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Journal Articles

Strain-induced structural transition of rutile type ReO2 epitaxial thin films

Shunsuke Shibata, Yasushi Hirose, Akira Chikamatsu, Eiji Ikenaga, Tetsuya Hasegawa
Journal: Applied Physics Letters
Appl. Phys. Lett. 117, 111903 (2020)
https://doi.org/10.1063/5.0006373
Published: September 2020
View article titled, Strain-induced structural transition of rutile type ReO<sub>2</sub> epitaxial thin films
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Includes: Supplementary data
Journal Articles

Change in chemical bonding state by thermal treatment in MgO-based magnetic tunnel junction observed by angle-resolved hard X-ray photoelectron spectroscopy

Masaaki Niwa, Akira Yasui, Eiji Ikenaga, Hiroaki Honjo, Shoji Ikeda, Tetsuya Nakamura, Tetsuo Endoh
Journal: Journal of Applied Physics
J. Appl. Phys. 125, 203903 (2019)
https://doi.org/10.1063/1.5094067
Published: May 2019
View article titled, Change in chemical bonding state by thermal treatment in MgO-based magnetic tunnel junction observed by angle-resolved hard X-ray photoelectron spectroscopy
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Includes: Supplementary data
Journal Articles

Hard x-ray photoemission study of oxidation states of Ti underlayer in Fe/Ti film system

Akito Takashima, Eiji Ikenaga, Takayuki Muro, Akio Kawabata, Tomo Murakami, Mizuhisa Nihei, Naoki Yokoyama
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 35, 021507 (2017)
https://doi.org/10.1116/1.4973964
Published: January 2017
View article titled, Hard x-ray photoemission study of oxidation states of Ti underlayer in Fe/Ti film system
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Journal Articles

Epitaxial growth and electronic structure of oxyhydride SrVO2H thin films

Tsukasa Katayama, Akira Chikamatsu, Keisuke Yamada, Kei Shigematsu, Tomoya Onozuka, Makoto Minohara, Hiroshi Kumigashira, Eiji Ikenaga, Tetsuya Hasegawa
Journal: Journal of Applied Physics
J. Appl. Phys. 120, 085305 (2016)
https://doi.org/10.1063/1.4961446
Published: August 2016
View article titled, Epitaxial growth and electronic structure of oxyhydride SrVO<sub>2</sub>H thin films
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Includes: Supplementary data
Journal Articles

Publisher's Note: “Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn–Ga films” [Appl. Phys. Lett. 106 , 052402 (2015)]

Carlos E. ViolBarbosa, Siham Ouardi, Takahide Kubota, Shigemi Mizukami, Gerhard H. Fecher, Terunobu Miyazaki, Eiji Ikenaga, Claudia Felser
Journal: Applied Physics Letters
Appl. Phys. Lett. 106, 149901 (2015)
https://doi.org/10.1063/1.4917272
Published: April 2015
View article titled, Publisher's Note: “Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn–Ga films” [Appl. Phys. Lett. 106 , 052402 (2015)]
Open the PDF for Publisher's Note: “Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn–Ga films” [Appl. Phys. Lett. 106 , 052402 (2015)] in another window
Journal Articles

Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn–Ga films

Carlos E. ViolBarbosa, Siham Ouardi, Takahide Kubota, Shigemi Mizukami, Gerhard H. Fecher, Terunobu Miyazaki, Eiji Ikenaga, Claudia Felser
Journal: Applied Physics Letters
Appl. Phys. Lett. 106, 052402 (2015)
https://doi.org/10.1063/1.4907537
Published: February 2015
View article titled, Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn–Ga films
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Journal Articles

In situ study of an oxidation reaction on a Pt/C electrode by ambient pressure hard X-ray photoelectron spectroscopy

Yasumasa Takagi, Heng Wang, Yohei Uemura, Eiji Ikenaga, Oki Sekizawa, Tomoya Uruga, Haruhiko Ohashi, Yasunori Senba, Hirokatsu Yumoto, Hiroshi Yamazaki, Shunji Goto, Mizuki Tada, Yasuhiro Iwasawa, Toshihiko Yokoyama
Journal: Applied Physics Letters
Appl. Phys. Lett. 105, 131602 (2014)
https://doi.org/10.1063/1.4897007
Published: October 2014
View article titled, <em>In situ</em> study of an oxidation reaction on a Pt/C electrode by ambient pressure hard X-ray photoelectron spectroscopy
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Includes: Supplementary data
Journal Articles

Electronic and crystalline structures of zero band-gap LuPdBi thin films grown epitaxially on MgO(100)

