1-20 of 106
C. F. Quate
Close
Save search
Follow your search
Access your saved searches in your account
Close Modal
Sort by
Journal Articles

Capacitive micromachined ultrasonic transducers for chemical detection in nitrogen

Available to Purchase
K. K. Park, H. J. Lee, G. G. Yaralioglu, A. S. Ergun, Ö. Oralkan, M. Kupnik, C. F. Quate, B. T. Khuri-Yakub, T. Braun, J.-P. Ramseyer, H. P. Lang, M. Hegner, Ch. Gerber, J. K. Gimzewski
Journal: Applied Physics Letters
Appl. Phys. Lett. 91, 094102 (2007)
https://doi.org/10.1063/1.2776348
Published: August 2007
View articletitled, Capacitive micromachined ultrasonic transducers for chemical detection in nitrogen
Open the PDF for Capacitive micromachined ultrasonic transducers for chemical detection in nitrogen in another window
Journal Articles

A new atomic force microscope probe with force sensing integrated readout and active tip

Available to Purchase
A. G. Onaran, M. Balantekin, W. Lee, W. L. Hughes, B. A. Buchine, R. O. Guldiken, Z. Parlak, C. F. Quate, F. L. Degertekin
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 77, 023501 (2006)
https://doi.org/10.1063/1.2166469
Published: February 2006
View articletitled, A new atomic force microscope probe with force sensing integrated readout and active tip
Open the PDF for A new atomic force microscope probe with force sensing integrated readout and active tip in another window
Journal Articles

Sensor for direct measurement of interaction forces in probe microscopy

Available to Purchase
F. L. Degertekin, A. G. Onaran, M. Balantekin, W. Lee, N. A. Hall, C. F. Quate
Journal: Applied Physics Letters
Appl. Phys. Lett. 87, 213109 (2005)
https://doi.org/10.1063/1.2136430
Published: November 2005
View articletitled, Sensor for direct measurement of interaction forces in probe microscopy
Open the PDF for Sensor for direct measurement of interaction forces in probe microscopy in another window
Journal Articles

New results in ultrasonic microscopy

Free
C. F. Quate
Journal: The Journal of the Acoustical Society of America
J. Acoust. Soc. Am. 65, S54 (1979)
https://doi.org/10.1121/1.2017310
Published: August 2005
View articletitled, New results in ultrasonic microscopy
Open the PDF for New results in ultrasonic microscopy in another window
Journal Articles

Publisher’s Note: “Optical antennas: Resonators for local field enhancement” [J. Appl. Phys. 94 , 4632 (2003)]

Free
K. B. Crozier, A. Sundaramurthy, G. S. Kino, C. F. Quate
Journal: Journal of Applied Physics
J. Appl. Phys. 94, 7950 (2003)
https://doi.org/10.1063/1.1626674
Published: December 2003
View articletitled, Publisher’s Note: “Optical antennas: Resonators for local field enhancement” [J. Appl. Phys. 94 , 4632 (2003)]
Open the PDF for Publisher’s Note: “Optical antennas: Resonators for local field enhancement” [J. Appl. Phys. 94 , 4632 (2003)] in another window
Journal Articles

Optical antennas: Resonators for local field enhancement

Available to Purchase
K. B. Crozier, A. Sundaramurthy, G. S. Kino, C. F. Quate
Journal: Journal of Applied Physics
J. Appl. Phys. 94, 4632–4642 (2003)
https://doi.org/10.1063/1.1602956
Published: October 2003
View articletitled, Optical antennas: Resonators for local field enhancement
Open the PDF for Optical antennas: Resonators for local field enhancement in another window
Journal Articles

Characterization and optimization of scan speed for tapping-mode atomic force microscopy

