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Journal Articles

Uphill phosphorus diffusion in carbon co-implanted silicon

P. Dumas, S. Duguay, F. Hilario, A. Gauthier, D. Blavette

J. Appl. Phys. 131, 115102 (2022)

https://doi.org/10.1063/5.0074682

Published: March 2022

View article titled, Uphill phosphorus diffusion in carbon co-implanted silicon

Journal Articles

Low temperature carbon co-implantation in silicon: Defects suppression and diffusion modeling

P. Dumas, P.-L. Julliard, J. Borrel, S. Duguay, F. Hilario, F. Deprat, V. Lu, W. Zhao, W Zou, E. Arevalo, D. Blavette

J. Appl. Phys. 129, 195706 (2021)

https://doi.org/10.1063/5.0049782

Published: May 2021

View article titled, Low temperature carbon co-implantation in silicon: Defects suppression and diffusion modeling

Journal Articles

A photonic atom probe coupling 3D atomic scale analysis with in situ photoluminescence spectroscopy

J. Houard, A. Normand, E. Di Russo, C. Bacchi, P. Dalapati, G. Beainy, S. Moldovan, G. Da Costa, F. Delaroche, C. Vaudolon, J. M. Chauveau, M. Hugues, D. Blavette, B. Deconihout, A. Vella, F. Vurpillot, L. Rigutti

Rev. Sci. Instrum. 91, 083704 (2020)

https://doi.org/10.1063/5.0012359

Published: August 2020

View article titled, A photonic atom probe coupling 3D atomic scale analysis with in situ photoluminescence spectroscopy

Journal Articles

Compositional accuracy in atom probe tomography analyses performed on III-N light emitting diodes

E. Di Russo, N. Cherkashin, M. Korytov, A. E. Nikolaev, A. V. Sakharov, A. F. Tsatsulnikov, B. Bonef, I. Blum, J. Houard, G. Da Costa, D. Blavette, L. Rigutti

J. Appl. Phys. 126, 124307 (2019)

https://doi.org/10.1063/1.5113799

Published: September 2019

View article titled, Compositional accuracy in atom probe tomography analyses performed on III-N light emitting diodes

Includes: Supplementary data

Journal Articles

3D atomic-scale investigation of carbon segregation in phosphorus co-implanted silicon

P. Dumas, S. Duguay, J. Borrel, A. Gauthier, E. Ghegin, D. Blavette

Appl. Phys. Lett. 115, 132103 (2019)

https://doi.org/10.1063/1.5121629

Published: September 2019

View article titled, 3D atomic-scale investigation of carbon segregation in phosphorus co-implanted silicon

Journal Articles

Optical shaping of a nano-scale tip by femtosecond laser assisted field evaporation

E. Di Russo, J. Houard, V. Langolff, S. Moldovan, L. Rigutti, B. Deconihout, D. Blavette, J. Bogdanowicz, A. Vella

Appl. Phys. Lett. 112, 143103 (2018)

https://doi.org/10.1063/1.5022031

Published: April 2018

View article titled, Optical shaping of a nano-scale tip by femtosecond laser assisted field evaporation

Includes: Supplementary data

Journal Articles

Three-dimensional atomic-scale investigation of ZnO-Mg_xZn_1−xO m-plane heterostructures

E. Di Russo, L. Mancini, F. Moyon, S. Moldovan, J. Houard, F. H. Julien, M. Tchernycheva, J. M. Chauveau, M. Hugues, G. Da Costa, I. Blum, W. Lefebvre, D. Blavette, L. Rigutti

Appl. Phys. Lett. 111, 032108 (2017)

https://doi.org/10.1063/1.4994659

Published: July 2017

View article titled, Three-dimensional atomic-scale investigation of ZnO-MgxZn1−xO m-plane heterostructures

Includes: Supplementary data

Journal Articles

Kinetic theory of diffusion-limited nucleation

T. Philippe, M. Bonvalet, D. Blavette

J. Chem. Phys. 144, 204501 (2016)

https://doi.org/10.1063/1.4950878

Published: May 2016

View article titled, Kinetic theory of diffusion-limited nucleation

Journal Articles

Investigation of dopant clustering and segregation to defects in semiconductors using atom probe tomography

D. Blavette, S. Duguay

J. Appl. Phys. 119, 181502 (2016)

https://doi.org/10.1063/1.4948238

Published: April 2016

View article titled, Investigation of dopant clustering and segregation to defects in semiconductors using atom probe tomography

Journal Articles

Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al_0.25Ga_0.75N

L. Rigutti, L. Mancini, D. Hernández-Maldonado, W. Lefebvre, E. Giraud, R. Butté, J. F. Carlin, N. Grandjean, D. Blavette, F. Vurpillot

J. Appl. Phys. 119, 105704 (2016)

https://doi.org/10.1063/1.4943612

Published: March 2016

View article titled, Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N

Includes: Supplementary data

Journal Articles

Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques

A. Grenier, S. Duguay, J. P. Barnes, R. Serra, N. Rolland, G. Audoit, P. Morin, P. Gouraud, D. Cooper, D. Blavette, F. Vurpillot

