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Journal Articles

Performance characterization of x-ray crystal spectroscopy highly oriented pyrolytic graphite reflectors based on x-ray diffractometry experiments

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Dian Lu, Zhifeng Cheng, Tianlei Zhao, Lingxiong Yuan, Lan Gao, Jonathan Klabacha, Novimir Pablant, Raphael Tieulent, Zichao Lin, Yifei Jin, Yu Fan, Jia Fu, Hongming Zhang, Bo Lyu, Fudi Wang
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 96, 013507 (2025)
https://doi.org/10.1063/5.0220878
Published: January 2025
View articletitled, Performance characterization of x-ray crystal spectroscopy highly oriented pyrolytic graphite reflectors based on x-ray diffractometry experiments
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Journal Articles

Review of Scientific Instruments New Products

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Andreas Mandelis
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 93, 049501 (2022)
https://doi.org/10.1063/5.0090353
Published: April 2022
View articletitled, Review of Scientific Instruments New Products
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Journal Articles

A simple and effective attachment to prevent dome diffraction reaching 2D or 1D detectors in x-ray diffractometers

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N. M. van der Pers, R. W. A. Hendrikx, A. J. Böttger
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 92, 103102 (2021)
https://doi.org/10.1063/5.0052057
Published: October 2021
View articletitled, A simple and effective attachment to prevent dome diffraction reaching 2D or 1D detectors in x-ray diffractometers
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Journal Articles

Review of Scientific Instruments New Products

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Andreas Mandelis
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 92, 039501 (2021)
https://doi.org/10.1063/5.0048903
Published: March 2021
View articletitled, Review of Scientific Instruments New Products
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Journal Articles

Review of Scientific Instruments New Products

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Andreas Mandelis
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 91, 099501 (2020)
https://doi.org/10.1063/5.0026881
Published: September 2020
View articletitled, Review of Scientific Instruments New Products
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Journal Articles

Laboratory time-resolved X-ray diffractometry for investigation of reversible structural changes induced in single crystals by external electric field

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N. V. Marchenkov, A. G. Kulikov, A. A. Petrenko, Yu. V. Pisarevsky, A. E. Blagov
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 89, 095105 (2018)
https://doi.org/10.1063/1.5036955
Published: September 2018
View articletitled, Laboratory time-resolved X-ray diffractometry for investigation of reversible structural changes induced in single crystals by external electric field
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Journal Articles

Note: Tandem Kirkpatrick–Baez microscope with sixteen channels for high-resolution laser-plasma diagnostics

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Shengzhen Yi, Zhe Zhang, Qiushi Huang, Zhong Zhang, Zhanshan Wang, Lai Wei, Dongxiao Liu, Leifeng Cao, Yuqiu Gu
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 89, 036105 (2018)
https://doi.org/10.1063/1.5019206
Published: March 2018
View articletitled, Note: Tandem Kirkpatrick–Baez microscope with sixteen channels for high-resolution laser-plasma diagnostics
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Includes: Supplementary data
Journal Articles

Eight-channel Kirkpatrick–Baez microscope for multiframe x-ray imaging diagnostics in laser plasma experiments

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Shengzhen Yi, Zhe Zhang, Qiushi Huang, Zhong Zhang, Baozhong Mu, Zhanshan Wang, Zhiheng Fang, Wei Wang, Sizu Fu
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 87, 103501 (2016)
https://doi.org/10.1063/1.4963702
Published: October 2016
View articletitled, Eight-channel Kirkpatrick–Baez microscope for multiframe x-ray imaging diagnostics in laser plasma experiments
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Journal Articles

In situ surface/interface x-ray diffractometer for oxide molecular beam epitaxy

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J. H. Lee, I. C. Tung, S.-H. Chang, A. Bhattacharya, D. D. Fong, J. W. Freeland, Hawoong Hong
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 87, 013901 (2016)
https://doi.org/10.1063/1.4939100
Published: January 2016
View articletitled, In situ surface/interface x-ray diffractometer for oxide molecular beam epitaxy
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Journal Articles

Note: Electrochemical cell for in operando X-ray diffraction measurements on a conventional X-ray diffractometer

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Steffen Hartung, Nicolas Bucher, Ramona Bucher, Madhavi Srinivasan
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 86, 086102 (2015)
https://doi.org/10.1063/1.4926465
Published: August 2015
View articletitled, Note: Electrochemical cell for in operando X-ray diffraction measurements on a conventional X-ray diffractometer
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Journal Articles

Note: Application of a pixel-array area detector to simultaneous single crystal x-ray diffraction and x-ray absorption spectroscopy measurements

