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Christian G. Schroer
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Journal Articles

On-chip aberration correction for planar nanofocusing x-ray lenses by focused ion-beam milling

Frank Seiboth, Andreas Schropp, Mikhail Lyubomirskiy, Wenxin Wang, Andreas Jahn, Satishkumar Kulkarni, Thomas F. Keller, Christian G. Schroer
Journal: Applied Physics Letters
Appl. Phys. Lett. 122, 241105 (2023)
https://doi.org/10.1063/5.0153149
Published: June 2023
View article titled, On-chip aberration correction for planar nanofocusing x-ray lenses by focused ion-beam milling
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Journal Articles

Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view

Felix Wittwer, Mikhail Lyubomirskiy, Frieder Koch, Maik Kahnt, Martin Seyrich, Jan Garrevoet, Christian David, Christian G. Schroer
Journal: Applied Physics Letters
Appl. Phys. Lett. 118, 171102 (2021)
https://doi.org/10.1063/5.0045571
Published: April 2021
View article titled, Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view
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Journal Articles

Design status of the ultra-low emittance synchrotron facility PETRA IV

Rainer Wanzenberg, Ilya Agapov, Werner Brefeld, Reinhard Brinkmann, Yong-Chul Chae, Hung-Chun Chao, Joachim Keil, Xavier Nuel Gavaldà, Ralf Röhlsberger, Christian G. Schroer, Markus Tischer, Edgar Weckert
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2054, 030002 (2019)
https://doi.org/10.1063/1.5084565
Published: January 2019
View article titled, Design status of the ultra-low emittance synchrotron facility PETRA IV
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Journal Articles

Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses

Jens Patommel, Susanne Klare, Robert Hoppe, Stephan Ritter, Dirk Samberg, Felix Wittwer, Andreas Jahn, Karola Richter, Christian Wenzel, Johann W. Bartha, Maria Scholz, Frank Seiboth, Ulrike Boesenberg, Gerald Falkenberg, Christian G. Schroer
Journal: Applied Physics Letters
Appl. Phys. Lett. 110, 101103 (2017)
https://doi.org/10.1063/1.4977882
Published: March 2017
View article titled, Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses
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Journal Articles

The phase-contrast imaging instrument at the matter in extreme conditions endstation at LCLS

Bob Nagler, Andreas Schropp, Eric C. Galtier, Brice Arnold, Shaughnessy B. Brown, Alan Fry, Arianna Gleason, Eduardo Granados, Akel Hashim, Jerome B. Hastings, Dirk Samberg, Frank Seiboth, Franz Tavella, Zhou Xing, Hae Ja Lee, Christian G. Schroer
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 87, 103701 (2016)
https://doi.org/10.1063/1.4963906
Published: October 2016
View article titled, The phase-contrast imaging instrument at the matter in extreme conditions endstation at LCLS
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Journal Articles

Reconstructing x-ray fluorescence microtomograms

Christian G. Schroer
Journal: Applied Physics Letters
Appl. Phys. Lett. 79, 1912–1914 (2001)
https://doi.org/10.1063/1.1402643
Published: September 2001
View article titled, Reconstructing x-ray fluorescence microtomograms
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Journal Articles

Targeting in Hamiltonian systems that have mixed regular/chaotic phase spaces

Christian G. Schroer, Edward Ott
Journal: Chaos: An Interdisciplinary Journal of Nonlinear Science
Chaos 7, 512–519 (1997)
https://doi.org/10.1063/1.166277
Published: December 1997
View article titled, Targeting in Hamiltonian systems that have mixed regular/chaotic phase spaces
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