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E. V. Skorokhodov
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Journal Articles

Near-infrared stimulated emission from indium-rich InGaN layers grown by plasma-assisted MBE

D. N. Lobanov, K. E. Kudryavtsev, M. I. Kalinnikov, L. V. Krasilnikova, P. A. Yunin, E. V. Skorokhodov, M. V. Shaleev, A. V. Novikov, B. A. Andreev, Z. F. Krasilnik
Journal: Applied Physics Letters
Appl. Phys. Lett. 118, 151902 (2021)
https://doi.org/10.1063/5.0047674
Published: April 2021
View article titled, Near-infrared stimulated emission from indium-rich InGaN layers grown by plasma-assisted MBE
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Journal Articles

Lorentz transmission electron microscopy of ferromagnetic nanodisks

D. A. Tatarskiy, E. V. Skorokhodov, N. S. Gusev, V. Yu. Mikhailovskii, Yu. V. Petrov, S. A. Gusev
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2064, 020005 (2019)
https://doi.org/10.1063/1.5087661
Published: January 2019
View article titled, Lorentz transmission electron microscopy of ferromagnetic nanodisks
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Journal Articles

Ferromagnetic resonance force microscopy of individual domain wall

A. Volodin, C. Van Haesendonck, E. V. Skorokhodov, R. V. Gorev, V. L. Mironov
Journal: Applied Physics Letters
Appl. Phys. Lett. 113, 122407 (2018)
https://doi.org/10.1063/1.5040072
Published: September 2018
View article titled, Ferromagnetic resonance force microscopy of individual domain wall
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Journal Articles

Monolithically integrated InGaAs/GaAs/AlGaAs quantum well laser grown by MOCVD on exact Ge/Si(001) substrate

V. Ya. Aleshkin, N. V. Baidus, A. A. Dubinov, A. G. Fefelov, Z. F. Krasilnik, K. E. Kudryavtsev, S. M. Nekorkin, A. V. Novikov, D. A. Pavlov, I. V. Samartsev, E. V. Skorokhodov, M. V. Shaleev, A. A. Sushkov, A. N. Yablonskiy, P. A. Yunin, D. V. Yurasov
Journal: Applied Physics Letters
Appl. Phys. Lett. 109, 061111 (2016)
https://doi.org/10.1063/1.4961059
Published: August 2016
View article titled, Monolithically integrated InGaAs/GaAs/AlGaAs quantum well laser grown by MOCVD on exact Ge/Si(001) substrate
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Journal Articles

Sub-micrometer resolution proximity X-ray microscope with digital image registration

N. I. Chkhalo, A. E. Pestov, N. N. Salashchenko, A. V. Sherbakov, E. V. Skorokhodov, M. V. Svechnikov
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 86, 063701 (2015)
https://doi.org/10.1063/1.4921849
Published: June 2015
View article titled, Sub-micrometer resolution proximity X-ray microscope with digital image registration
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