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Bruno Bosacchi
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Journal Articles

Resonant ATR (Attenuated Total Reflectance) Spectroscopy and Semiconductor Technology

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Bruno Bosacchi
Journal: Journal of Laser Applications
J. Laser Appl. 1, 26–32 (1988)
https://doi.org/10.2351/1.4745218
Published: October 1988
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Journal Articles

Nondestructive characterization of multilayer structures by resonant attenuated total reflection spectroscopy

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Bruno Bosacchi, Robert C. Oehrle, Eric Grosse
Journal: Applied Physics Letters
Appl. Phys. Lett. 51, 158–160 (1987)
https://doi.org/10.1063/1.98907
Published: July 1987
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Proceedings Papers

Resonant ATR spectroscopy in semiconductor technology

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Bruno Bosacchi, Robert C. Oehrle
View Paper titled, Resonant ATR spectroscopy in semiconductor technology
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