Rong Shan, Siham Ouardi, Gerhard H. Fecher, Li Gao, Andrew Kellock, Kevin P. Roche, Mahesh G. Samant, Carlos E. ViolBarbosa, Eiji Ikenaga, Claudia Felser, Stuart S. P. Parkin
Journal: Applied Physics Letters
Appl. Phys. Lett. 102, 172401 (2013)
https://doi.org/10.1063/1.4802795
Published: April 2013
View article titled, Electronic and crystalline structures of <em>zero band-gap</em> LuPdBi thin films grown epitaxially on MgO(100)
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Journal Articles

Stoichiometry dependent phase transition in Mn-Co-Ga-based thin films: From cubic in-plane, soft magnetized to tetragonal perpendicular, hard magnetized

Siham Ouardi, Takahide Kubota, Gerhard H. Fecher, Rolf Stinshoff, Shigemi Mizukami, Terunobu Miyazaki, Eiji Ikenaga, Claudia Felser
Journal: Applied Physics Letters
Appl. Phys. Lett. 101, 242406 (2012)
https://doi.org/10.1063/1.4770303
Published: December 2012
View article titled, Stoichiometry dependent phase transition in Mn-Co-Ga-based thin films: From cubic in-plane, soft magnetized to tetragonal perpendicular, hard magnetized
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Journal Articles

A p-type Heusler compound: Growth, structure, and properties of epitaxial thin NiYBi films on MgO(100)

Rong Shan, Siham Ouardi, Gerhard H. Fecher, Li Gao, Andrew Kellock, Andrei Gloskovskii, Carlos E. ViolBarbosa, Eiji Ikenaga, Claudia Felser, Stuart S. P. Parkin
Journal: Applied Physics Letters
Appl. Phys. Lett. 101, 212102 (2012)
https://doi.org/10.1063/1.4764520
Published: November 2012
View article titled, A <em>p</em>-type Heusler compound: Growth, structure, and properties of epitaxial thin NiYBi films on MgO(100)
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Journal Articles

Band alignment of InGaZnO4/Si interface by hard x-ray photoelectron spectroscopy

Kyeongmi Lee, Kenji Nomura, Hiroshi Yanagi, Toshio Kamiya, Eiji Ikenaga, Takeharu Sugiyama, Keisuke Kobayashi, Hideo Hosono
Journal: Journal of Applied Physics
J. Appl. Phys. 112, 033713 (2012)
https://doi.org/10.1063/1.4744983
Published: August 2012
View article titled, Band alignment of InGaZnO<sub>4</sub>/Si interface by hard x-ray photoelectron spectroscopy
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Journal Articles

Electronic structure and linear magnetoresistance of the gapless topological insulator PtLuSb

Chandra Shekhar, Siham Ouardi, Gerhard H. Fecher, Ajaya Kumar Nayak, Claudia Felser, Eiji Ikenaga
Journal: Applied Physics Letters
Appl. Phys. Lett. 100, 252109 (2012)
https://doi.org/10.1063/1.4730387
Published: June 2012
View article titled, Electronic structure and linear magnetoresistance of the gapless topological insulator PtLuSb
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Journal Articles

Electronic structure and symmetry of valence states of epitaxial NiTiSn and NiZr0.5Hf0.5Sn thin films by hard x-ray photoelectron spectroscopy

Xeniya Kozina, Tino Jaeger, Siham Ouardi, Andrei Gloskowskij, Gregory Stryganyuk, Gerhard Jakob, Takeharu Sugiyama, Eiji Ikenaga, Gerhard H. Fecher, Claudia Felser
Journal: Applied Physics Letters
Appl. Phys. Lett. 99, 221908 (2011)
https://doi.org/10.1063/1.3665621
Published: November 2011
View article titled, Electronic structure and symmetry of valence states of epitaxial NiTiSn and NiZr<sub>0.5</sub>Hf<sub>0.5</sub>Sn thin films by hard x-ray photoelectron spectroscopy
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Journal Articles

Transport and thermal properties of single- and polycrystalline NiZr0.5Hf0.5Sn

Siham Ouardi, Gerhard H. Fecher, Claudia Felser, Christian G. F. Blum, Dirk Bombor, Christian Hess, Sabine Wurmehl, Bernd Büchner, Eiji Ikenaga
Journal: Applied Physics Letters
Appl. Phys. Lett. 99, 152112 (2011)
https://doi.org/10.1063/1.3651484
Published: October 2011
View article titled, Transport and thermal properties of single- and polycrystalline NiZr<sub>0.5</sub>Hf<sub>0.5</sub>Sn
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Journal Articles

Depth analysis of subgap electronic states in amorphous oxide semiconductor, a-In-Ga-Zn-O, studied by hard x-ray photoelectron spectroscopy

