1-7 of 7
Nanodots
Close
Save search
Follow your search
Access your saved searches in your account
Close Modal
Sort by
Journal Articles

Comment on “Plasma fireball: A unique tool to fabricate patterned nanodots” [Rev. Sci. Instrum. 88, 063507 (2017)]

Editor’s Pick
J. Gruenwald
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 88, 087101 (2017)
https://doi.org/10.1063/1.4996830
Published: August 2017
View article titled, Comment on “Plasma fireball: A unique tool to fabricate patterned nanodots” [Rev. Sci. Instrum. 88, 063507 (2017)]
Open the PDF for Comment on “Plasma fireball: A unique tool to fabricate patterned nanodots” [Rev. Sci. Instrum. 88, 063507 (2017)] in another window
Journal Articles

Plasma fireball: A unique tool to fabricate patterned nanodots

S. Chauhan, T. Barman, M. Bhatnagar, M. Ranjan, S. Mukherjee
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 88, 063507 (2017)
https://doi.org/10.1063/1.4989701
Published: June 2017
View article titled, Plasma fireball: A unique tool to fabricate patterned nanodots
Open the PDF for Plasma fireball: A unique tool to fabricate patterned nanodots in another window
Journal Articles

Accurate measurement of relative tilt and azimuth angles in electron tomography: A comparison of fiducial marker method with electron diffraction

Misa Hayashida, Marek Malac, Michael Bergen, Ray F. Egerton, Peng Li
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 85, 083704 (2014)
https://doi.org/10.1063/1.4892436
Published: August 2014
View article titled, Accurate measurement of relative tilt and azimuth angles in electron tomography: A comparison of fiducial marker method with electron diffraction
Open the PDF for Accurate measurement of relative tilt and azimuth angles in electron tomography: A comparison of fiducial marker method with electron diffraction in another window
Journal Articles

Microscopy image segmentation tool: Robust image data analysis

Ilya Valmianski, Carlos Monton, Ivan K. Schuller
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 85, 033701 (2014)
https://doi.org/10.1063/1.4866687
Published: March 2014
View article titled, Microscopy image segmentation tool: Robust image data analysis
Open the PDF for Microscopy image segmentation tool: Robust image data analysis in another window
Journal Articles

Research on three dimensional machining effects using atomic force microscope

Yao-Ting Mao, Kai-Chen Kuo, Ching-En Tseng, Jian-Yin Huang, Yi-Chih Lai, Jia-Yush Yen, Chih-Kung Lee, Wei-Li Chuang
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 80, 065105 (2009)
https://doi.org/10.1063/1.3125623
Published: June 2009
View article titled, Research on three dimensional machining effects using atomic force microscope
Open the PDF for Research on three dimensional machining effects using atomic force microscope in another window
Journal Articles

Invited Review Article: Microwave spectroscopy based on scanning thermal microscopy: Resolution in the nanometer range

Ralf Meckenstock
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 79, 041101 (2008)
https://doi.org/10.1063/1.2908445
Published: April 2008
View article titled, Invited Review Article: Microwave spectroscopy based on scanning thermal microscopy: Resolution in the nanometer range
Open the PDF for Invited Review Article: Microwave spectroscopy based on scanning thermal microscopy: Resolution in the nanometer range in another window
Journal Articles

High resolution polar Kerr magnetometer for nanomagnetism and nanospintronics

M. Cormier, J. Ferré, A. Mougin, J.-P. Cromières, V. Klein
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 79, 033706 (2008)
https://doi.org/10.1063/1.2890839
Published: March 2008
View article titled, High resolution polar Kerr magnetometer for nanomagnetism and nanospintronics
Open the PDF for High resolution polar Kerr magnetometer for nanomagnetism and nanospintronics in another window