Available to Purchase
T. Sulchek, G. G. Yaralioglu, C. F. Quate, S. C. Minne
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 73, 2928–2936 (2002)
https://doi.org/10.1063/1.1488679
Published: August 2002
View articletitled, Characterization and optimization of scan speed for tapping-mode atomic force microscopy
Open the PDF for Characterization and optimization of scan speed for tapping-mode atomic force microscopy in another window
Journal Articles

Refraction contrast imaging with a scanning microlens

Available to Purchase
D. A. Fletcher, K. B. Crozier, C. F. Quate, G. S. Kino, K. E. Goodson, D. Simanovskii, D. V. Palanker
Journal: Applied Physics Letters
Appl. Phys. Lett. 78, 3589–3591 (2001)
https://doi.org/10.1063/1.1377318
Published: June 2001
View articletitled, Refraction contrast imaging with a scanning microlens
Open the PDF for Refraction contrast imaging with a scanning microlens in another window
Journal Articles

Parallel atomic force microscopy with optical interferometric detection

Available to Purchase
T. Sulchek, R. J. Grow, G. G. Yaralioglu, S. C. Minne, C. F. Quate, S. R. Manalis, A. Kiraz, A. Aydine, A. Atalar
Journal: Applied Physics Letters
Appl. Phys. Lett. 78, 1787–1789 (2001)
https://doi.org/10.1063/1.1352697
Published: March 2001
View articletitled, Parallel atomic force microscopy with optical interferometric detection
Open the PDF for Parallel atomic force microscopy with optical interferometric detection in another window
Journal Articles

Actuation and characterization of atomic force microscope cantilevers in fluids by acoustic radiation pressure

Available to Purchase
F. L. Degertekin, B. Hadimioglu, T. Sulchek, C. F. Quate
Journal: Applied Physics Letters
Appl. Phys. Lett. 78, 1628–1630 (2001)
https://doi.org/10.1063/1.1354157
Published: March 2001
View articletitled, Actuation and characterization of atomic force microscope cantilevers in fluids by acoustic radiation pressure
Open the PDF for Actuation and characterization of atomic force microscope cantilevers in fluids by acoustic radiation pressure in another window
Journal Articles

Near-field infrared imaging with a microfabricated solid immersion lens

Available to Purchase
D. A. Fletcher, K. B. Crozier, C. F. Quate, G. S. Kino, K. E. Goodson, D. Simanovskii, D. V. Palanker
Journal: Applied Physics Letters
Appl. Phys. Lett. 77, 2109–2111 (2000)
https://doi.org/10.1063/1.1313368
Published: October 2000
View articletitled, Near-field infrared imaging with a microfabricated solid immersion lens
Open the PDF for Near-field infrared imaging with a microfabricated solid immersion lens in another window
Journal Articles

Experimental and theoretical results of room-temperature single-electron transistor formed by the atomic force microscope nano-oxidation process

Available to Purchase
Y. Gotoh, K. Matsumoto, T. Maeda, E. B. Cooper, S. R. Manalis, H. Fang, S. C. Minne, T. Hunt, H. Dai, J. Harris, C. F. Quate
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 18, 1321–1325 (2000)
https://doi.org/10.1116/1.582347
Published: July 2000
View articletitled, Experimental and theoretical results of room-temperature single-electron transistor formed by the atomic force microscope nano-oxidation process
Open the PDF for Experimental and theoretical results of room-temperature single-electron transistor formed by the atomic force microscope nano-oxidation process in another window
Journal Articles

High-resolution micromachined interferometric accelerometer

Available to Purchase
E. B. Cooper, E. R. Post, S. Griffith, J. Levitan, S. R. Manalis, M. A. Schmidt, C. F. Quate
Journal: Applied Physics Letters
Appl. Phys. Lett. 76, 3316–3318 (2000)
https://doi.org/10.1063/1.126637
Published: May 2000
View articletitled, High-resolution micromachined interferometric accelerometer
Open the PDF for High-resolution micromachined interferometric accelerometer in another window
Journal Articles

