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Carl V. Thompson
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Journal Articles

Hole opening from growing interfacial voids: A possible mechanism of solid state dewetting

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Stefano Curiotto, Anna Chame, Pierre Müller, Carl V. Thompson, Olivier Pierre-Louis
Journal: Applied Physics Letters
Appl. Phys. Lett. 120, 091603 (2022)
https://doi.org/10.1063/5.0083139
Published: March 2022
View articletitled, Hole opening from growing interfacial voids: A possible mechanism of solid state dewetting
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Includes: Supplementary data
Journal Articles

Fabrication of high aspect ratio AFM probes with different materials inspired by TEM “lift-out” method

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Swee Ching Tan, Hangbo Zhao, Carl V. Thompson
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 34, 051805 (2016)
https://doi.org/10.1116/1.4961595
Published: August 2016
View articletitled, Fabrication of high aspect ratio AFM probes with different materials inspired by TEM “lift-out” method
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Includes: Supplementary data
Journal Articles

Effect of annealing ambient on anisotropic retraction of film edges during solid-state dewetting of thin single crystal films

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Gye Hyun Kim, Wen Ma, Bilge Yildiz, Carl V. Thompson
Journal: Journal of Applied Physics
J. Appl. Phys. 120, 075306 (2016)
https://doi.org/10.1063/1.4961205
Published: August 2016
View articletitled, Effect of annealing ambient on anisotropic retraction of film edges during solid-state dewetting of thin single crystal films
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Journal Articles

Mechanical measurements on lithium phosphorous oxynitride coated silicon thin film electrodes for lithium-ion batteries during lithiation and delithiation

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Ahmed Al-Obeidi, Dominik Kramer, Steven T. Boles, Reiner Mönig, Carl V. Thompson
Journal: Applied Physics Letters
Appl. Phys. Lett. 109, 071902 (2016)
https://doi.org/10.1063/1.4961234
Published: August 2016
View articletitled, Mechanical measurements on lithium phosphorous oxynitride coated silicon thin film electrodes for lithium-ion batteries during lithiation and delithiation
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Includes: Supplementary data
Journal Articles

The mechanism of corner instabilities in single-crystal thin films during dewetting

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Rachel V. Zucker, Gye Hyun Kim, Jongpil Ye, W. Craig Carter, Carl V. Thompson
Journal: Journal of Applied Physics
J. Appl. Phys. 119, 125306 (2016)
https://doi.org/10.1063/1.4944712
Published: March 2016
View articletitled, The mechanism of corner instabilities in single-crystal thin films during dewetting
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Journal Articles

Response to “Comment on ‘Correlation of shape changes of grain surfaces and reversible stress evolution during interruptions of polycrystalline film growth’” [Appl. Phys. Lett. 105 , 246101 (2014)]

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Hang Z. Yu, Carl V. Thompson
Journal: Applied Physics Letters
Appl. Phys. Lett. 105, 246102 (2014)
https://doi.org/10.1063/1.4903864
Published: December 2014
View articletitled, Response to “Comment on ‘Correlation of shape changes of grain surfaces and reversible stress evolution during interruptions of polycrystalline film growth’” [Appl. Phys. Lett. 105 , 246101 (2014)]
Open the PDF for Response to “Comment on ‘Correlation of shape changes of grain surfaces and reversible stress evolution during interruptions of polycrystalline film growth’” [Appl. Phys. Lett. 105 , 246101 (2014)] in another window
Journal Articles

Stress engineering using low oxygen background pressures during Volmer–Weber growth of polycrystalline nickel films

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Hang Z. Yu, Carl V. Thompson
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 33, 021504 (2015)
https://doi.org/10.1116/1.4902957
Published: December 2014
View articletitled, Stress engineering using low oxygen background pressures during Volmer–Weber growth of polycrystalline nickel films
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Journal Articles

Correlation of shape changes of grain surfaces and reversible stress evolution during interruptions of polycrystalline film growth

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Hang Z. Yu, Carl V. Thompson
Journal: Applied Physics Letters
Appl. Phys. Lett. 104, 141913 (2014)
https://doi.org/10.1063/1.4871214
Published: April 2014
View articletitled, Correlation of shape changes of grain surfaces and reversible stress evolution during interruptions of polycrystalline film growth
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Journal Articles

On the redox origin of surface trapping in AlGaN/GaN high electron mobility transistors

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Feng Gao, Di Chen, Harry L. Tuller, Carl. V. Thompson, Tomás Palacios
Journal: Journal of Applied Physics
J. Appl. Phys. 115, 124506 (2014)
https://doi.org/10.1063/1.4869738
Published: March 2014
View articletitled, On the redox origin of surface trapping in AlGaN/GaN high electron mobility transistors
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Journal Articles

Erratum: “In situ tensile and creep testing of lithiated silicon nanowires” [Appl. Phys. Lett. 103, 263906 (2013)]

