. de Oliviera, J. P. Duval, M. El Ajjouri, A. Ghaith, C. Herbeaux, N. Hubert, M. Khojoyan, C. Kitégi, M. Labat, N. Leclercq, A. Lestrade, A. Loulergue, O. Marcouillé, F. Marteau, D. Oumbarek, F. Polack, P. Rommeluère, M. Sebdaoui, K. Tavakoli, M. Valléau, I. A. Andriyash, C. Benabderrahmane, S. Corde, J. Gautier, J. P. Goddet, G. Lambert, B. Mahieu, K. Ta Phuoc, A. Tafzi, C. Thaury, S. Smartsev, V. Malka, E. Roussel, C. Evain, C. Szwaj, S. Bielawski
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2054, 030034 (2019)
https://doi.org/10.1063/1.5084597
Published: January 2019
View article titled, Towards a free electron laser using laser plasma acceleration on COXINEL
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Journal Articles

Cr/B4C multilayer mirrors: Study of interfaces and X-ray reflectance

C. Burcklen, R. Soufli, D. Dennetiere, F. Polack, B. Capitanio, E. Gullikson, E. Meltchakov, M. Thomasset, A. Jérome, S. de Rossi, F. Delmotte
Journal: Journal of Applied Physics
J. Appl. Phys. 119, 125307 (2016)
https://doi.org/10.1063/1.4944723
Published: March 2016
View article titled, Cr/B<sub>4</sub>C multilayer mirrors: Study of interfaces and X-ray reflectance
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Journal Articles

DEIMOS: A beamline dedicated to dichroism measurements in the 350–2500 eV energy range

P. Ohresser, E. Otero, F. Choueikani, K. Chen, S. Stanescu, F. Deschamps, T. Moreno, F. Polack, B. Lagarde, J.-P. Daguerre, F. Marteau, F. Scheurer, L. Joly, J.-P. Kappler, B. Muller, O. Bunau, Ph. Sainctavit
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 85, 013106 (2014)
https://doi.org/10.1063/1.4861191
Published: January 2014
View article titled, DEIMOS: A beamline dedicated to dichroism measurements in the 350–2500 eV energy range
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Journal Articles

The Scanning Nanoprobe Beamline Nanoscopium at Synchrotron Soleil

A. Somogyi, C. M. Kewish, F. Polack, T. Moreno
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1365, 57–60 (2011)
https://doi.org/10.1063/1.3625303
Published: September 2011
View article titled, The Scanning Nanoprobe Beamline Nanoscopium at Synchrotron Soleil
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Journal Articles

Nanoscopium: a Scanning Hard X‐ray Nanoprobe Beamline at Synchrotron Soleil

A. Somogyi, F. Polack, T. Moreno
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1234, 395–398 (2010)
https://doi.org/10.1063/1.3463222
Published: June 2010
View article titled, Nanoscopium: a Scanning Hard X‐ray Nanoprobe Beamline at Synchrotron Soleil
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Journal Articles

TEMPO: a New Insertion Device Beamline at SOLEIL for Time Resolved Photoelectron Spectroscopy Experiments on Solids and Interfaces

F. Polack, M. Silly, C. Chauvet, B. Lagarde, N. Bergeard, M. Izquierdo, O. Chubar, D. Krizmancic, M. Ribbens, J.‐P. Duval, C. Basset, S. Kubsky, F. Sirotti
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1234, 185–188 (2010)
https://doi.org/10.1063/1.3463169
Published: June 2010
View article titled, TEMPO: a New Insertion Device Beamline at SOLEIL for Time Resolved Photoelectron Spectroscopy Experiments on Solids and Interfaces
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Journal Articles

Advanced photoelectric effect experiment beamline at Elettra: A surface science laboratory coupled with Synchrotron Radiation

G. Panaccione, I. Vobornik, J. Fujii, D. Krizmancic, E. Annese, L. Giovanelli, F. Maccherozzi, F. Salvador, A. De Luisa, D. Benedetti, A. Gruden, P. Bertoch, F. Polack, D. Cocco, G. Sostero, B. Diviacco, M. Hochstrasser, U. Maier, D. Pescia, C. H. Back, T. Greber, J. Osterwalder, M. Galaktionov, M. Sancrotti, G. Rossi
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 80, 043105 (2009)
https://doi.org/10.1063/1.3119364
Published: April 2009
View article titled, Advanced photoelectric effect experiment beamline at Elettra: A surface science laboratory coupled with Synchrotron Radiation
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Journal Articles

A Fourier transform spectrometer without a beam splitter for the vacuum ultraviolet range: From the optical design to the first UV spectrum

