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Journal Articles

Erratum: “Oxygen diffusion coefficients in ferroelectric hafnium zirconium oxide thin films” [Appl. Phys. Lett. 124 , 252905 (2024)]

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Liron Shvilberg, Chuanzhen Zhou, Megan K. Lenox, Benjamin L. Aronson, Nicolas K. Lam, Samantha T. Jaszewski, Elizabeth J. Opila, Jon F. Ihlefeld
Journal: Applied Physics Letters
Appl. Phys. Lett. 126, 039901 (2025)
https://doi.org/10.1063/5.0251555
Published: January 2025
View articletitled, Erratum: “Oxygen diffusion coefficients in ferroelectric hafnium zirconium oxide thin films” [Appl. Phys. Lett. 124 , 252905 (2024)]
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Journal Articles

Oxygen diffusion coefficients in ferroelectric hafnium zirconium oxide thin films

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Liron Shvilberg, Chuanzhen Zhou, Megan K. Lenox, Benjamin L. Aronson, Nicolas K. Lam, Samantha T. Jaszewski, Elizabeth J. Opila, Jon F. Ihlefeld
Journal: Applied Physics Letters
Appl. Phys. Lett. 124, 252905 (2024)
https://doi.org/10.1063/5.0209502
Published: June 2024
View articletitled, Oxygen diffusion coefficients in ferroelectric hafnium zirconium oxide thin films
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Journal Articles

Effect of background gas composition on the stoichiometry and lithium ion conductivity of pulse laser deposited epitaxial lithium lanthanum tantalate (Li3xLa1/3−xTaO3)

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Ian A. Brummel, Chuanzhen Zhou, Jon F. Ihlefeld
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 42, 032705 (2024)
https://doi.org/10.1116/6.0003457
Published: April 2024
View articletitled, Effect of background gas composition on the stoichiometry and lithium ion conductivity of pulse laser deposited epitaxial lithium lanthanum tantalate (Li3xLa1/3−xTaO3)
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Includes: Supplementary data
Journal Articles

Analysis of permethrin treated fabric using ToF-SIMS

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Chuanzhen Zhou, Fred Stevie, Roberto Garcia
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 034006 (2020)
https://doi.org/10.1116/1.5141467
Published: April 2020
View articletitled, Analysis of permethrin treated fabric using ToF-SIMS
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Journal Articles

Quantification of organic materials by ion implantation

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Chuanzhen Zhou, Fred A. Stevie, Stephen C. Smith
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 03F115 (2018)
https://doi.org/10.1116/1.5011735
Published: February 2018
View articletitled, Quantification of organic materials by ion implantation
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Journal Articles

ToF-SIMS analysis of ion implanted standard to quantify insecticide in mosquito netting with cesium and argon gas cluster sputtering beams

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Chuanzhen Zhou, Fred A. Stevie, Stephen C. Smith, Derk Rading, Julia Zakel
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 03F111 (2018)
https://doi.org/10.1116/1.5011751
Published: February 2018
View articletitled, ToF-SIMS analysis of ion implanted standard to quantify insecticide in mosquito netting with cesium and argon gas cluster sputtering beams
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Journal Articles

Improvement in detection limit for time-of-flight SIMS analysis of dopants in GaN structures

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Andrew Klump, Chuanzhen Zhou, Frederick A. Stevie, Ramón Collazo, Zlatko Sitar
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 03F102 (2018)
https://doi.org/10.1116/1.5013001
Published: January 2018
View articletitled, Improvement in detection limit for time-of-flight SIMS analysis of dopants in GaN structures
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Journal Articles

Doped Hf0.5Zr0.5O2 for high efficiency integrated supercapacitors

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Patrick D. Lomenzo, Ching-Chang Chung, Chuanzhen Zhou, Jacob L. Jones, Toshikazu Nishida
Journal: Applied Physics Letters
Appl. Phys. Lett. 110, 232904 (2017)
https://doi.org/10.1063/1.4985297
Published: June 2017
View articletitled, Doped Hf0.5Zr0.5O2 for high efficiency integrated supercapacitors
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Journal Articles

ToF-SIMS quantification of bromine based insecticide in mosquito netting

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Chuanzhen Zhou, Fred A. Stevie, Stephen C. Smith
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 35, 031802 (2017)
https://doi.org/10.1116/1.4983098
Published: May 2017
View articletitled, ToF-SIMS quantification of bromine based insecticide in mosquito netting
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Journal Articles

Method for quantification of insecticide in mosquito netting using ion implantation and ToF-SIMS analysis

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Chuanzhen Zhou, Fred A. Stevie, Stephen C. Smith
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 34, 03H107 (2016)
https://doi.org/10.1116/1.4940394
Published: January 2016
View articletitled, Method for quantification of insecticide in mosquito netting using ion implantation and ToF-SIMS analysis
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Journal Articles

Mixed Al and Si doping in ferroelectric HfO2 thin films

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Patrick D. Lomenzo, Qanit Takmeel, Chuanzhen Zhou, Ching-Chang Chung, Saeed Moghaddam, Jacob L. Jones, Toshikazu Nishida
Journal: Applied Physics Letters
Appl. Phys. Lett. 107, 242903 (2015)
https://doi.org/10.1063/1.4937588
Published: December 2015
View articletitled, Mixed Al and Si doping in ferroelectric HfO2 thin films
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Journal Articles

TaN interface properties and electric field cycling effects on ferroelectric Si-doped HfO2 thin films

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Patrick D. Lomenzo, Qanit Takmeel, Chuanzhen Zhou, Chris M. Fancher, Eric Lambers, Nicholas G. Rudawski, Jacob L. Jones, Saeed Moghaddam, Toshikazu Nishida
Journal: Journal of Applied Physics
J. Appl. Phys. 117, 134105 (2015)
https://doi.org/10.1063/1.4916715
Published: April 2015
View articletitled, TaN interface properties and electric field cycling effects on ferroelectric Si-doped HfO2 thin films
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Journal Articles

The effects of layering in ferroelectric Si-doped HfO2 thin films

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Patrick D. Lomenzo, Qanit Takmeel, Chuanzhen Zhou, Yang Liu, Chris M. Fancher, Jacob L. Jones, Saeed Moghaddam, Toshikazu Nishida
Journal: Applied Physics Letters
Appl. Phys. Lett. 105, 072906 (2014)
https://doi.org/10.1063/1.4893738
Published: August 2014
View articletitled, The effects of layering in ferroelectric Si-doped HfO2 thin films
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Includes: Supplementary data
Journal Articles

TOF SIMS analyses of stray Ga during FIB milling

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Christopher Santeufemio, Brian P. Gorman, Chuanzhen Zhou, Lucille A. Giannuzzi, Fred A. Stevie
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 31, 06F108 (2013)
https://doi.org/10.1116/1.4825403
Published: October 2013
View articletitled, TOF SIMS analyses of stray Ga during FIB milling
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