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    Journal Articles

    Electromigration void nucleation and growth analysis using large-scale early failure statistics

    Available to Purchase
    M. Hauschildt, M. Gall, C. Hennesthal, G. Talut, O. Aubel, K. B. Yeap, E. Zschech
    Journal: AIP Conference Proceedings
    AIP Conf. Proc. 1601, 89–98 (2014)
    https://doi.org/10.1063/1.4881343
    Published: June 2014
    Abstract
    View articletitled, Electromigration void nucleation and growth analysis using large-scale early failure statistics
    Open the PDF for Electromigration void nucleation and growth analysis using large-scale early failure statistics in another window
    Journal Articles

    Stress Phenomena In Times Of Porous Low‐k Dielectrics

    Available to Purchase
    O. Aubel, M. Grillberger, J. Poppe, M. Lehr, C. Hennesthal
    Journal: AIP Conference Proceedings
    AIP Conf. Proc. 1300, 68–77 (2010)
    https://doi.org/10.1063/1.3527139
    Published: November 2010
    Abstract
    View articletitled, Stress Phenomena In Times Of Porous Low‐k Dielectrics
    Open the PDF for Stress Phenomena In Times Of Porous Low‐k Dielectrics in another window

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