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Journal Articles

Grating metrology for X-ray and V-UV synchrotron beamlines at SOLEIL

M. Thomasset, J. Dvorak, S. Brochet, D. Dennetiere, F. Polack
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 90, 021714 (2019)
https://doi.org/10.1063/1.5055284
Published: February 2019
View article titled, Grating metrology for X-ray and V-UV synchrotron beamlines at SOLEIL
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Journal Articles

Surface shape determination with a stitching Michelson interferometer and accuracy evaluation

F. Polack, M. Thomasset, S. Brochet, D. Dennetiere
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 90, 021708 (2019)
https://doi.org/10.1063/1.5061930
Published: February 2019
View article titled, Surface shape determination with a stitching Michelson interferometer and accuracy evaluation
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Journal Articles

Towards a free electron laser using laser plasma acceleration on COXINEL

M. E. Couprie, T. André, F. Blache, F. Bouvet, F. Briquez, D. Dennetière, Y. Dietrich, C. de Oliviera, J. P. Duval, M. El Ajjouri, A. Ghaith, C. Herbeaux, N. Hubert, M. Khojoyan, C. Kitégi, M. Labat, N. Leclercq, A. Lestrade, A. Loulergue, O. Marcouillé, F. Marteau, D. Oumbarek, F. Polack, P. Rommeluère, M. Sebdaoui, K. Tavakoli, M. Valléau, I. A. Andriyash, C. Benabderrahmane, S. Corde, J. Gautier, J. P. Goddet, G. Lambert, B. Mahieu, K. Ta Phuoc, A. Tafzi, C. Thaury, S. Smartsev, V. Malka, E. Roussel, C. Evain, C. Szwaj, S. Bielawski
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2054, 030034 (2019)
https://doi.org/10.1063/1.5084597
Published: January 2019
View article titled, Towards a free electron laser using laser plasma acceleration on COXINEL
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Journal Articles

Cr/B4C multilayer mirrors: Study of interfaces and X-ray reflectance

C. Burcklen, R. Soufli, D. Dennetiere, F. Polack, B. Capitanio, E. Gullikson, E. Meltchakov, M. Thomasset, A. Jérome, S. de Rossi, F. Delmotte
Journal: Journal of Applied Physics
J. Appl. Phys. 119, 125307 (2016)
https://doi.org/10.1063/1.4944723
Published: March 2016
View article titled, Cr/B<sub>4</sub>C multilayer mirrors: Study of interfaces and X-ray reflectance
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Journal Articles

Applications of non-periodic multilayer optics for high-resolution x-ray microscopes below 30 keV

Ph. Troussel, D. Dennetiere, A. Rousseau, S. Darbon, P. Høghøj, S. Hedacq, M. Krumrey
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 83, 10E533 (2012)
https://doi.org/10.1063/1.4738661
Published: August 2012
View article titled, Applications of non-periodic multilayer optics for high-resolution x-ray microscopes below 30 keV
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