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Journal Articles

The new dedicated HAXPES beamline P22 at PETRAIII

C. Schlueter, A. Gloskovskii, K. Ederer, I. Schostak, S. Piec, I. Sarkar, Yu. Matveyev, P. Lömker, M. Sing, R. Claessen, C. Wiemann, C. M. Schneider, K. Medjanik, G. Schönhense, P. Amann, A. Nilsson, W. Drube
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2054, 040010 (2019)
https://doi.org/10.1063/1.5084611
Published: January 2019
View article titled, The new dedicated HAXPES beamline P22 at PETRAIII
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Journal Articles

Valence change detection in memristive oxide based heterostructure cells by hard X-ray photoelectron emission spectroscopy

A. Kindsmüller, C. Schmitz, C. Wiemann, K. Skaja, D. J. Wouters, R. Waser, C. M. Schneider, R. Dittmann
Journal: APL Materials
APL Mater. 6, 046106 (2018)
https://doi.org/10.1063/1.5026063
Published: April 2018
View article titled, Valence change detection in memristive oxide based heterostructure cells by hard X-ray photoelectron emission spectroscopy
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Includes: Supplementary data
Journal Articles

Quantitative spectromicroscopy from inelastically scattered photoelectrons in the hard X-ray range

O. Renault, C. Zborowski, P. Risterucci, C. Wiemann, G. Grenet, C. M. Schneider, S. Tougaard
Journal: Applied Physics Letters
Appl. Phys. Lett. 109, 011602 (2016)
https://doi.org/10.1063/1.4955427
Published: July 2016
View article titled, Quantitative spectromicroscopy from inelastically scattered photoelectrons in the hard X-ray range
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Journal Articles

Bulk sensitive hard x-ray photoemission electron microscopy

M. Patt, C. Wiemann, N. Weber, M. Escher, A. Gloskovskii, W. Drube, M. Merkel, C. M. Schneider
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 85, 113704 (2014)
https://doi.org/10.1063/1.4902141
Published: November 2014
View article titled, Bulk sensitive hard x-ray photoemission electron microscopy
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Journal Articles

Deflection gating for time-resolved x-ray magnetic circular dichroism–photoemission electron microscopy using synchrotron radiation

C. Wiemann, A. M. Kaiser, S. Cramm, C. M. Schneider
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 83, 063706 (2012)
https://doi.org/10.1063/1.4729603
Published: June 2012
View article titled, Deflection gating for time-resolved x-ray magnetic circular dichroism–photoemission electron microscopy using synchrotron radiation
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Journal Articles

Probing buried layers by photoelectron spectromicroscopy with hard x-ray excitation

C. Wiemann, M. Patt, S. Cramm, M. Escher, M. Merkel, A. Gloskovskii, S. Thiess, W. Drube, C. M. Schneider
Journal: Applied Physics Letters
Appl. Phys. Lett. 100, 223106 (2012)
https://doi.org/10.1063/1.4722940
Published: May 2012
View article titled, Probing buried layers by photoelectron spectromicroscopy with hard x-ray excitation
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Journal Articles

Depth-resolved soft x-ray photoelectron emission microscopy in nanostructures via standing-wave excited photoemission

F. Kronast, R. Ovsyannikov, A. Kaiser, C. Wiemann, S.-H. Yang, D. E. Bürgler, R. Schreiber, F. Salmassi, P. Fischer, H. A. Dűrr, C. M. Schneider, W. Eberhardt, C. S. Fadley
Journal: Applied Physics Letters
Appl. Phys. Lett. 93, 243116 (2008)
https://doi.org/10.1063/1.3046782
Published: December 2008
View article titled, Depth-resolved soft x-ray photoelectron emission microscopy in nanostructures via standing-wave excited photoemission
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Journal Articles

Direct writing of active loads by focused ion beams

C. Wiemann, M. Versen, A. D. Wieck
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 16, 2567–2569 (1998)
https://doi.org/10.1116/1.590211
Published: July 1998
View article titled, Direct writing of active loads by focused ion beams
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