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Journal Articles

Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope

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H. Minoda, K. Hatano, H. Yazawa
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 80, 113702 (2009)
https://doi.org/10.1063/1.3251272
Published: November 2009
View articletitled, Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope
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Journal Articles

A new surface science in situ transmission and reflection electron microscope

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M. T. Marshall, M. L. McDonald, X. Tong, M. Yeadon, J. M. Gibson
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 69, 440–447 (1998)
https://doi.org/10.1063/1.1148679
Published: February 1998
View articletitled, A new surface science in situ transmission and reflection electron microscope
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Journal Articles

Development of a multifunctional surface analysis system based on a nanometer scale scanning electron beam: Combination of ultrahigh vacuum‐scanning electron microscopy, scanning reflection electron microscopy, Auger electron spectroscopy, and x‐ray photoelectron spectroscopy

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Heiji Watanabe, Masakazu Ichikawa
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 67, 4185–4190 (1996)
https://doi.org/10.1063/1.1147567
Published: December 1996
View articletitled, Development of a multifunctional surface analysis system based on a nanometer scale scanning electron beam: Combination of ultrahigh vacuum‐scanning electron microscopy, scanning reflection electron microscopy, Auger electron spectroscopy, and x‐ray photoelectron spectroscopy
Open the PDF for Development of a multifunctional surface analysis system based on a nanometer scale scanning electron beam: Combination of ultrahigh vacuum‐scanning electron microscopy, scanning reflection electron microscopy, Auger electron spectroscopy, and x‐ray photoelectron spectroscopy in another window
Journal Articles

System for reflection electron microscopy and electron diffraction at intermediate energies

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J. M. Cowley, J. L. Albain, G. G. Hembree, P. E. Ho/jlund‐Nielsen, F. A. Koch, J. D. Landry, H. Shuman
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 46, 826–829 (1975)
https://doi.org/10.1063/1.1134346
Published: July 1975
View articletitled, System for reflection electron microscopy and electron diffraction at intermediate energies
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