Page 1 | Search Results | AIP Publishing

1-19 of 19

Sort by

Sort Order Select

Journal Articles

Study and characterization of the irreversible transformation of electrically stressed planar Ti/TiO_x/Ti junctions

N. Guillaume, E. Puyoo, M. Le Berre, D. Albertini, N. Baboux, C. Chevalier, K. Ayadi, J. Grégoire, B. Gautier, F. Calmon

J. Appl. Phys. 118, 144502 (2015)

https://doi.org/10.1063/1.4932646

Published: October 2015

View article titled, Study and characterization of the irreversible transformation of electrically stressed planar Ti/TiOx/Ti junctions

Journal Articles

Surface atomic and chemical structure of relaxor Sr_0.63Ba_0.37Nb₂O₆(001)

J. L. Wang, B. Vilquin, B. Gautier, G. Dezanneau, N. Barrett

Appl. Phys. Lett. 106, 242901 (2015)

https://doi.org/10.1063/1.4922773

Published: June 2015

View article titled, Surface atomic and chemical structure of relaxor Sr0.63Ba0.37Nb2O6(001)

Journal Articles

Structural observation of piezoelectric inhomogeneity in a mixed-orientation Na_0.5Bi_0.5TiO₃ perovskite thin film

D. Carbone, A. I. Pateras, G. Bussone, P. G. Evans, T. W. Cornelius, M. Bousquet, A. Boulle, B. Gautier, J. R. Duclère

Appl. Phys. Lett. 105, 242901 (2014)

https://doi.org/10.1063/1.4904458

Published: December 2014

View article titled, Structural observation of piezoelectric inhomogeneity in a mixed-orientation Na0.5Bi0.5TiO3 perovskite thin film

Includes: Supplementary data

Journal Articles

Structural study and ferroelectricity of epitaxial BaTiO₃ films on silicon grown by molecular beam epitaxy

L. Mazet, R. Bachelet, L. Louahadj, D. Albertini, B. Gautier, R. Cours, S. Schamm-Chardon, G. Saint-Girons, C. Dubourdieu

J. Appl. Phys. 116, 214102 (2014)

https://doi.org/10.1063/1.4902165

Published: December 2014

View article titled, Structural study and ferroelectricity of epitaxial BaTiO3 films on silicon grown by molecular beam epitaxy

Journal Articles

Phase transitions in [001]-oriented morphotropic PbZr_0.52Ti_0.48O₃ thin film deposited onto SrTiO₃-buffered Si substrate

Yin Shi, M. Cueff, Gang Niu, G. Le Rhun, B. Vilquin, G. Saint Girons, R. Bachelet, B. Gautier, Y. Robach, P. Gemeiner, N. Guiblin, E. Defay, B. Dkhil

J. Appl. Phys. 115, 214108 (2014)

https://doi.org/10.1063/1.4881818

Published: June 2014

View article titled, Phase transitions in [001]-oriented morphotropic PbZr0.52Ti0.48O3 thin film deposited onto SrTiO3-buffered Si substrate

Journal Articles

Spurious phenomena occurring during current measurement on ultra-thin dielectric layers: From electro-thermal effects to surface damage

A. Grandfond, B. Gautier, L. Militaru, D. Albertini, A. Descamps-Mandine

J. Appl. Phys. 115, 134103 (2014)

https://doi.org/10.1063/1.4869182

Published: April 2014

View article titled, Spurious phenomena occurring during current measurement on ultra-thin dielectric layers: From electro-thermal effects to surface damage

Journal Articles

Ferroelectric Pb(Zr,Ti)O₃ epitaxial layers on GaAs

L. Louahadj, D. Le Bourdais, L. Largeau, G. Agnus, L. Mazet, R. Bachelet, P. Regreny, D. Albertini, V. Pillard, C. Dubourdieu, B. Gautier, P. Lecoeur, G. Saint-Girons

Appl. Phys. Lett. 103, 212901 (2013)

https://doi.org/10.1063/1.4831738

Published: November 2013

View article titled, Ferroelectric Pb(Zr,Ti)O3 epitaxial layers on GaAs

Journal Articles

Room temperature multiferroicity in Ga_0.6Fe_1.4O₃:Mg thin films

A. Thomasson, S. Cherifi, C. Lefevre, F. Roulland, B. Gautier, D. Albertini, C. Meny, N. Viart

J. Appl. Phys. 113, 214101 (2013)

https://doi.org/10.1063/1.4808349

Published: June 2013

View article titled, Room temperature multiferroicity in Ga0.6Fe1.4O3:Mg thin films