Contact stiffness of layered materials for ultrasonic atomic force microscopy

Available to Purchase
G. G. Yaralioglu, F. L. Degertekin, K. B. Crozier, C. F. Quate
Journal: Journal of Applied Physics
J. Appl. Phys. 87, 7491–7496 (2000)
https://doi.org/10.1063/1.373014
Published: May 2000
View articletitled, Contact stiffness of layered materials for ultrasonic atomic force microscopy
Open the PDF for Contact stiffness of layered materials for ultrasonic atomic force microscopy in another window
Journal Articles

High-speed atomic force microscopy in liquid

Available to Purchase
T. Sulchek, R. Hsieh, J. D. Adams, S. C. Minne, C. F. Quate, D. M. Adderton
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 71, 2097–2099 (2000)
https://doi.org/10.1063/1.1150586
Published: May 2000
View articletitled, High-speed atomic force microscopy in liquid
Open the PDF for High-speed atomic force microscopy in liquid in another window
Journal Articles

Thin film characterization by atomic force microscopy at ultrasonic frequencies

Available to Purchase
K. B. Crozier, G. G. Yaralioglu, F. L. Degertekin, J. D. Adams, S. C. Minne, C. F. Quate
Journal: Applied Physics Letters
Appl. Phys. Lett. 76, 1950–1952 (2000)
https://doi.org/10.1063/1.126222
Published: April 2000
View articletitled, Thin film characterization by atomic force microscopy at ultrasonic frequencies
Open the PDF for Thin film characterization by atomic force microscopy at ultrasonic frequencies in another window
Journal Articles

High-speed tapping mode imaging with active Q control for atomic force microscopy

Available to Purchase
T. Sulchek, R. Hsieh, J. D. Adams, G. G. Yaralioglu, S. C. Minne, C. F. Quate, J. P. Cleveland, A. Atalar, D. M. Adderton
Journal: Applied Physics Letters
Appl. Phys. Lett. 76, 1473–1475 (2000)
https://doi.org/10.1063/1.126071
Published: March 2000
View articletitled, High-speed tapping mode imaging with active Q control for atomic force microscopy
Open the PDF for High-speed tapping mode imaging with active Q control for atomic force microscopy in another window
Journal Articles

Microvolume field-effect p H sensor for the scanning probe microscope

Available to Purchase
S. R. Manalis, E. B. Cooper, P. F. Indermuhle, P. Kernen, P. Wagner, D. G. Hafeman, S. C. Minne, C. F. Quate
Journal: Applied Physics Letters
Appl. Phys. Lett. 76, 1072–1074 (2000)
https://doi.org/10.1063/1.125942
Published: February 2000
View articletitled, Microvolume field-effect p H sensor for the scanning probe microscope
Open the PDF for Microvolume field-effect p H sensor for the scanning probe microscope in another window
Journal Articles

Terabit-per-square-inch data storage with the atomic force microscope

Available to Purchase
E. B. Cooper, S. R. Manalis, H. Fang, H. Dai, K. Matsumoto, S. C. Minne, T. Hunt, C. F. Quate
Journal: Applied Physics Letters
Appl. Phys. Lett. 75, 3566–3568 (1999)
https://doi.org/10.1063/1.125390
Published: November 1999
View articletitled, Terabit-per-square-inch data storage with the atomic force microscope
Open the PDF for Terabit-per-square-inch data storage with the atomic force microscope in another window
Journal Articles

Dual integrated actuators for extended range high speed atomic force microscopy

Available to Purchase
T. Sulchek, S. C. Minne, J. D. Adams, D. A. Fletcher, A. Atalar, C. F. Quate, D. M. Adderton
Journal: Applied Physics Letters
Appl. Phys. Lett. 75, 1637–1639 (1999)
https://doi.org/10.1063/1.124779
Published: September 1999
View articletitled, Dual integrated actuators for extended range high speed atomic force microscopy
Open the PDF for Dual integrated actuators for extended range high speed atomic force microscopy in another window