1-12 of 12
A. Erko
Close
Save search
Follow your search
Access your saved searches in your account
Close Modal
Sort by
Journal Articles

RAY-UI: New features and extensions

P. Baumgärtel, P. Grundmann, T. Zeschke, A. Erko, J. Viefhaus, F. Schäfers, H. Schirmacher
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2054, 060034 (2019)
https://doi.org/10.1063/1.5084665
Published: January 2019
View article titled, RAY-UI: New features and extensions
Open the PDF for RAY-UI: New features and extensions in another window
Journal Articles

RAY-UI: A powerful and extensible user interface for RAY

P. Baumgärtel, M. Witt, J. Baensch, M. Fabarius, A. Erko, F. Schäfers, H. Schirmacher
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1741, 040016 (2016)
https://doi.org/10.1063/1.4952888
Published: July 2016
View article titled, RAY-UI: A powerful and extensible user interface for RAY
Open the PDF for RAY-UI: A powerful and extensible user interface for RAY in another window
Journal Articles

Survey and adjustment methods applied on an 11 axes high performance reflectometer for synchrotron radiation

F. Eggenstein, P. Bischoff, F. Schäfers, T. Schroeter, F. Senf, A. Sokolov, T. Zeschke, A. Erko
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1741, 030025 (2016)
https://doi.org/10.1063/1.4952848
Published: July 2016
View article titled, Survey and adjustment methods applied on an 11 axes high performance reflectometer for synchrotron radiation
Open the PDF for Survey and adjustment methods applied on an 11 axes high performance reflectometer for synchrotron radiation in another window
Journal Articles

At-wavelength metrology facility for soft X-ray reflection optics

A. Sokolov, P. Bischoff, F. Eggenstein, A. Erko, A. Gaupp, S. Künstner, M. Mast, J.-S. Schmidt, F. Senf, F. Siewert, Th. Zeschke, F. Schäfers
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 87, 052005 (2016)
https://doi.org/10.1063/1.4950731
Published: May 2016
View article titled, At-wavelength metrology facility for soft X-ray reflection optics
Open the PDF for At-wavelength metrology facility for soft X-ray reflection optics in another window
Journal Articles

Single shot near edge x-ray absorption fine structure spectroscopy in the laboratory

I. Mantouvalou, K. Witte, W. Martyanov, A. Jonas, D. Grötzsch, C. Streeck, H. Löchel, I. Rudolph, A. Erko, H. Stiel, B. Kanngießer
Journal: Applied Physics Letters
Appl. Phys. Lett. 108, 201106 (2016)
https://doi.org/10.1063/1.4951000
Published: May 2016
View article titled, Single shot near edge x-ray absorption fine structure spectroscopy in the laboratory
Open the PDF for Single shot near edge x-ray absorption fine structure spectroscopy in the laboratory in another window
Includes: Supplementary data
Journal Articles

Structural motifs of pre-nucleation clusters

Y. Zhang, I. R. Türkmen, B. Wassermann, A. Erko, E. Rühl
Journal: The Journal of Chemical Physics
J. Chem. Phys. 139, 134506 (2013)
https://doi.org/10.1063/1.4823497
Published: October 2013
View article titled, Structural motifs of pre-nucleation clusters
Open the PDF for Structural motifs of pre-nucleation clusters in another window
Journal Articles

Crystal structure, local structure, and defect structure of Pr-doped SrTiO3

I. A. Sluchinskaya, A. I. Lebedev, A. Erko
Journal: Journal of Applied Physics
J. Appl. Phys. 112, 024103 (2012)
https://doi.org/10.1063/1.4737586
Published: July 2012
View article titled, Crystal structure, local structure, and defect structure of Pr-doped SrTiO<sub>3</sub>
Open the PDF for Crystal structure, local structure, and defect structure of Pr-doped SrTiO<sub>3</sub> in another window
Journal Articles

New Developments in Femtosecond Soft X‐ray Spectroscopy

A. Erko, A. Firsov, K. Holldack
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1234, 177–180 (2010)
https://doi.org/10.1063/1.3463167
Published: June 2010
View article titled, New Developments in Femtosecond Soft X‐ray Spectroscopy
Open the PDF for New Developments in Femtosecond Soft X‐ray Spectroscopy in another window
Journal Articles

1D X‐ray Beam Compressing Monochromators

D. Korytár, C. Ferrari, P. Mikulík, P. Vagovič, E. Dobročka, V. Áč, P. Konopka, A. Erko, N. Abrosimov, Z. Zápražný
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1221, 59–62 (2010)
https://doi.org/10.1063/1.3399630
Published: April 2010
View article titled, 1D X‐ray Beam Compressing Monochromators
Open the PDF for 1D X‐ray Beam Compressing Monochromators in another window
Journal Articles

BESSY Bragg‐Fresnel multilayer beam monitors

K. Holldack, A. Erko, W.B. Peatman
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 67, 3367 (1996)
https://doi.org/10.1063/1.1147474
Published: September 1996
View article titled, BESSY Bragg‐Fresnel multilayer beam monitors
Open the PDF for BESSY Bragg‐Fresnel multilayer beam monitors in another window
Journal Articles

X‐ray supermirrors for BESSY II

A. Erko, F. Schäfers, B. Vidal, A. Yakshin, U. Pietsch, W. Mahler
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 66, 4845–4846 (1995)
https://doi.org/10.1063/1.1146162
Published: October 1995
View article titled, X‐ray supermirrors for BESSY II
Open the PDF for X‐ray supermirrors for BESSY II in another window
Journal Articles

Device fabrication by nanolithography and electroplating for magnetic flux quantization measurements

E. Kratschmer, A. Erko, V. T. Petrashov, H. Beneking
Journal: Applied Physics Letters
Appl. Phys. Lett. 44, 1011–1013 (1984)
https://doi.org/10.1063/1.94602
Published: May 1984
View article titled, Device fabrication by nanolithography and electroplating for magnetic flux quantization measurements
Open the PDF for Device fabrication by nanolithography and electroplating for magnetic flux quantization measurements in another window