Journal Articles

Strain effect in PbTiO₃/PbZr_0.2Ti_0.8O₃ superlattices: From polydomain to monodomain structures

C. Hubault, C. Davoisne, A. Boulle, L. Dupont, V. Demange, A. Perrin, B. Gautier, J. Holc, M. Kosec, M.G. Karkut, N. Lemée

J. Appl. Phys. 112, 114102 (2012)

https://doi.org/10.1063/1.4767329

Published: December 2012

View article titled, Strain effect in PbTiO3/PbZr0.2Ti0.8O3 superlattices: From polydomain to monodomain structures

Journal Articles

Electrical properties of (110) epitaxial lead-free ferroelectric Na_0.5Bi_0.5TiO₃ thin films grown by pulsed laser deposition: Macroscopic and nanoscale data

M. Bousquet, J.-R. Duclère, B. Gautier, A. Boulle, A. Wu, S. Députier, D. Fasquelle, F. Rémondière, D. Albertini, C. Champeaux, P. Marchet, M. Guilloux-Viry, P. Vilarinho

J. Appl. Phys. 111, 104106 (2012)

https://doi.org/10.1063/1.4716177

Published: May 2012

View article titled, Electrical properties of (110) epitaxial lead-free ferroelectric Na0.5Bi0.5TiO3 thin films grown by pulsed laser deposition: Macroscopic and nanoscale data

Journal Articles

Toward a better understanding of the nanoscale degradation mechanisms of ultra-thin Si0₂/Si films: Investigation of the best experimental conditions with a conductive-atomic force microscope

R. Arinero, W. Hourani, A. D. Touboul, B. Gautier, M. Ramonda, D. Albertini, L. Militaru, Y. Gonzalez-Velo, C. Guasch, F. Saigné

J. Appl. Phys. 110, 014304 (2011)

https://doi.org/10.1063/1.3603037

Published: July 2011

View article titled, Toward a better understanding of the nanoscale degradation mechanisms of ultra-thin Si02/Si films: Investigation of the best experimental conditions with a conductive-atomic force microscope

Journal Articles

Macroscopic and nanoscale electrical properties of pulsed laser deposited (100) epitaxial lead-free Na 0.5 Bi 0.5 TiO 3 thin films

M. Bousquet, J.-R. Duclère, C. Champeaux, A. Boulle, P. Marchet, A. Catherinot, A. Wu, P. M. Vilarinho, S. Députier, M. Guilloux-Viry, A. Crunteanu, B. Gautier, D. Albertini, C. Bachelet

J. Appl. Phys. 107, 034102 (2010)

https://doi.org/10.1063/1.3290956

Published: February 2010

View article titled, Macroscopic and nanoscale electrical properties of pulsed laser deposited (100) epitaxial lead-free Na 0.5 Bi 0.5 TiO 3 thin films

Journal Articles

Scaling Effects on Ferro‐Electrics: Application in Nanoelectronics and Characterization

B. Vilquin, B. Gautier, A. Brugère, J. S. Moulet

AIP Conf. Proc. 1173, 129–134 (2009)

https://doi.org/10.1063/1.3251206

Published: September 2009

View article titled, Scaling Effects on Ferro‐Electrics: Application in Nanoelectronics and Characterization

Journal Articles

Nanoscale Characterization Of Ultra‐Thin Dielectrics Using Scanning Capacitance Microscopy

O. Ligor, B. Gautier, A. Descamps, D. Albertini, L. Militaru, N. Baboux

AIP Conf. Proc. 1173, 193–197 (2009)

https://doi.org/10.1063/1.3251219

Published: September 2009

View article titled, Nanoscale Characterization Of Ultra‐Thin Dielectrics Using Scanning Capacitance Microscopy

Journal Articles

Silicon nanoparticle formation by short pulse electrochemical etching in the transition regime