Kenji Nomura, Toshio Kamiya, Eiji Ikenaga, Hiroshi Yanagi, Keisuke Kobayashi, Hideo Hosono
Journal: Journal of Applied Physics
J. Appl. Phys. 109, 073726 (2011)
https://doi.org/10.1063/1.3560769
Published: April 2011
View article titled, Depth analysis of subgap electronic states in amorphous oxide semiconductor, a-In-Ga-Zn-O, studied by hard x-ray photoelectron spectroscopy
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Journal Articles

Nondestructive estimation of depletion layer profile in Nb-doped SrTiO 3 / ( La , Ba ) MnO 3 heterojunction diode structure by hard x-ray photoemission spectroscopy

Hidekazu Tanaka, Issei Satoh, Teruo Kanki, Eiji Ikenaga, Masaaki Kobata, Jung Jin Kim, Shigenori Ueda, Keisuke Kobayashi
Journal: Applied Physics Letters
Appl. Phys. Lett. 98, 133505 (2011)
https://doi.org/10.1063/1.3571454
Published: March 2011
View article titled, Nondestructive estimation of depletion layer profile in Nb-doped SrTiO 3 / ( La , Ba ) MnO 3 heterojunction diode structure by hard x-ray photoemission spectroscopy
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Journal Articles

Thermoelectric properties and electronic structure of substituted Heusler compounds: NiTi 0.3 − x Sc x Zr 0.35 Hf 0.35 Sn

Siham Ouardi, Gerhard H. Fecher, Benjamin Balke, Michael Schwall, Xeniya Kozina, Gregory Stryganyuk, Claudia Felser, Eiji Ikenaga, Yoshiyuki Yamashita, Shigenori Ueda, Keisuke Kobayashi
Journal: Applied Physics Letters
Appl. Phys. Lett. 97, 252113 (2010)
https://doi.org/10.1063/1.3531662
Published: December 2010
View article titled, Thermoelectric properties and electronic structure of substituted Heusler compounds: NiTi 0.3 − x Sc x Zr 0.35 Hf 0.35 Sn
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Journal Articles

Erratum: “Angle-resolved phototelectron study on the structures of silicon nitride films and Si 3 N 4 / Si interfaces formed using nitrogen-hydrogen radicals” [J. Appl. Phys. 104, 114112 (2008)]

Takashi Aratani, Masaaki Higuchi, Shigetoshi Sugawa, Eiji Ikenaga, Jiro Ushio, Hiroshi Nohira, Tomoyuki Suwa, Akinobu Teramoto, Tadahiro Ohimi, Takeo Hattori
Journal: Journal of Applied Physics
J. Appl. Phys. 107, 069902 (2010)
https://doi.org/10.1063/1.3366705
Published: March 2010
View article titled, Erratum: “Angle-resolved phototelectron study on the structures of silicon nitride films and Si 3 N 4 / Si interfaces formed using nitrogen-hydrogen radicals” [J. Appl. Phys. 104, 114112 (2008)]
Open the PDF for Erratum: “Angle-resolved phototelectron study on the structures of silicon nitride films and Si 3 N 4 / Si interfaces formed using nitrogen-hydrogen radicals” [J. Appl. Phys. 104, 114112 (2008)] in another window
Journal Articles

A nondestructive analysis of the B diffusion in Ta–CoFeB–MgO–CoFeB–Ta magnetic tunnel junctions by hard x-ray photoemission

Xeniya Kozina, Siham Ouardi, Benjamin Balke, Gregory Stryganyuk, Gerhard H. Fecher, Claudia Felser, Shoji Ikeda, Hideo Ohno, Eiji Ikenaga
Journal: Applied Physics Letters
Appl. Phys. Lett. 96, 072105 (2010)
https://doi.org/10.1063/1.3309702
Published: February 2010
View article titled, A nondestructive analysis of the B diffusion in Ta–CoFeB–MgO–CoFeB–Ta magnetic tunnel junctions by hard x-ray photoemission
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Journal Articles

Angle-resolved photoelectron study on the structures of silicon nitride films and Si 3 N 4 / Si interfaces formed using nitrogen-hydrogen radicals

Takashi Aratani, Masaaki Higuchi, Shigetoshi Sugawa, Eiji Ikenaga, Jiro Ushio, Hiroshi Nohira, Tomoyuki Suwa, Akinobu Teramoto, Tadahiro Ohmi, Takeo Hattori
Journal: Journal of Applied Physics
J. Appl. Phys. 104, 114112 (2008)
https://doi.org/10.1063/1.3002418
Published: December 2008
View article titled, Angle-resolved photoelectron study on the structures of silicon nitride films and Si 3 N 4 / Si interfaces formed using nitrogen-hydrogen radicals
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