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Journal Articles

Calibrated microwave reflectance in low-temperature scanning tunneling microscopy

Bareld Wit, Georg Gramse, Stefan Müllegger

Rev. Sci. Instrum. 94, 103702 (2023)

https://doi.org/10.1063/5.0155029

Published: October 2023

View article titled, Calibrated microwave reflectance in low-temperature scanning tunneling microscopy

Includes: Supplementary data

Journal Articles

Electrochemical isothermal-capacitance-transient spectroscopy: A new depth profiling method of deep levels

S. Q. Wang, F. Lu, D. C. Oh, J. H. Chang, T. Hanada, T. Yao

Rev. Sci. Instrum. 82, 093905 (2011)

https://doi.org/10.1063/1.3632118

Published: September 2011

View article titled, Electrochemical isothermal-capacitance-transient spectroscopy: A new depth profiling method of deep levels

Journal Articles

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

H. P. Huber, M. Moertelmaier, T. M. Wallis, C. J. Chiang, M. Hochleitner, A. Imtiaz, Y. J. Oh, K. Schilcher, M. Dieudonne, J. Smoliner, P. Hinterdorfer, S. J. Rosner, H. Tanbakuchi, P. Kabos, F. Kienberger

Rev. Sci. Instrum. 81, 113701 (2010)

https://doi.org/10.1063/1.3491926

Published: November 2010

View article titled, Calibrated nanoscale capacitance measurements using a scanning microwave microscope

Journal Articles

An intercepted feedback mode for light sensitive spectroscopic measurements in atomic force microscopy

J. Smoliner, W. Brezna

Rev. Sci. Instrum. 78, 106104 (2007)

https://doi.org/10.1063/1.2794062

Published: October 2007

View article titled, An intercepted feedback mode for light sensitive spectroscopic measurements in atomic force microscopy