N. de Oliveira, D. Joyeux, D. Phalippou, J. C. Rodier, F. Polack, M. Vervloet, L. Nahon
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 80, 043101 (2009)
https://doi.org/10.1063/1.3111452
Published: April 2009
View article titled, A Fourier transform spectrometer without a beam splitter for the vacuum ultraviolet range: From the optical design to the first UV spectrum
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Journal Articles

Chemical microanalysis by x‐ray microscopy near absorption edge with synchrotron radiation

F. Polack, S. Lowenthal, Y. Petroff, Y. Farge
Journal: Applied Physics Letters
Appl. Phys. Lett. 31, 785–787 (1977)
https://doi.org/10.1063/1.89519
Published: August 2008
View article titled, Chemical microanalysis by x‐ray microscopy near absorption edge with synchrotron radiation
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Journal Articles

A High Precision Scanning Control System For A VUV Fourier Transform Spectrometer

N. De Oliveira, D. Joyeux, D. Phalippou, J. C. Rodier, L. Nahon, F. Polack, M. Vervloët
Journal: AIP Conference Proceedings
AIP Conf. Proc. 879, 447–450 (2007)
https://doi.org/10.1063/1.2436095
Published: January 2007
View article titled, A High Precision Scanning Control System For A VUV Fourier Transform Spectrometer
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Journal Articles

Simulation and Optimization of Synchrotron Infrared Micro‐Spectroscopic Beamlines using Wave Optics Computation: ESRF and SOLEIL’s Cases

O. Chubar, J. Susini, M. Cotte, F. Polack, B. Lagarde, K. Scheidt, P. Elleaume, P. Dumas
Journal: AIP Conference Proceedings
AIP Conf. Proc. 879, 607–610 (2007)
https://doi.org/10.1063/1.2436134
Published: January 2007
View article titled, Simulation and Optimization of Synchrotron Infrared Micro‐Spectroscopic Beamlines using Wave Optics Computation: ESRF and SOLEIL’s Cases
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Journal Articles

The DiagOn : an Undulator Diagnostic for SOLEIL Low Energy Beamlines

K. Desjardins, S. Hustache, F. Polack, T. Moreno, M. Idir, J.‐M. Dubuisson, J.‐P. Daguerre, J.‐L. Giorgetta, S. Thoraud, F. Delmotte, M.‐F. Ravet‐Krill
Journal: AIP Conference Proceedings
AIP Conf. Proc. 879, 1101–1104 (2007)
https://doi.org/10.1063/1.2436255
Published: January 2007
View article titled, The DiagOn : an Undulator Diagnostic for SOLEIL Low Energy Beamlines
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Journal Articles

Highly sensitive detection technique of buried defects in extreme ultraviolet masks using at-wavelength scanning dark-field microscopy

V. Farys, P. Schiavone, F. Polack, M. Idir, M. Bertolo, A. Bianco, S. La Rosa, G. Cautero, C. Vannuffel, E. Quesnel, V. Muffato
Journal: Applied Physics Letters
Appl. Phys. Lett. 87, 024102 (2005)
https://doi.org/10.1063/1.1984097
Published: July 2005
View article titled, Highly sensitive detection technique of buried defects in extreme ultraviolet masks using at-wavelength scanning dark-field microscopy
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Journal Articles

Interferometric soft X-ray index measurements: Progress of system design and recent results

D. Joyeux, F. Polack, D. Phalippou
Journal: AIP Conference Proceedings
AIP Conf. Proc. 507, 641–646 (2000)
https://doi.org/10.1063/1.1291224
Published: May 2000
View article titled, Interferometric soft X-ray index measurements: Progress of system design and recent results
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Journal Articles

A transmission x-ray microscope based on secondary-electron imaging

R. N. Watts, S. Liang, Z. H. Levine, T. B. Lucatorto, F. Polack, M. R. Scheinfein
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 68, 3464–3476 (1997)
https://doi.org/10.1063/1.1148309
Published: September 1997
View article titled, A transmission x-ray microscope based on secondary-electron imaging
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Journal Articles

EUV and soft x‐ray transmission microscope (abstract)

R. N. Watts, T. B. Lucatorto, S. T. Liang, F. Polack, M. R. Scheinfein
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 67, 3359–3360 (1996)
https://doi.org/10.1063/1.1147388
Published: September 1996
View article titled, EUV and soft x‐ray transmission microscope (abstract)
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Journal Articles

Control at 11.4 nm of an XUV Schwarzschild objective

R. Mercier, F. Polack, P. Fournet, G. Tissot, J. P. Marioge
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 66, 2184–2186 (1995)
https://doi.org/10.1063/1.1145699
Published: February 1995
View article titled, Control at 11.4 nm of an XUV Schwarzschild objective
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