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Journal Articles

Compact device for x‐ray section topography with synchrotron sources

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A. R. Lang
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 54, 897–899 (1983)
https://doi.org/10.1063/1.1137495
Published: July 1983
View articletitled, Compact device for x‐ray section topography with synchrotron sources
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Journal Articles

Image reduction to submicrometer dimensions by asymmetric crystal reflection of x rays

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S. Mardix, A. R. Lang
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 50, 510–512 (1979)
https://doi.org/10.1063/1.1135862
Published: April 1979
View articletitled, Image reduction to submicrometer dimensions by asymmetric crystal reflection of x rays
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Journal Articles

RAPID X‐RAY DIFFRACTION TOPOGRAPHY USING A HIGH‐GAIN IMAGE INTENSIFIER

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A. R. Lang, K. Reifsnider
Journal: Applied Physics Letters
Appl. Phys. Lett. 15, 258–260 (1969)
https://doi.org/10.1063/1.1652991
Published: October 1969
View articletitled, RAPID X‐RAY DIFFRACTION TOPOGRAPHY USING A HIGH‐GAIN IMAGE INTENSIFIER
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Journal Articles

Dislocations and Fault Surfaces in Synthetic Quartz

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A. R. Lang, V. F. Miuscov
Journal: Journal of Applied Physics
J. Appl. Phys. 38, 2477–2483 (1967)
https://doi.org/10.1063/1.1709932
Published: May 1967
View articletitled, Dislocations and Fault Surfaces in Synthetic Quartz
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Journal Articles

Erratum: Å‐Scale Displacements Revealed by X‐Ray Moiré Topographs

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A. R. Lang, V. F. Miuscov
Journal: Applied Physics Letters
Appl. Phys. Lett. 8, 30 (1966)
https://doi.org/10.1063/1.1754416
Published: January 1966
View articletitled, Erratum: Å‐Scale Displacements Revealed by X‐Ray Moiré Topographs
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Journal Articles

Å‐SCALE DISPLACEMENTS REVEALED BY X‐RAY MOIRÉ TOPOGRAPHS

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A. R. Lang, V. F. Miuscov
Journal: Applied Physics Letters
Appl. Phys. Lett. 7, 214–216 (1965)
https://doi.org/10.1063/1.1754384
Published: October 1965
View articletitled, Å‐SCALE DISPLACEMENTS REVEALED BY X‐RAY MOIRÉ TOPOGRAPHS
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Journal Articles

MAPPING DAUPHINÉ AND BRAZIL TWINS IN QUARTZ BY X‐RAY TOPOGRAPHY

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A. R. Lang
Journal: Applied Physics Letters
Appl. Phys. Lett. 7, 168–170 (1965)
https://doi.org/10.1063/1.1754361
Published: September 1965
View articletitled, MAPPING DAUPHINÉ AND BRAZIL TWINS IN QUARTZ BY X‐RAY TOPOGRAPHY
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Journal Articles

X‐Ray Topography of Decorated Dislocations in Magnesium Oxide

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A. R. Lang, G. D. Miles
Journal: Journal of Applied Physics
J. Appl. Phys. 36, 1803–1807 (1965)
https://doi.org/10.1063/1.1714355
Published: June 1965
View articletitled, X‐Ray Topography of Decorated Dislocations in Magnesium Oxide
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Journal Articles

X‐Ray Diffraction and Absorption Topography of Synthetic Diamonds

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Y. Kamiya, A. R. Lang
Journal: Journal of Applied Physics
J. Appl. Phys. 36, 579–587 (1965)
https://doi.org/10.1063/1.1714034
Published: February 1965
View articletitled, X‐Ray Diffraction and Absorption Topography of Synthetic Diamonds
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Journal Articles

Three‐Dimensional X‐Ray Topographic Studies of Internal Dislocation Sources in Silicon

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A. Authier, A. R. Lang
Journal: Journal of Applied Physics
J. Appl. Phys. 35, 1956–1959 (1964)
https://doi.org/10.1063/1.1713778
Published: June 1964
View articletitled, Three‐Dimensional X‐Ray Topographic Studies of Internal Dislocation Sources in Silicon
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Journal Articles