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Steven T. Boles, Carl V. Thompson, Oliver Kraft, Reiner Mönig
Journal: Applied Physics Letters
Appl. Phys. Lett. 104, 099902 (2014)
https://doi.org/10.1063/1.4867539
Published: March 2014
View articletitled, Erratum: “In situ tensile and creep testing of lithiated silicon nanowires” [Appl. Phys. Lett. 103, 263906 (2013)]
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Journal Articles

Fast and slow stress evolution mechanisms during interruptions of Volmer-Weber growth

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Hang Z. Yu, Jeffrey S. Leib, Steven T. Boles, Carl V. Thompson
Journal: Journal of Applied Physics
J. Appl. Phys. 115, 043521 (2014)
https://doi.org/10.1063/1.4863600
Published: January 2014
View articletitled, Fast and slow stress evolution mechanisms during interruptions of Volmer-Weber growth
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Journal Articles

In situ tensile and creep testing of lithiated silicon nanowires

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Steven T. Boles, Carl V. Thompson, Oliver Kraft, Reiner Mönig
Journal: Applied Physics Letters
Appl. Phys. Lett. 103, 263906 (2013)
https://doi.org/10.1063/1.4858394
Published: December 2013
View articletitled, In situ tensile and creep testing of lithiated silicon nanowires
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Journal Articles

Quantitative analysis of anisotropic edge retraction by solid-state dewetting of thin single crystal films

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Gye Hyun Kim, Rachel V. Zucker, Jongpil Ye, W. Craig Carter, Carl V. Thompson
Journal: Journal of Applied Physics
J. Appl. Phys. 113, 043512 (2013)
https://doi.org/10.1063/1.4788822
Published: January 2013
View articletitled, Quantitative analysis of anisotropic edge retraction by solid-state dewetting of thin single crystal films
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Journal Articles

Three-dimensional graphoepitaxial alignment resulting from solid-state dewetting of Au films on surfaces with monoperiodic topography

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Amanda L. Giermann, Carl V. Thompson
Journal: Applied Physics Letters
Appl. Phys. Lett. 101, 051904 (2012)
https://doi.org/10.1063/1.4740277
Published: July 2012
View articletitled, Three-dimensional graphoepitaxial alignment resulting from solid-state dewetting of Au films on surfaces with monoperiodic topography
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Journal Articles

Spatial distribution of structural degradation under high-power stress in AlGaN/GaN high electron mobility transistors

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Libing Li, Jungwoo Joh, J. A. del Alamo, Carl V. Thompson
Journal: Applied Physics Letters
Appl. Phys. Lett. 100, 172109 (2012)
https://doi.org/10.1063/1.4707163
Published: April 2012
View articletitled, Spatial distribution of structural degradation under high-power stress in AlGaN/GaN high electron mobility transistors
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Journal Articles

Role of oxygen in the OFF-state degradation of AlGaN/GaN high electron mobility transistors

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Feng Gao, Bin Lu, Libing Li, Stephen Kaun, James S. Speck, Carl. V. Thompson, Tomás Palacios
Journal: Applied Physics Letters
Appl. Phys. Lett. 99, 223506 (2011)
https://doi.org/10.1063/1.3665065
Published: November 2011
View articletitled, Role of oxygen in the OFF-state degradation of AlGaN/GaN high electron mobility transistors
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Journal Articles

Void dynamics in copper-based interconnects

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Zung-Sun Choi, Junghoon Lee, Meng Keong Lim, Chee Lip Gan, Carl V. Thompson
Journal: Journal of Applied Physics
J. Appl. Phys. 110, 033505 (2011)
https://doi.org/10.1063/1.3611408
Published: August 2011
View articletitled, Void dynamics in copper-based interconnects
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Journal Articles

Mechanisms of complex morphological evolution during solid-state dewetting of single-crystal nickel thin films

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Jongpil Ye, Carl V. Thompson
Journal: Applied Physics Letters
Appl. Phys. Lett. 97, 071904 (2010)
https://doi.org/10.1063/1.3480419
Published: August 2010
View articletitled, Mechanisms of complex morphological evolution during solid-state dewetting of single-crystal nickel thin films
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Journal Articles

Microscale oscillating crack propagation in silicon nitride thin films

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Donghyun Kim, Prashanth Makaram, Carl V. Thompson
Journal: Applied Physics Letters
Appl. Phys. Lett. 97, 071902 (2010)
https://doi.org/10.1063/1.3480408
Published: August 2010
View articletitled, Microscale oscillating crack propagation in silicon nitride thin films
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Journal Articles

Evolution of structural defects associated with electrical degradation in AlGaN/GaN high electron mobility transistors

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Prashanth Makaram, Jungwoo Joh, Jesús A. del Alamo, Tomás Palacios, Carl V. Thompson
Journal: Applied Physics Letters
Appl. Phys. Lett. 96, 233509 (2010)
https://doi.org/10.1063/1.3446869
Published: June 2010
View articletitled, Evolution of structural defects associated with electrical degradation in AlGaN/GaN high electron mobility transistors
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