Appl. Phys. Lett. 106, 213102 (2015)

https://doi.org/10.1063/1.4921352

Published: May 2015

View article titled, Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques

Journal Articles

Critical nucleus composition in a multicomponent system

T. Philippe, D. Blavette, P. W. Voorhees

J. Chem. Phys. 141, 124306 (2014)

https://doi.org/10.1063/1.4896222

Published: September 2014

View article titled, Critical nucleus composition in a multicomponent system

Journal Articles

The early stage of formation of self-organized nanocolumns in thin films: Monte Carlo simulations versus atomic-scale observations in Ge-Mn

I. Mouton, E. Talbot, C. Pareige, R. Lardé, D. Blavette

J. Appl. Phys. 115, 053515 (2014)

https://doi.org/10.1063/1.4864271

Published: February 2014

View article titled, The early stage of formation of self-organized nanocolumns in thin films: Monte Carlo simulations versus atomic-scale observations in Ge-Mn

Journal Articles

Advance in multi-hit detection and quantization in atom probe tomography

G. Da Costa, H. Wang, S. Duguay, A. Bostel, D. Blavette, B. Deconihout

Rev. Sci. Instrum. 83, 123709 (2012)

https://doi.org/10.1063/1.4770120

Published: December 2012

View article titled, Advance in multi-hit detection and quantization in atom probe tomography

Journal Articles

Composition and morphology of self-organized Mn-rich nanocolumns embedded in Ge: Correlation with the magnetic properties

I. Mouton, R. Lardé, E. Talbot, E. Cadel, C. Genevois, D. Blavette, V. Baltz, E. Prestat, P. Bayle-Guillemaud, A. Barski, M. Jamet

J. Appl. Phys. 112, 113918 (2012)

https://doi.org/10.1063/1.4768723

Published: December 2012

View article titled, Composition and morphology of self-organized Mn-rich nanocolumns embedded in Ge: Correlation with the magnetic properties

Journal Articles

Temperature stability of (Pt/Co)₃/IrMn multilayers

L. Lechevallier, A. Zarefy, F. Letellier, R. Lardé, D. Blavette, J. M. Le Breton, V. Baltz, B. Rodmacq, B. Dieny

J. Appl. Phys. 112, 043904 (2012)

https://doi.org/10.1063/1.4745033

Published: August 2012

View article titled, Temperature stability of (Pt/Co)3/IrMn multilayers

Journal Articles

Minimum free-energy pathway of nucleation

T. Philippe, D. Blavette

J. Chem. Phys. 135, 134508 (2011)

https://doi.org/10.1063/1.3644935

Published: October 2011

View article titled, Minimum free-energy pathway of nucleation

Journal Articles

Atomic scale evidence of the suppression of boron clustering in implanted silicon by carbon coimplantation

T. Philippe, S. Duguay, D. Mathiot, D. Blavette

J. Appl. Phys. 109, 023501 (2011)

https://doi.org/10.1063/1.3533416

Published: January 2011

View article titled, Atomic scale evidence of the suppression of boron clustering in implanted silicon by carbon coimplantation

Journal Articles

Direct imaging of boron segregation to extended defects in silicon

S. Duguay, T. Philippe, F. Cristiano, D. Blavette

Appl. Phys. Lett. 97, 242104 (2010)

https://doi.org/10.1063/1.3526376

Published: December 2010

View article titled, Direct imaging of boron segregation to extended defects in silicon

Journal Articles

Atomic-scale redistribution of dopants in polycrystalline silicon layers

S. Duguay, A. Colin, D. Mathiot, P Morin, D. Blavette

J. Appl. Phys. 108, 034911 (2010)

https://doi.org/10.1063/1.3466783

Published: August 2010

View article titled, Atomic-scale redistribution of dopants in polycrystalline silicon layers

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Uphill phosphorus diffusion in carbon co-implanted silicon

Low temperature carbon co-implantation in silicon: Defects suppression and diffusion modeling

A photonic atom probe coupling 3D atomic scale analysis with in situ photoluminescence spectroscopy

Compositional accuracy in atom probe tomography analyses performed on III-N light emitting diodes

3D atomic-scale investigation of carbon segregation in phosphorus co-implanted silicon

Optical shaping of a nano-scale tip by femtosecond laser assisted field evaporation

Three-dimensional atomic-scale investigation of ZnO-Mg_xZn_1−xO m-plane heterostructures

Kinetic theory of diffusion-limited nucleation

Investigation of dopant clustering and segregation to defects in semiconductors using atom probe tomography

Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al_0.25Ga_0.75N

Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques

Critical nucleus composition in a multicomponent system

The early stage of formation of self-organized nanocolumns in thin films: Monte Carlo simulations versus atomic-scale observations in Ge-Mn

Advance in multi-hit detection and quantization in atom probe tomography

Composition and morphology of self-organized Mn-rich nanocolumns embedded in Ge: Correlation with the magnetic properties

Temperature stability of (Pt/Co)₃/IrMn multilayers

Minimum free-energy pathway of nucleation

Atomic scale evidence of the suppression of boron clustering in implanted silicon by carbon coimplantation

Direct imaging of boron segregation to extended defects in silicon

Atomic-scale redistribution of dopants in polycrystalline silicon layers

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