T. Nychyporuk, V. Lysenko, B. Gautier, D. Barbier

J. Appl. Phys. 100, 104307 (2006)

https://doi.org/10.1063/1.2384809

Published: November 2006

View article titled, Silicon nanoparticle formation by short pulse electrochemical etching in the transition regime

Journal Articles

Initial stages of silicon anodization in the transition regime: Nanoparticle formation

T. Nychyporuk, V. Lysenko, B. Gautier, D. Barbier

Appl. Phys. Lett. 86, 213107 (2005)

https://doi.org/10.1063/1.1931061

Published: May 2005

View article titled, Initial stages of silicon anodization in the transition regime: Nanoparticle formation

Journal Articles

Scanning tunneling microscopy study of the Er/Ge(111) c(2×8) interface

S. Pelletier, E. Ehret, B. Gautier, F. Palmino, J. C. Labrune

J. Vac. Sci. Technol. A 18, 2738–2741 (2000)

https://doi.org/10.1116/1.1290377

Published: November 2000

View article titled, Scanning tunneling microscopy study of the Er/Ge(111) c(2×8) interface

Journal Articles

Er deposition in the submonolayer range on weakly boron-doped Si(111) surface

F. Palmino, S. Pelletier, E. Ehret, B. Gautier, J. C. Labrune

J. Vac. Sci. Technol. A 18, 2239–2243 (2000)

https://doi.org/10.1116/1.1285934

Published: September 2000

View article titled, Er deposition in the submonolayer range on weakly boron-doped Si(111) surface

Journal Articles

Carbon self-organization in the ternary Si 1−x−y Ge x C y alloy

C. Guedj, X. Portier, A. Hairie, D. Bouchier, G. Calvarin, B. Piriou, B. Gautier, J. C. Dupuy

J. Appl. Phys. 83, 5251–5257 (1998)

https://doi.org/10.1063/1.367347

Published: May 1998

View article titled, Carbon self-organization in the ternary Si 1−x−y Ge x C y alloy

NARROW

Topics

Study and characterization of the irreversible transformation of electrically stressed planar Ti/TiO_x/Ti junctions

Surface atomic and chemical structure of relaxor Sr_0.63Ba_0.37Nb₂O₆(001)

Structural observation of piezoelectric inhomogeneity in a mixed-orientation Na_0.5Bi_0.5TiO₃ perovskite thin film

Structural study and ferroelectricity of epitaxial BaTiO₃ films on silicon grown by molecular beam epitaxy

Phase transitions in [001]-oriented morphotropic PbZr_0.52Ti_0.48O₃ thin film deposited onto SrTiO₃-buffered Si substrate

Spurious phenomena occurring during current measurement on ultra-thin dielectric layers: From electro-thermal effects to surface damage

Ferroelectric Pb(Zr,Ti)O₃ epitaxial layers on GaAs

Room temperature multiferroicity in Ga_0.6Fe_1.4O₃:Mg thin films

Strain effect in PbTiO₃/PbZr_0.2Ti_0.8O₃ superlattices: From polydomain to monodomain structures

Electrical properties of (110) epitaxial lead-free ferroelectric Na_0.5Bi_0.5TiO₃ thin films grown by pulsed laser deposition: Macroscopic and nanoscale data

Toward a better understanding of the nanoscale degradation mechanisms of ultra-thin Si0₂/Si films: Investigation of the best experimental conditions with a conductive-atomic force microscope

Macroscopic and nanoscale electrical properties of pulsed laser deposited (100) epitaxial lead-free Na 0.5 Bi 0.5 TiO 3 thin films

Scaling Effects on Ferro‐Electrics: Application in Nanoelectronics and Characterization

Nanoscale Characterization Of Ultra‐Thin Dielectrics Using Scanning Capacitance Microscopy

Silicon nanoparticle formation by short pulse electrochemical etching in the transition regime

Initial stages of silicon anodization in the transition regime: Nanoparticle formation

Scanning tunneling microscopy study of the Er/Ge(111) c(2×8) interface

Er deposition in the submonolayer range on weakly boron-doped Si(111) surface

Carbon self-organization in the ternary Si 1−x−y Ge x C y alloy

Resources

Explore

pubs.aip.org

Connect with AIP Publishing

Resources

Explore

pubs.aip.org

Connect with AIP Publishing

This Feature Is Available To Subscribers Only