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Cheng-Jun Sun, Bangmin Zhang, Dale L. Brewe, Jing-Sheng Chen, G. M. Chow, T. Venkatesan, Steve M. Heald
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 85, 046109 (2014)
https://doi.org/10.1063/1.4871055
Published: April 2014
View articletitled, Note: Application of a pixel-array area detector to simultaneous single crystal x-ray diffraction and x-ray absorption spectroscopy measurements
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Journal Articles

An x-ray setup to investigate the atomic order of confined liquids in slit geometry

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M. Lippmann, A. Ehnes, O. H. Seeck
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 85, 015106 (2014)
https://doi.org/10.1063/1.4860057
Published: January 2014
View articletitled, An x-ray setup to investigate the atomic order of confined liquids in slit geometry
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Journal Articles

High-energy x-ray diffractometer for nondestructive strain depth profile measurement

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M. Y. Al-Shorman, T. C. Jensen, J. N. Gray
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 84, 123902 (2013)
https://doi.org/10.1063/1.4841895
Published: December 2013
View articletitled, High-energy x-ray diffractometer for nondestructive strain depth profile measurement
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Journal Articles

A diffracted-beam monochromator for long linear detectors in X-ray diffractometers with Bragg-Brentano parafocusing geometry

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N. M. van der Pers, R. W. A. Hendrikx, R. Delhez, A. J. Böttger
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 84, 045102 (2013)
https://doi.org/10.1063/1.4798547
Published: April 2013
View articletitled, A diffracted-beam monochromator for long linear detectors in X-ray diffractometers with Bragg-Brentano parafocusing geometry
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Journal Articles

RASOR: An advanced instrument for soft x-ray reflectivity and diffraction

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T. A. W. Beale, T. P. A. Hase, T. Iida, K. Endo, P. Steadman, A. R. Marshall, S. S. Dhesi, G. van der Laan, P. D. Hatton
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 81, 073904 (2010)
https://doi.org/10.1063/1.3458004
Published: July 2010
View articletitled, RASOR: An advanced instrument for soft x-ray reflectivity and diffraction
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Journal Articles

Development of a simultaneous dual-ablation apparatus and preparation of compositionally gradient ( Sr 1 − x Eu x ) Al 2 O 4 thin films

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Yu Kusaka, Tsuneo Suzuki, Ariyuki Kato, Takashi Yunogami, Tadachika Nakayama, Hisayuki Suematsu, Koichi Niihara
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 80, 076105 (2009)
https://doi.org/10.1063/1.3170628
Published: July 2009
View articletitled, Development of a simultaneous dual-ablation apparatus and preparation of compositionally gradient ( Sr 1 − x Eu x ) Al 2 O 4 thin films
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Journal Articles

Adapting a triple-axis spectrometer for small angle neutron scattering measurements

Open Access
Mu-Ping Nieh, Zahra Yamani, Norbert Kučerka, John Katsaras, Darcy Burgess, Hugo Breton
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 79, 095102 (2008)
https://doi.org/10.1063/1.2969254
Published: September 2008
View articletitled, Adapting a triple-axis spectrometer for small angle neutron scattering measurements
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Journal Articles

Rapid qualitative phase analysis in highly textured thin films by x-ray diffraction

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Cesare Borgia, Sven Olliges, Ralph Spolenak
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 79, 043904 (2008)
https://doi.org/10.1063/1.2907534
Published: April 2008
View articletitled, Rapid qualitative phase analysis in highly textured thin films by x-ray diffraction
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Journal Articles

Effect of ion beam irradiation on the structure of ZnO films deposited by a dc arc plasmatron

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Oleksiy V. Penkov, Heon-Ju Lee, Vadim Yu. Plaksin, Min Gook Ko, Sang Beom Joa, Chan Joo Yim
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 79, 02C504 (2008)
https://doi.org/10.1063/1.2804627
Published: February 2008
View articletitled, Effect of ion beam irradiation on the structure of ZnO films deposited by a dc arc plasmatron
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Journal Articles

Monitoring x-ray beam damage on lipid films by an integrated Brewster angle microscope/x-ray diffractometer

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Stephen M. Danauskas, Maria K. Ratajczak, Yuji Ishitsuka, Jeffrey Gebhardt, David Schultz, Mati Meron, Binhua Lin, Ka Yee C. Lee
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 78, 103705 (2007)
https://doi.org/10.1063/1.2796147
Published: October 2007
View articletitled, Monitoring x-ray beam damage on lipid films by an integrated Brewster angle microscope/x-ray diffractometer
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