Erratum: X‐RAY TOPOGRAPHIC STUDIES OF MAGNETIC DOMAIN CONFIGURATIONS AND MOVEMENTS

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Milena Polcarová, A. R. Lang
Journal: Applied Physics Letters
Appl. Phys. Lett. 1, 73 (1962)
https://doi.org/10.1063/1.1777378
Published: November 1962
View articletitled, Erratum: X‐RAY TOPOGRAPHIC STUDIES OF MAGNETIC DOMAIN CONFIGURATIONS AND MOVEMENTS
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Journal Articles

X‐RAY TOPOGRAPHIC STUDIES OF MAGNETIC DOMAIN CONFIGURATIONS AND MOVEMENTS

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Milena Polcarova, A. R. Lang
Journal: Applied Physics Letters
Appl. Phys. Lett. 1, 13–15 (1962)
https://doi.org/10.1063/1.1777351
Published: September 1962
View articletitled, X‐RAY TOPOGRAPHIC STUDIES OF MAGNETIC DOMAIN CONFIGURATIONS AND MOVEMENTS
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Journal Articles

Studies of Individual Dislocations in Crystals by X‐Ray Diffraction Microradiography

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A. R. Lang
Journal: Journal of Applied Physics
J. Appl. Phys. 30, 1748–1755 (1959)
https://doi.org/10.1063/1.1735048
Published: November 1959
View articletitled, Studies of Individual Dislocations in Crystals by X‐Ray Diffraction Microradiography
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Journal Articles

Direct Observation of Individual Dislocations by X‐Ray Diffraction

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A. R. Lang
Journal: Journal of Applied Physics
J. Appl. Phys. 29, 597–598 (1958)
https://doi.org/10.1063/1.1723234
Published: March 1958
View articletitled, Direct Observation of Individual Dislocations by X‐Ray Diffraction
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Journal Articles

On the Origin of Certain Spirals of Large Step‐Height Observed on Crystal Surfaces

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A. R. Lang
Journal: Journal of Applied Physics
J. Appl. Phys. 28, 497–498 (1957)
https://doi.org/10.1063/1.1722779
Published: April 1957
View articletitled, On the Origin of Certain Spirals of Large Step‐Height Observed on Crystal Surfaces
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Journal Articles

Effect of Dispersion and Geometric Intensity Factors on X‐Ray Back‐Reflection Line Profiles

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A. R. Lang
Journal: Journal of Applied Physics
J. Appl. Phys. 27, 485–488 (1956)
https://doi.org/10.1063/1.1722408
Published: May 1956
View articletitled, Effect of Dispersion and Geometric Intensity Factors on X‐Ray Back‐Reflection Line Profiles
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Journal Articles

Diffracted‐Beam Monochromatization Techniques in X‐Ray Diffractometry

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A. R. Lang
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 27, 17–25 (1956)
https://doi.org/10.1063/1.1715356
Published: January 1956
View articletitled, Diffracted‐Beam Monochromatization Techniques in X‐Ray Diffractometry
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Journal Articles

Focusing Transmission Specimen Technique for the X‐Ray Diffractometer

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A. R. Lang
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 26, 680–689 (1955)
https://doi.org/10.1063/1.1715286
Published: July 1955
View articletitled, Focusing Transmission Specimen Technique for the X‐Ray Diffractometer
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Journal Articles

Suggested Necessary Conditions for Successful Use of the Stationary Crystal Integrated Reflection Measuring Method with the Counter Spectrometer

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A. R. Lang
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 25, 1039–1040 (1954)
https://doi.org/10.1063/1.1770923
Published: October 1954
View articletitled, Suggested Necessary Conditions for Successful Use of the Stationary Crystal Integrated Reflection Measuring Method with the Counter Spectrometer
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Journal Articles

A Proposed Method for Electronic Intensification of Single‐Crystal X‐Ray Diffraction Images

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A. R. Lang
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 25, 1032–1033 (1954)
https://doi.org/10.1063/1.1770914
Published: October 1954
View articletitled, A Proposed Method for Electronic Intensification of Single‐Crystal X‐Ray Diffraction Images
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